Apparatuses, integrated circuits, and methods for measuring leakage current
Methods, apparatuses, and integrated circuits for measuring leakage current are disclosed. In one such example method, a word line is charged to a first voltage, and a measurement node is charged to a second voltage, the second voltage being less than the first voltage. The measurement node is proportionally coupled to the word line. A voltage on the measurement node is compared with a reference voltage. A signal is generated, the signal being indicative of the comparison. Whether a leakage current of the word line is acceptable or not can be determined based on the signal.
1. A method, comprising:
comparing a voltage of a measurement node with a reference voltage to determine whether leakage of a word line exceeds a threshold;
compensating for noise encountered on the word line; and
providing a signal indicative of the comparison.
2. The method of claim 1 , wherein the noise encountered on the word line is introduced by a switch transitioning from conductive to non-conductive.
3. The method of claim 2 , wherein compensating for noise encountered on the word line comprises transitioning a compensation switch from non-conductive to conductive.
4. The method of claim 2 , wherein compensating for noise further comprises compensating for a decrease in voltage due to the switch transition.
5. The method of claim 1 , wherein the signal indicates failing a word line leakage test responsive to the leakage of the word line exceeding the threshold.
6. An apparatus, comprising:
a word line leakage measurement system coupled to word lines of a memory, the word line leakage measurement system including a comparator configured to compare a voltage of a measurement node to a reference voltage to test for leakage current, and further including a compensation circuit configured to compensate for noise from decoupling the measurement node from a supply voltage source;
wherein the word line leakage measurement system is configured to automatically runs series of leakage tests for the word lines of the memory.
7. The apparatus of claim 6 , further comprising a state machine coupled to the word line leakage measurement system.
8. The apparatus of claim 7 wherein the state machine is configured to control the series of leakage tests.
9. The apparatus of claim 6 , wherein the word line leakage measurement system is internal to the memory.
10. The apparatus of claim 9 , further comprising one or more input/output nodes coupled to the word line leakage measurement system.
11. The apparatus of claim 10 , wherein results of the series of leakage tests are accessible externally through the one or more input/output nodes.
12. The apparatus of claim 6 , wherein the series of leakage tests indicate whether leakage of a word line of the memory exceeds a threshold.
13. The apparatus of claim 6 wherein the word line leakage measurement system further includes a capacitive voltage divider coupled to the measurement node.
14. The apparatus of claim 6 wherein the word line leakage measurement system further includes a proportioning circuit coupled to the measurement node.
15. The apparatus of claim 6 wherein the compensation circuit of the word line leakage measurement system comprises a switch.
16. A method comprising:
decoupling a word line charged to a first voltage from a first voltage source;
decoupling a measurement node charged to a second voltage from a supply voltage source;
compensating for noise on the word line caused by decoupling the measurement node;
comparing a voltage on the measurement node with a reference voltage; and
providing a signal having a value based on the comparison.
17. The method of claim 16 , further comprising:
capacitively coupling the word line to the measurement node; and
capacitively coupling the measurement node to ground.
18. The method of claim 16 , wherein decoupling the measurement node from the supply voltage comprises transitioning a switch from being conductive to being non-conductive and wherein compensating for noise on the word line caused by decoupling the measurement node comprises transitioning another switch coupled to the measurement node from being non-conductive to being conductive.
19. The method of claim 16 , further comprising:
decoupling an adjacent word line at ground concurrently with decoupling the word line charged to the first voltage from the first voltage source.
20. The method of claim 16 , further comprising:
decoupling other word lines, decoupling other measurement nodes, compensating for noise on the other word lines, comparing a respective voltage on the other measurement nodes with the reference voltage, and providing a respective signal having a value based on the respective comparison.