IP Library › Granted Patent US 8,289,029
Granted Patent B2
US 8,289,029 · App. 12/175,867 · Granted Oct 16, 2012

Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events

Assignee: MKS Instruments, Inc.
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Quick Facts
Patent No.
US 8,289,029
App. No.
12/175,867
Granted
Oct 16, 2012
Kind
B2
Abstract

An arc detection system for a plasma generation system includes a radio frequency (RF) sensor that generates first and second signals based on a respective electrical properties of (RF) power that is in communication with a plasma chamber. A correlation module generates an arc detect signal based on the first and second signals. The arc detect signal indicates whether an arc is occurring in the plasma chamber and is employed to vary an aspect of the RF power to extinguish the arc.

Claims (130)

1. An arc detection system for a plasma generation system, comprising:

a radio frequency (RF) sensor that generates first and second signals based on a respective electrical properties of RF power that is in communication with a plasma chamber; and

an analysis module that generates an arc detect signal based on cross-correlating the first and second signals, wherein the arc detect signal indicates whether an arc is occurring in the plasma chamber and is employed to vary an aspect of the RF power to extinguish the arc, and that determines an estimated energy of the arc based on a correlation of the first and second signals.

2. The arc detection system of claim 1 , wherein the analysis module comprises a subtraction module that subtracts signal levels from respective ones of the first and second signals.

3. The arc detection system of claim 1 , wherein the analysis module comprises a window module that applies a window function to the first and second signals.

4. The arc detection system of claim 1 , further comprising a probabilistic module that computes a probability of an arc event based on the arc detect signal.

5. The arc detection system of claim 4 , wherein the probabilistic module employs a Baum-Welch algorithm to calculate a probabilistic model of the arc event.

6. The arc detection system of claim 5 , wherein the probabilistic module employs a Viterbi algorithm to compute the probability of the arc event.

7. The arc detection system of claim 1 , wherein the analysis module receives an enable signal that selectively enables generating the arc detect signal.

8. The arc detection system of claim 1 , wherein further comprising an analog-to-digital (A/D) conversion module that digitizes the first and second signals.

9. The arc detection system of claim 1 , wherein the RF sensor is a directional coupler and the first and second signals represent the forward power and reflected power, respectively, of the RF power.

10. The arc detection system of claim 1 , wherein the RF sensor is a voltage/current (V/I) sensor and the first and second signals represent a voltage and current, respectively, of the RF power.

11. The arc detection system of claim 10 , wherein the estimated energy of the arc is determined by multiplying a duration of the arc and a difference in a power estimate between during the arc and before the arc.

12. The arc detection system of claim 11 , wherein the power estimate is determined by the equation:

r

vi

⁡

(

τ

:=

0

)

=

∑

∀

n

⁢

(

v

⁡

[

n

]

-

E

⁡

[

v

⁡

[

n

]

]

)

⁢

(

i

⁡

[

n

]

-

E

⁡

[

i

⁡

[

n

]

]

)

,

wherein ν[n] is the voltage at time n; i[n] is the current at time n; r νi (τ:=0) is the power estimate at time n; E[ν[n]] is a mean of ν[n] at time n; E[i[n]] is a mean of i[n] at time n; and ∀n comprises all times n in a window of interest.

13. An arc detection method for a plasma generation system, comprising:

generating first and second signals based on respective electrical properties of radio frequency (RF) power that is in communication with a plasma chamber;

generating an arc detect signal based on the first and second signals, wherein the arc detect signal indicates whether an arc is occurring in the plasma chamber;

employing the arc detect signal to vary an aspect of the RF power to extinguish the arc; and

generating an estimated energy of the arc based on a cross-correlation of the first and second signals.

14. The arc detection method of claim 13 , further comprising subtracting signal levels from respective ones of the first and second signals.

15. The arc detection method of claim 13 , further comprising applying a window function to the first and second signals.

16. The arc detection method of claim 13 , further comprising computing a probability of an arc event based on the arc detect signal.

17. The arc detection method of claim 16 , wherein the computing step further comprises employing a Baum-Welch algorithm to calculate a probabilistic model of the arc event.

18. The arc detection method of claim 17 , wherein the computing step further comprises employing a Viterbi algorithm to compute the probability of the arc event.

19. The arc detection method of claim 13 , further comprising receiving an enable signal that selectively enables generating the arc detect signal.

20. The arc detection method of claim 13 , further comprising digitizing the first and second signals.

21. The arc detection method of claim 13 , wherein the first and second signals represent the forward power and reflected power, respectively, of the RF power.

22. The arc detection method of claim 13 , wherein the first and second signals represent a voltage and current, respectively, of the RF power.

23. The arc detection method of claim 22 , wherein the estimated energy of the arc is determined by multiplying a duration of the arc and a difference in a power estimate between during the arc and before the arc.

24. The arc detection method of claim 23 , wherein the power estimate is determined by the equation:

r

vi

⁡

(

τ

:=

0

)

=

∑

∀

n

⁢

(

v

⁡

[

n

]

-

E

⁡

[

v

⁡

[

n

]

]

)

⁢

(

i

⁡

[

n

]

-

E

⁡

[

i

⁡

[

n

]

]

)

,

wherein ν[n] is the voltage at time n; i[n] is the current at time n; r νi (τ:=0) is the power estimate at time n; E[ν[n]] is a mean of ν[n] at time n; E[i[n]] is a mean of i[n] at time n; and ∀n comprises all times n in a window of interest.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
SECURITY INTEREST Recorded Aug 19, 2022
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 061572/0069 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE U.S. PATENT NO.7,919,646 PREVIOUSLY RECORDED ON REEL 048211 FRAME 0312. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT (ABL). Recorded Jan 14, 2021
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 055668/0687 →
PATENT SECURITY AGREEMENT (ABL) Recorded Feb 1, 2019
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048211/0312 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
Reel/Frame 048226/0095 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038663/0265 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC; BARCLAYS BANK PLC
Reel/Frame 038663/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2008
From: COUMOU, DAVID J.
To: MKS INSTRUMENTS, INC.
Reel/Frame 021585/0883 →
Continuity (2)
Continuation In Part 12031171 · Feb 14, 2008
Related Publication 20090207537A1 · Aug 20, 2009