IP Library Granted Patent US 8,981,571
Granted Patent B2
US 8,981,571 · App. 13/859,561 · Granted Mar 17, 2015

Package assembly and method of manufacturing the same

Inventor: Wang-Lai Yang (Zhongshan, CN)
Assignee: Shunsin Technology (Zhong Shan) Limited
H01L23/49827H01L21/56H01L23/3121H01L21/563H01L23/13H01L23/3142H01L21/565H01L2224/16225H01L2924/16151H01L2924/19105H01L2224/16245
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,981,571
App. No.
13/859,561
Granted
Mar 17, 2015
Kind
B2
Abstract

A package assembly includes a substrate, an electronic component, and an encapsulation body. The electronic component is located on the substrate and electrically connected to the substrate. The encapsulation body encapsulates the electronic component with the substrate. A portion of the substrate corresponding to the electronic component defines a plurality of through holes. A diameter of each of the plurality of through holes gradually reduces from a top surface of the substrate toward a bottom surface of the substrate. The plurality of through holes prevent melting remnants of the encapsulation body from flowing outside of the substrate.

Claims (14)

1. A package assembly, comprising:

a substrate;

an electronic component located on the substrate and electrically connected to the substrate; and

an encapsulation body encapsulating the electronic component with the substrate, wherein a portion of the substrate corresponding to the electronic component defines a plurality of through holes, the plurality of through holes is filled with the encapsulation body, a diameter of each of the plurality of through holes gradually reduces from a top surface of the substrate toward a bottom surface of the substrate, a smallest interior diameter of each of the plurality of through holes is less than an exterior diameter of a filling grain of the encapsulation body and wherein the plurality of through holes prevent melting remnants of the encapsulation body from flowing outside of the substrate.

2. The package assembly of claim 1 , wherein each of the plurality of through holes has a glossy inside surface.

3. The package assembly of claim 1 , wherein each of the plurality of through holes is in a shape of a step.

4. The package assembly of claim 3 , wherein each of the plurality of through holes comprises a first layer hole, a second layer hole and a third layer hole, sizes of the first, second and third holes gradually reduce from the top surface of the substrate toward the bottom surface of the substrate.

5. A fabrication method of a package assembly, comprising:

defining a plurality of through holes on a substrate, wherein an interior diameter of each of the plurality of through holes gradually reduces from a top surface of the substrate toward a bottom surface of the substrate;

mounting an electronic component on a portion of the substrate corresponding to the plurality of through holes, the electronic component electrically connected to the substrate; and

encapsulating the electronic component with the substrate to form an encapsulation body with the encapsulation body filled with the plurality of through holes, wherein a smallest interior diameter of one of the plurality of through holes is less than an exterior diameter of a filling grain of the encapsulation body, the plurality of through holes prevent melting remnants of the encapsulation body flowing outside of the substrate.

6. The fabrication method of the package assembly of claim 5 , wherein each of the plurality of through holes is in a shape of a step.

7. The fabrication method of the package assembly of claim 6 , wherein each of the plurality of through holes is formed by a drilling process.

8. The fabrication method of the package assembly of claim 6 , wherein each of the plurality of through holes comprises a first layer hole, a second layer hole and a third layer hole, sizes of the first, second and third holes gradually reduce from the top surface of the substrate toward the bottom surface of the substrate.

Assignments (3)
CHANGE OF NAME Recorded Jul 24, 2014
From: AMBIT MICROSYSTEMS (ZHONGSHAN) LTD.
To: SHUNSIN TECHNOLOGY (ZHONG SHAN) LIMITED
Reel/Frame 033394/0797 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 14, 2013
From: HON HAI PRECISION INDUSTRY CO., LTD.
To: AMBIT MICROSYSTEMS (ZHONGSHAN) LTD.
Reel/Frame 030407/0988 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2013
From: YANG, WANG-LAI
To: AMBIT MICROSYSTEMS (ZHONGSHAN) LTD.; HON HAI PRECISION INDUSTRY CO., LTD.
Reel/Frame 030181/0904 →
Priority Claims (1)
CN 2012 1 0309071 · Aug 27, 2012 · national
Continuity (1)
Related Publication 20140054792A1 · Feb 27, 2014