Lithographic apparatus, a method for removing material of one or more protrusions on a support surface, and an article support system
A lithographic projection apparatus includes a beam production system to provide a beam of radiation, pattern the beam of radiation, and project the patterned beam onto a target portion of a substrate, a support table including protrusions to support an article, a detector to detect height deviations of the protrusions, a material removing device arranged to modify a height of the protrusion material, a controller coupled between the detector and the material removing device, wherein material removing device includes a removal tool selected from the group consisting of a mechanical polishing device, a magneto rheological finishing tool, and a single or multipoint diamond tool.
1. A lithographic apparatus comprising:
a projection system configured to project a patterned beam of radiation onto a target portion of a substrate;
a support table having an array of a plurality of protrusions that is configured to support an article;
a detector configured to detect a height deviation of one or more of the protrusions that affect a surface flatness of the article supported on the support table; and
a material removing device having a removal tool that is configured to modify a height of a protrusion material of the one or more protrusions corresponding to the detected height deviation of the protrusions,
wherein the removal tool comprises a plate shaped object, a magneto rheological fluid held as a droplet at an underside of the plate shaped object, and a magnetic field generator to create a magnetic field which moves the droplet over a path along the plate shaped object.
2. The lithographic apparatus of claim 1 , wherein the droplet is less than 250 mm 3 .
3. The lithographic apparatus of claim 2 , wherein the droplet is less than 50 mm 3 .
4. The lithographic apparatus of claim 1 , wherein 1 nm to 100 nm of the one or more protrusions are removed by 1 to 250 passes of the removal tool over the one or more protrusions.
5. The lithographic apparatus of claim 1 , wherein the removal tool has dimensions smaller than 5 mm.
6. The lithographic apparatus of claim 1 , wherein in order to remove material of the one or more protrusions, the removal tool is held at a substantially stationary position.
7. The lithographic apparatus of claim 1 , wherein the removal tool is movable with respect to the one or more protrusions in order to remove material for the one or more protrusions.
8. The lithographic apparatus of claim 1 , wherein the article is a substrate.
9. The lithographic apparatus of claim 1 , wherein the article is a patterning device.
10. The lithographic apparatus of claim 1 , further comprising a controller coupled between the detector and the material removing device, wherein the controller is configured to control the material removing device to adjust a height of the one or more protrusions corresponding to the detected height deviation of the one or more protrusions.
11. A method of adjusting a height of a plurality of protrusions that supports an article in a lithographic apparatus that comprises a support table having an array of the protrusions, the method comprising:
measuring a height deviation of one or more of the protrusions that affect a surface flatness of the article supported on the support table; and
adjusting a height of a protrusion material of the protrusions by removing material of the one or more protrusions with a removal tool corresponding to the detected height deviation of the one or more protrusions,
wherein the measuring and the adjusting are executed while the support table is in an operable position in the lithographic projection apparatus, and wherein the removal tool comprises a plate shaped object, a magneto rheological fluid held as a droplet at an underside of the plate shaped object, and a magnetic field generator that creates a magnetic field to move the droplet over a path along the plate shaped object.
12. The method of claim 11 , wherein the droplet is less than 250 mm 3 .
13. The method of claim 12 , wherein the droplet is less than 50 mm 3 .
14. The method of claim 11 , wherein the measuring comprises
placing an article on the support table supported by the plurality of protrusions;
measuring a height profile of the planar surface of the article on a side facing away from the plurality of protrusions; and
computing the height deviations of the plurality of protrusions from the height profile.