IP Library › Granted Patent US 8,817,547
Granted Patent B2
US 8,817,547 · App. 13/709,792 · Granted Aug 26, 2014

Apparatuses and methods for unit identification in a master/slave memory stack

Inventors: Anthony D. Veches (Boise, ID); Joshua E. Alzheimer (Boise, ID); Dennis R. Blankenship (Boise, ID)
Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 8,817,547
App. No.
13/709,792
Granted
Aug 26, 2014
Kind
B2
Abstract

Apparatuses and methods including a plurality of memory units are disclosed. An example apparatus includes a plurality of memory units. Each of the plurality of memory units include a master/slave identification (ID) node coupled to a first voltage source node via a resistive element. Each of the plurality of memory units further include a master/slave ID circuit configured to determine whether a memory unit is a master memory unit or a slave memory unit based on a voltage level detected at the master/slave ID node. The master/slave ID node of each of the plurality of memory units other than a first memory unit is further coupled to a respective second voltage source node via a through-substrate via (TSV) of a respective adjacent memory unit of the plurality of memory units.

Claims (35)

1. An apparatus comprising:

a plurality of memory units, each of the plurality memory units comprising:

a master/slave identification (ID) node coupled to a first voltage source node via a resistive element; and

a master/slave ID circuit configured to determine whether a memory unit is a master memory unit or a slave memory unit based on a voltage level detected at the master/slave ID node;

wherein the master/slave ID node of each of the plurality of memory units other than a first memory unit is further coupled to a respective second voltage source node via a through-substrate via (TSV) of a respective adjacent memory unit of the plurality of memory units.

2. The apparatus of claim 1 , wherein the first voltage source node is a reference voltage voltage source node.

3. The apparatus of claim 1 , wherein the second voltage source node is a VCC voltage source node.

4. The apparatus of claim 1 , wherein the TSV of a respective one of the plurality of memory units is coupled to the master/slave ID node of a respective one of the plurality of memory units via a conductive interconnector.

5. The apparatus of claim 1 , wherein the first memory unit is configured to receive a plurality of chip select (CS) signals and further configured to provide each of the plurality of CS signals to a respective memory unit of the plurality of memory units.

6. The apparatus of claim 5 , wherein each of the plurality of CS signals is propagated along a corresponding laddered path through at least one of the plurality of memory units to a first CS node of the respective memory unit.

7. The apparatus of claim 1 , wherein each of the plurality of memory units are substantially identical.

8. The apparatus of claim 1 , wherein each of the plurality of memory units are fabricated according to a common die and fabrication process.

9. A method comprising:

receiving a first voltage level at a first master/slave identification ID node of a first memory unit;

receiving, from the first memory unit, a second voltage level at a second master/slave identification ID node of a second memory unit;

identifying the first memory unit as a master based on the first voltage level; and

identifying the second memory device as a slave based on the second voltage level.

10. The method of claim 9 , further comprising enabling chip select input nodes of the first memory device responsive to identifying the first memory device as a master.

11. The method of claim 9 , wherein the first voltage level is less than the second voltage level.

12. The method of claim 9 , wherein the first voltage level is ground and the second voltage level is Vcc.

13. The method of claim 9 , wherein the first memory unit and the second memory unit form a memory stack.

14. The method of claim 9 , further comprising:

receiving, from the second memory unit, a third voltage level at a third master/slave identification ID node of a third memory unit, wherein the third voltage level is substantially equal to the second voltage level; and

identifying the third memory unit as a slave based on the third voltage level.

15. An apparatus comprising:

a first memory unit including a first master/slave identification (ID) node coupled to a first voltage source node via a resistive element, and further including a first master/slave ID circuit configured to identify the first memory unit as a master memory unit based on a voltage level detected at the first master/slave ID node;

a second memory unit including a second master/slave ID node coupled to a second voltage source node, and further including a second master/slave ID circuit configured to identify the second memory unit as slave memory unit based on a voltage level detected at the second master/slave ID node.

16. The apparatus of claim 15 , wherein the second memory unit is coupled to the first memory unit, wherein the second master/slave ID node is coupled to the second voltage source node via the first memory unit.

17. The apparatus of claim 16 , wherein the second master/slave ID node is coupled to the second voltage source node via a through-substrate via on the first memory unit.

18. The apparatus of claim 17 , wherein the second master/slave ID node is aligned with the through-substrate via on the first memory unit.

19. The apparatus of claim 18 , wherein the first memory unit is coupled below the second memory unit with the through-substrate via of the first memory unit coupled to a master/slave ID pad of the second memory unit, wherein the master/slave ID pad includes the second master/slave ID node.

20. The apparatus of claim 15 , wherein the second master/slave ID node is further coupled to the first voltage source node via a second resistive element.

21. The apparatus of claim 15 , wherein a voltage level of the first voltage source node is less than a voltage level of the second voltage source node.

22. The apparatus of claim 15 , wherein the first memory unit is substantially identical to the second memory unit.

23. The apparatus of claim 15 , wherein the second master/slave ID node is further coupled to the first voltage source node via a second resistive element, wherein the second master/slave ID node defaults to a voltage level of the first voltage source node and is pulled up to a voltage level of the second voltage source node responsive to being coupled to the second voltage source node.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 10, 2012
From: VECHES, ANTHONY D.; ALZHEIMER, JOSHUA E.; BLANKENSHIP, DENNIS R.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 029438/0566 →
Continuity (1)
Related Publication 20140160867A1 · Jun 12, 2014