IP Library Granted Patent US 8,952,737
Granted Patent B2
US 8,952,737 · App. 14/065,754 · Granted Feb 10, 2015

Methods and systems for calibration of a delay locked loop

Inventors: Kishore Mishra (Santa Clara, CA); Purna C. Mohanty (Santa Clara, CA); Venkata N. S. N. Rao (Fremont, CA)
Assignee: Kool Chip, Inc.
H03L7/00
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Quick Facts
Patent No.
US 8,952,737
App. No.
14/065,754
Granted
Feb 10, 2015
Kind
B2
Abstract

A method for calibrating a delay locked loop (“DLL”) having a plurality of delay segments, comprises: determining segment delay values for the delay segments; calculating a full-cycle delay value for an input signal to the DLL; adjusting one or more of the segment delay values as a function of the full-cycle delay value to generate one or more adjusted delay values; and calculating weights for the delay segments as a function of the segment delay values, the full-cycle delay, and the one or more adjusted delay values, wherein the weights are used to calibrate the DLL.

Claims (39)

1. A method for calibrating a delay locked loop (“DLL”) having a plurality of delay segments, comprising:

determining segment delay values for the delay segments;

calculating a full-cycle delay value for an input signal to the DLL;

adjusting one or more of the segment delay values as a function of the full-cycle delay value to generate one or more adjusted delay values; and

calculating weights for the delay segments as a function of the segment delay values, the full-cycle delay, and the one or more adjusted delay values,

wherein the weights are used to calibrate the DLL.

2. The method of claim 1 wherein a test DLL block having passive delay cells is used to determine the segment delay values and used to calculate the full-cycle delay value.

3. The method of claim 2 wherein a segment delay value for a certain one of the delay segments is determined by incrementally increasing a phase delay of the test DLL block until the phase delay provided by the certain one of the delay segments matches the phase delay of the test DLL block.

4. The method of claim 2 wherein the full-cycle delay value is calculated by first determining a half-cycle delay value, and then doubling the half-cycle delay value to obtain the full-cycle delay value.

5. The method of claim 4 wherein the half-cycle delay value is obtained by incrementally increasing the phase delay of the test DLL block until an edge of the input signal is detected.

6. The method of claim 1 wherein the delay segments comprise a delay segment A, a delay segment B, a delay segment C, a delay segment D, a delay segment E, a delay segment F, and a delay segment G.

7. The method of claim 6 in the adjusting one or more of the segment delay values, wherein if the full-cycle delay value is equal to or less than the sum of the segment delay values, then a certain one of the delay segments is assigned a first adjusted delay value as a function of the difference of the sum of the delay values and the full-cycle delay value.

8. The method of claim 7 wherein one or more of subsequent ones of the delay segments to the certain one of the delay segments are assigned a second adjusted delay value that is equal to zero.

9. The method of claim 6 wherein if the full-cycle delay value is greater than the sum of the segment delay values, then the delay segments further comprise a delay segment H, and the difference of the sum of the segment delay values and the full-cycle delay value is a delay value for the delay segment H.

10. A method for calibrating a delay locked loop (“DLL”) having a plurality of delay segments, comprising:

determining segment delay values for the delay segments;

calculating a full-cycle delay value for an input signal to the DLL;

adjusting one or more of the segment delay values as a function of the full-cycle delay value to generate one or more adjusted delay values; and

calculating weights for the delay segments as a function of the segment delay values, the full-cycle delay, and the one or more adjusted delay values,

wherein a test DLL block having passive delay cells is used to determine the segment delay values and used to calculate the full-cycle delay value,

wherein a segment delay value for a certain one of the delay segments is determined by incrementally increasing a phase delay of the test DLL block until the phase delay provided by the certain one of the delay segments matches the phase delay of the test DLL block, and

wherein the weights are used to calibrate the DLL.

11. The method of claim 10 wherein the full-cycle delay value is calculated by first determining a half-cycle delay value, and then doubling the half-cycle delay value to obtain the full-cycle delay value.

12. The method of claim 11 wherein the half-cycle delay value is obtained by incrementally increasing the phase delay of the test DLL block until an edge of the input signal is detected.

13. The method of claim 10 wherein the delay segments comprise a delay segment A, a delay segment B, a delay segment C, a delay segment D, a delay segment E, a delay segment F, and a delay segment G.

14. The method of claim 13 wherein if the full-cycle delay value is greater than the sum of the segment delay values, then the delay segments further comprise a delay segment H, and the difference of the sum of the segment delay values and the full-cycle delay value is a delay value for the delay segment H.

15. The method of claim 10 in the adjusting one or more of the segment delay values, wherein if the full-cycle delay value is equal to or less than the sum of the segment delay values, then a certain one of the delay segments is assigned a first adjusted delay value as a function of the difference of the sum of the delay values and the full-cycle delay value.

16. The method of claim 15 wherein one or more of subsequent ones of the delay segments to the certain one of the delay segments are assigned a second adjusted delay value that is equal to zero.

17. A method for calibrating a delay locked loop (“DLL”) having a plurality of delay segments, comprising:

determining segment delay values for the delay segments;

calculating a full-cycle delay value for an input signal to the DLL, wherein the full-cycle delay value is calculated by first determining a half-cycle delay value, and then doubling the half-cycle delay value to obtain the full-cycle delay value;

adjusting one or more of the segment delay values as a function of the full-cycle delay value to generate one or more adjusted delay values; and

calculating weights for the delay segments as a function of the segment delay values, the full-cycle delay, and the one or more adjusted delay values,

wherein a test DLL block having passive delay cells is used to determine the segment delay values and used to calculate the full-cycle delay value,

wherein a segment delay value for a certain one of the delay segments is determined by incrementally increasing a phase delay of the test DLL block until the phase delay provided by the certain one of the delay segments matches the phase delay of the test DLL block,

wherein the half-cycle delay value is obtained by incrementally increasing the phase delay of the test DLL block until an edge of the input signal is detected, and

wherein the weights are used to calibrate the DLL.

18. The method of claim 17 wherein the delay segments comprise a delay segment A, a delay segment B, a delay segment C, a delay segment D, a delay segment E, a delay segment F, and a delay segment G, and wherein if the full-cycle delay value is greater than the sum of the segment delay values, then the delay segments further comprise a delay segment H, and the difference of the sum of the segment delay values and the full-cycle delay value is a delay value for the delay segment H.

19. The method of claim 17 in the adjusting one or more of the segment delay values, wherein if the full-cycle delay value is equal to or less than the sum of the segment delay values, then a certain one of the delay segments is assigned a first adjusted delay value as a function of the difference of the sum of the delay values and the full-cycle delay value, and wherein one or more of subsequent ones of the delay segments to the certain one of the delay segments are assigned a second adjusted delay value that is equal to zero.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 29, 2020
From: INVECAS, INC.
To: SYNOPSYS, INC.
Reel/Frame 051971/0624 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 20, 2019
From: SOCTRONICS, INC.
To: INVECAS, INC.
Reel/Frame 049233/0278 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2015
From: KOOL CHIP, INC.
To: SOCTRONICS, INC.
Reel/Frame 036785/0762 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2014
From: MISHRA, KISHORE; MOHANTY, PURNA C.; RAO, VENKATA N.S.N.
To: KOOL CHIP, INC.
Reel/Frame 031944/0497 →
Continuity (2)
Provisional Application 61814153 · Apr 19, 2013
Related Publication 20140312946A1 · Oct 23, 2014