IP Library Granted Patent US 8,659,131
Granted Patent B2
US 8,659,131 · App. 13/121,018 · Granted Feb 25, 2014

Structure for multi-row lead frame and semiconductor package capable of minimizing an under-cut

Inventors: Ji Yun Kim (Gyeonggi-do, KR); Hyun Sub Shin (Daegu, KR); Sung Won Lee (Seoul, KR); Hyung Eui Lee (Gyeonggi-do, KR); Yeong Uk Seo (Gyeonggi-do, KR); Sung Wuk Ryu (Seoul, KR); Hyuk Soo Lee (Gyeonggi-do, KR)
Assignee: LG Innotek Co., Ltd.
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Quick Facts
Patent No.
US 8,659,131
App. No.
13/121,018
Granted
Feb 25, 2014
Kind
B2
Abstract

The present invention relates to structure and manufacture method for multi-row lead frame and semiconductor package, the method characterized by forming a pad portion on a metal material (first step); performing a surface plating process or organic material coating following the first pattern formation (second step); forming a second pattern on the metal material (third step); and packaging a semiconductor chip following the second pattern formation (fourth step), whereby an under-cut phenomenon is minimized by applying a gradual etching.

Claims (11)

1. A lead frame that is a vertical lead-shaped lead frame for mounting an active element, the lead frame characterized by:

a metal material formed with a pad portion which becomes a vertical lead in the device mounting process; and

a pattern layer formed by electrolyte or non-electrolyte plating on the pad portion,

wherein the pattern layer is configured in such a way that an undercut length is formed smaller than an etched depth of the lower metal material, and

wherein a lower surface of the pattern layer in which the undercut is formed is exposed.

2. A lead frame for mounting an active element, characterized by:

a metal material formed with a pad portion which becomes a lead in the element mounting process; and

a pattern layer formed on the pad portion by electrolyte or non-electrolyte plating, where an alignment bias formed by a central point of the pattern layer and that of the pad portion is less than 38.67 μm,

wherein an undercut length of the pattern layer is formed smaller than an etched depth of the metal material, and

wherein a lower surface of the pattern layer in which the undercut is formed is exposed.

3. The lead frame of claim 2 , where a ratio of the alignment bias to pattern width is less than 0.11.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2015
From: LG INNOTEK CO., LTD.
To: ALS CO., LTD.
Reel/Frame 035598/0488 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2011
From: KIM, JI YUN; SHIN, HYUN SUB; LEE, SUNG WON; LEE, HYUNG EUI; SEO, YEONG UK; RYU, SUNG WUK; LEE, HYUK SOO
To: LG INNOTEK CO., LTD.
Reel/Frame 026759/0072 →
Priority Claims (3)
KR 10-2008-0094042 · Sep 25, 2008 · national
KR 10-2008-0100406 · Oct 14, 2008 · national
KR 10-2008-0103390 · Oct 22, 2008 · national
Continuity (1)
Related Publication 20110227208A1 · Sep 22, 2011