IP Library › Granted Patent US 8,598,689
Granted Patent B2
US 8,598,689 · App. 13/179,316 · Granted Dec 3, 2013

Methods of manufacturing semiconductor structures and devices including nanotubes, and semiconductor structures, devices, and systems fabricated using such methods

Inventors: Gurtej S. Sandhu (Boise, ID); Terry L. Gilton (Boise, ID)
Assignee: Micron Technology, Inc.
H01L29/0669
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Quick Facts
Patent No.
US 8,598,689
App. No.
13/179,316
Granted
Dec 3, 2013
Kind
B2
Abstract

A method of forming a plurality of nanotubes is disclosed. Particularly, a substrate may be provided and a plurality of recesses may be formed therein. Further, a plurality of nanotubes may be formed generally within each of the plurality of recesses and the plurality of nanotubes may be substantially surrounded with a supporting material. Additionally, at least some of the plurality of nanotubes may be selectively shortened and at least a portion of the at least some of the plurality of nanotubes may be functionalized. Methods for forming semiconductor structures intermediate structures, and semiconductor devices are disclosed. An intermediate structure, intermediate semiconductor structure, and a system including nanotube structures are also disclosed.

Claims (27)

1. A semiconductor structure, comprising:

a semiconductor substrate having a first surface and a second, opposing surface;

a dielectric layer formed over at least a portion of the first surface of the semiconductor substrate;

at least one recess extending through the dielectric layer and into the first surface of the semiconductor substrate;

a plurality of conductive nanotubes disposed within the at least one recess;

a volume of supporting material surrounding the plurality of conductive nanotubes and filling spaces between conductive nanotubes of the plurality of conductive nanotubes within the at least one recess;

a portion of a nanotube formation substrate material disposed about a periphery of the supporting material within the at least one recess; and

a conductive layer formed over the plurality of conductive nanotubes.

2. The semiconductor structure of claim 1 , wherein the plurality of conductive nanotubes extends to a planar surface of the dielectric layer.

3. The semiconductor structure of claim 1 , further comprising a conductive via extending from the second, opposing surface of the semiconductor substrate to the first surface of the semiconductor substrate, the conductive via being in electrical communication with at least some of the plurality of conductive nanotubes.

4. The semiconductor structure of claim 1 , wherein at least some of the plurality of conductive nanotubes are configured for conducting fluid therethrough.

5. The semiconductor structure of claim 1 , wherein the plurality of conductive nanotubes, the volume of supporting material, and the portion of the nanotube formation substrate material within the at least one recess comprise a singulated nanotube bundle comprising at least two nanotubes formed with and removed from a larger plurality of nanotubes.

6. The semiconductor structure of claim 5 , further comprising a reinforcement material deposited between a periphery of the singulated nanotube bundle and a side wall of the at least one recess, wherein the reinforcement material affixes the singulated nanotube bundle within the at least one recess.

7. A system, comprising:

at least one input device;

at least one output device; and

a computing device including at least one semiconductor device, comprising:

a semiconductor substrate having a first surface and a second, opposing surface;

an insulative layer formed over at least a portion of the semiconductor substrate;

at least one recess extending at least partially through the insulative layer;

a plurality of nanotubes within the at least one recess, wherein the plurality of nanotubes comprises a singulated nanotube bundle comprising at least two nanotubes formed with and removed from a larger plurality of nanotubes, wherein the singulated nanotube bundle further comprises:

a volume of supporting material surrounding the at least two nanotubes and filling spaces between the at least two nanotubes; and

a portion of a nanotube formation substrate material disposed about a periphery of the supporting material; and

a reinforcement material deposited between a periphery of the singulated nanotube bundle and a side wall of the at least one recess, wherein the reinforcement material affixes the singulated nanotube bundle within the at least one recess.

8. The system of claim 7 , wherein the plurality of nanotubes extends to a planar surface of the insulative layer.

9. The system of claim 7 , further comprising a conductive via extending from the second, opposing surface of the semiconductor substrate to at least some of the plurality of nanotubes in the at least one recess and in electrical communication therewith.

10. The system of claim 7 , wherein at least some of the plurality of nanotubes are configured for conducting fluid therethrough.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
Continuity (2)
Division 11107125 · Apr 15, 2005
Related Publication 20110266694A1 · Nov 3, 2011