Sealed shallow trench isolation region

1. A method for formation of a sealed shallow trench isolation (STI) region for a semiconductor device, the method comprising:

forming a STI region in a substrate, the STI region comprising a STI fill;

forming a sealing recess in the STI fill of the STI region;

forming a sealing layer in the sealing recess over the STI fill, wherein the sealing layer comprises a high-k (HK) material;

forming an oxide fill over the sealing layer;

planarizing a top surface of the oxide fill such that the top surface of the oxide fill is level with a top surface of a pad nitride layer, wherein the pad nitride layer is located on top of a pad oxide layer, the pad oxide layer being located on a top surface of the substrate, wherein a portion of the sealing layer is formed on top of the pad nitride layer, and wherein planarizing the top surface of the oxide fill removes the portion of the sealing layer that is located on top of the pad nitride layer;

after planarizing the top surface of the oxide fill, removing a wing portion of the sealing layer, the wing portion of the sealing layer being located between the oxide fill and the pad nitride layer;

removing the pad nitride layer after removing the wing portion of the sealing layer; and

removing the pad oxide layer and the oxide fill after removing the pad nitride layer.

2. The method of claim 1 , wherein forming the sealing layer in the sealing recess comprises depositing a material of the sealing layer in the sealing recess such that a thickness of the sealing layer is about equal to a depth of the sealing recess in the STI fill with respect to a top surface of the substrate.

3. The method of claim 1 , wherein forming the STI region in the substrate comprises:

forming a STI recess in the substrate;

forming a sealing liner, the sealing liner comprising the same material as the sealing layer, in the STI recess; and

forming the STI fill over the sealing liner.

4. The method of claim 1 , further comprising performing an amorphization implant of the wing portion of the sealing layer before removal of the wing portion of the sealing layer, the amorphization implant having an amorphization depth that is about equal to a level of a top surface of the substrate.

5. The method of claim 4 , further comprising annealing the sealing layer such that the sealing layer is crystallized by the anneal before removing the pad oxide layer and the oxide fill.

6. A method for formation of a sealed shallow trench isolation (STI) region for a semiconductor device, the method comprising:

forming a STI region in a substrate, the STI region comprising a STI fill;

forming a sealing recess in the STI fill of the STI region;

forming a sealing layer in the sealing recess over the STI fill, wherein the sealing layer comprises silicon nitride (SiN);

forming an oxide fill over the sealing layer;

planarizing a top surface of the oxide fill such that the top surface of the oxide fill is level with a top surface of a pad nitride layer, wherein the pad nitride layer is located on top of a pad oxide layer, the pad oxide layer being located on a top surface of the substrate, wherein a portion of the sealing layer is formed on top of the pad nitride layer, and wherein planarizing the top surface of the oxide fill removes the portion of the sealing layer that is located on top of the pad nitride layer; and

after planarizing the top surface of the oxide fill, removing a wing portion of the sealing layer, the wing portion of the sealing layer being located between the oxide fill and the pad nitride layer, simultaneously with removal of the pad nitride layer.

7. The method of claim 6 , further comprising performing an amorphization implant of the wing portion of the sealing layer before removal of the wing portion of the sealing layer, the amorphization implant having an amorphization depth that reaches to a level of about a top surface of the substrate.

8. The method of claim 7 , further comprising removing the pad oxide layer and the oxide fill after simultaneously removing the wing portion of the sealing layer and the pad nitride layer.

9. The method of claim 8 , further comprising annealing the sealing layer such that the sealing layer is crystallized by the anneal before removing the pad oxide layer and the oxide fill.

10. A semiconductor device comprising:

an STI region located in a substrate, the STI region comprising a STI fill;

a sealing layer located directly on top of the STI fill; and

an oxide fill located directly on top of the sealing layer, wherein a top surface of the oxide fill is level with a top surface of a pad nitride layer, wherein the pad nitride layer is located directly on top of a pad oxide layer, the pad oxide layer being located on a top surface of the substrate;

wherein the sealing layer comprises a wing portion of the sealing layer located between the oxide fill and the pad nitride layer.

11. The semiconductor device of claim 10 , wherein the STI region is located in the substrate, and wherein a top surface of the sealing layer is coplanar with a top surface of the substrate.

12. The semiconductor device of claim 10 , wherein the sealing layer comprises silicon nitride (SiN) or a high-k (HK) material.

13. The semiconductor device of claim 10 , wherein the STI region further comprises a sealing liner, the sealing liner comprising the same material as the sealing layer, the sealing liner being located between the substrate and the STI fill in the STI region.