IP Library Granted Patent US 8,420,430
Granted Patent B2
US 8,420,430 · App. 12/769,087 · Granted Apr 16, 2013

Fabrication method of package structure having MEMS element

Inventors: Chi-Hsin Chiu (Taichung, TW); Chih-Ming Huang (Taichung, TW); Chang-Yueh Chan (Taichung, TW); Hsin-Yi Liao (Taichung, TW); Chun-Chi Ke (Taichung, TW)
Assignee: Siliconware Precision Industries Co., Ltd.
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Quick Facts
Patent No.
US 8,420,430
App. No.
12/769,087
Granted
Apr 16, 2013
Kind
B2
Abstract

A fabrication method of a package structure having at least an MEMS element is provided, including: preparing a wafer having electrical connection pads and the at least an MEMS element; disposing lids for covering the at least an MEMS element, the lids having a metal layer formed thereon; electrically connecting the electrical connection pads and the metal layer with bonding wires; forming an encapsulant for covering the lids, bonding wires, electrical connection pads and metal layer; removing portions of the encapsulant to separate the bonding wires each into first and second sub-bonding wires, wherein top ends of the first and second sub-bonding wires are exposed, the first sub-bonding wires electrically connecting to the electrical connection pads, and the second sub-bonding wires electrically connecting to the metal layer; forming metallic traces on the encapsulant for electrically connecting to the first sub-bonding wires; forming bumps on the metallic traces; and performing a singulation process.

Claims (17)

1. A fabrication method of a package structure having at least a Micro Electro Mechanical System (MEMS) element, comprising the steps of:

preparing a wafer having a plurality of electrical connection pads and the at least an MEMS element;

disposing a plurality of lids on the wafer for covering the at least an MEMS element, respectively, wherein each of the lids has a metal layer formed thereon;

electrically connecting the electrical connection pads and the metal layer with a plurality of bonding wires;

forming an encapsulant on the wafer for covering the lids, the bonding wires, the electrical connection pads and the metal layer;

removing a portion of the encapsulant so as to separate each of the bonding wires into a first sub-bonding wire and a second sub-bonding wire, wherein top ends of the first sub-bonding wire and the second sub-bonding wire are exposed from a top surface of the encapsulant, the first sub-bonding wires electrically connecting to the electrical connection pads, and the second sub-bonding wires electrically connecting to the metal layer;

forming a plurality of metallic traces on the encapsulant for electrically connecting to the first sub-bonding wires, respectively;

forming a plurality of bumps on the metallic traces, respectively; and

performing a singulation process to obtain a plurality of package structures each having the at least an MEMS element.

2. The method of claim 1 , wherein the electrical connection pads are disposed at an outer periphery of the lids.

3. The method of claim 1 , further comprising forming a first insulation layer on the encapsulant and the metallic traces before forming the bumps, wherein the first insulation layer has a plurality of openings for exposing the metallic traces such that the bumps are formed at the openings for electrically connecting to the metallic traces.

4. The method of claim 1 , further comprising forming a second insulation layer on the encapsulant before forming the metallic traces, wherein the second insulation layer has a plurality of openings for exposing the first sub-bonding wires.

5. The method of claim 1 , wherein each of the metallic traces has an end extending towards the corresponding MEMS element and having the corresponding bump formed thereon.

6. The method of claim 1 , wherein the metal layer is composed of a plurality of bonding pads.

7. The method of claim 1 , wherein the metal layer is formed by sputtering or evaporation.

8. The method of claim 1 , wherein the portion of the encapsulant is removed by grinding.

9. The method of claim 1 , wherein the metallic traces further electrically connect to the second sub-bonding wires.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2010
From: CHIU, CHI-HSIN; HUANG, CHIH-MING; CHAN, CHANG-YUEH; LIAO, HSIN-YI; KE, CHUN-CHI
To: SILICONWARE PRECISION INDUSTRIES CO., LTD.
Reel/Frame 024302/0056 →
Priority Claims (1)
TW 99101443 A · Jan 20, 2010 · national
Continuity (1)
Related Publication 20110177643A1 · Jul 21, 2011