Bond pad assessment for wire bonding
For selecting suitable bonding parameters for forming wire bonds onto bond pads of a substrate, one or more indentations are made onto at least one bond pad of the substrate with an indentation tool by applying a series of predetermined forces onto the at least one bond pad with the indentation tool. A depth-force profile of the substrate is measured comprising a relationship between each predetermined force that is applied and a resultant depth of the indentation made by the indentation tool. An appropriate set of bonding parameters suitable for forming wire bonds on the substrate is determined based on the measured depth-force profile.
1. An apparatus for selecting suitable bonding parameters for forming wire bonds onto bond pads of a substrate, comprising:
an indentation tool;
an actuator operative to apply a series of predetermined forces onto at least one bond pad of the substrate with the indentation tool to make one or more indentations onto the at least one bond pad of the substrate;
a processor for measuring a depth-force profile comprising a relationship between each predetermined force that is applied and a resultant depth of the indentation made by the indentation tool and for determining an appropriate set of bonding parameters suitable for forming wire bonds onto bond pads of the substrate based on the measured depth-force profile; and
a database that contains different depth-force profiles together with respective sets of bonding parameters suitable for each depth-force profile, whereby the set of bonding parameters suitable for the bond pads of the substrate are obtained by comparing the depth-force profile that has been measured by the processor against the depth-force profiles in the database,
wherein the database further includes failure-related values of force and depth detected during indentation of the at least one bond pad of the substrate.
2. An apparatus for selecting suitable bonding parameters for forming wire bonds onto bond pads of a substrate, comprising:
an indentation tool;
an actuator operative to apply a series of predetermined forces onto at least one bond pad of the substrate with the indentation tool to make one or more indentations onto the at least one bond pad of the substrate;
a processor for measuring a depth-force profile comprising a relationship between each predetermined force that is applied and a resultant depth of the indentation made by the indentation tool and for determining an appropriate set of bonding parameters suitable for forming wire bonds onto bond pads of the substrate based on the measured depth-force profile; and
a database that contains different depth-force profiles together with respective sets of bonding parameters suitable for each depth-force profile, whereby the set of bonding parameters suitable for the bond pads of the substrate are obtained by comparing the depth-force profile that has been measured by the processor against the depth-force profiles in the database,
wherein the depth-force profiles in the database are classified into different groups according to bondability of bond pads exhibiting the respective depth-force profiles.
3. An apparatus for selecting suitable bonding parameters for forming wire bonds onto bond pads of a substrate, comprising:
an indentation tool;
an actuator operative to apply a series of predetermined forces onto at least one bond pad of the substrate with the indentation tool to make one or more indentations onto the at least one bond pad of the substrate; and
a processor for measuring a depth-force profile comprising a relationship between each predetermined force that is applied and a resultant depth of the indentation made by the indentation tool and for determining an appropriate set of bonding parameters suitable for forming wire bonds onto bond pads of the substrate based on the measured depth-force profile,
wherein the apparatus further comprises a wire bonding machine, and the indentation tool is mounted to replace a capillary of the wire bonding machine.
4. The apparatus as claimed in claim 3 , further comprising an optical device that is operative to optically inspect surfaces of the indentations made by the indentation tool for visible defects.
5. The apparatus as claimed in claim 3 , wherein the indentation tool has a tip having a similar size and shape as a free air ball produced during wire bonding.
6. The apparatus as claimed in claim 3 , further comprising a database that contains different depth-force profiles together with respective sets of bonding parameters suitable for each depth-force profile, whereby the set of bonding parameters suitable for the bond pads of the substrate are obtained by comparing the depth-force profile that has been measured by the processor against the depth-force profiles in the database.