IP Library › Granted Patent US 8,317,929
Granted Patent B2
US 8,317,929 · App. 11/367,693 · Granted Nov 27, 2012

Lithographic apparatus comprising an electrical discharge generator and method for cleaning an element of a lithographic apparatus

Assignee: ASML Netherlands B.V.
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Quick Facts
Patent No.
US 8,317,929
App. No.
11/367,693
Granted
Nov 27, 2012
Kind
B2
Abstract

A method for cleaning elements of a lithographic apparatus, for example optical elements such as a collector mirror, includes providing a gas containing nitrogen; generating nitrogen radicals from at least part of the gas, thereby forming a radical containing gas; and providing at least part of the radical containing gas to the one or more elements of the apparatus. A lithographic apparatus includes a source and an optical element, and an electrical discharge generator arranged to generate a radio frequency discharge.

Claims (28)

1. A method for cleaning an element of a lithographic apparatus, the method comprising:

providing a gas containing nitrogen;

generating atomic nitrogen from at least part of the gas, thereby forming an atomic nitrogen containing gas;

providing a hydrogen radical containing gas to the element of the apparatus;

providing at least part of the atomic nitrogen containing gas to the element of the apparatus subsequent to the providing the hydrogen radial containing gas to the element of the apparatus; and

removing a carbon deposition from the element by reacting the atomic nitrogen containing gas provided to the element with the carbon deposition.

2. The method according to claim 1 , wherein the lithographic apparatus comprises an EUV lithographic apparatus.

3. The method according to claim 1 , wherein the gas containing nitrogen comprises N 2 .

4. The method according to claim 1 , wherein the atomic nitrogen is generated from the gas containing nitrogen using an electrical discharge.

5. The method according to claim 1 , wherein the atomic nitrogen is generated from the gas containing nitrogen using a radio frequency discharge.

6. The method according to claim 5 , wherein the electrical discharge comprises an inductive or a capacitive discharge.

7. The method according to claim 1 , wherein the element of the lithographic apparatus is selected from the group of a mirror, a grating, a reticle, a sensor, a support, a lithographic apparatus chamber and a lithographic apparatus wall.

8. The method according to claim 1 , wherein the gas containing nitrogen further comprises a halogen.

9. The method according to claim 1 , further comprising providing a halogen containing gas to the element subsequent to the providing the atomic nitrogen containing gas to the element.

10. A method for cleaning an element of a lithographic apparatus, the method comprising:

providing a gas containing nitrogen;

generating atomic nitrogen from at least part of the gas, thereby forming an atomic nitrogen containing gas;

providing a hydrogen radical containing gas to the element of the apparatus;

providing at least part of the atomic nitrogen containing gas to the element of the apparatus subsequent to the providing the hydrogen radical containing gas to the element; and

removing oxygen from the element by reacting the atomic nitrogen containing gas provided to the element with the oxygen.

11. The method according to claim 10 , wherein the lithographic apparatus comprises an EUV lithographic apparatus.

12. The method according to claim 10 , wherein the gas containing nitrogen comprises N 2 .

13. The method according to claim 10 , wherein the atomic nitrogen is generated from the gas containing nitrogen using an electrical discharge.

14. The method according to claim 10 , wherein the atomic nitrogen is generated from the gas containing nitrogen using a radio frequency discharge.

15. The method according to claim 14 , wherein the electrical discharge comprises an inductive or a capacitive discharge.

16. The method according to claim 10 , wherein the element of the lithographic apparatus is selected from the group of a mirror, a grating, a reticle, a sensor, a support, a lithographic apparatus chamber and a lithographic apparatus wall.

17. The method according to claim 10 , wherein the gas containing nitrogen further comprises a halogen.

18. The method according to claim 10 , further comprising providing a halogen containing gas to the element subsequent to the providing the atomic nitrogen containing gas to the element.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2006
From: RAKHIMOVA, TATYANA VICTOROVNA; BANINE, VADIM YEVGENYEVICH; IVANOV, VLADIMIR VITALEVITCH; KOSHELEV, KONSTANTIN NIKOLAEVITCH; MOORS, JOHANNES HUBERTUS JOSEPHINA; KOVALEV, ALEKSANDER SERGEEVICH; LOPAEV, DMITRIY VICTOROVICH
To: ASML NETHERLANDS B.V.
Reel/Frame 018182/0529 →
Continuity (2)
Provisional Application 60717240 · Sep 16, 2005
Related Publication 20070062557A1 · Mar 22, 2007