Temperature measurement apparatus, method of estimating temperature profile, recording medium and heat treatment apparatus

1. A temperature measurement apparatus for estimating a temperature profile in a process container of a heat treatment apparatus including the process container, in which a rotating table for mounting a substrate is provided, and a heater for heating the process container, comprising:

a radiation temperature measurement unit configured to measure the temperature of plural temperature measurement areas on a surface of the rotating table in a radius direction of the rotating table by scanning the surface of the rotating table in the radius direction;

an instruction receiving unit that receives an instruction for measuring the temperature profile in the process container;

an operation control unit that

controls to start heating of the process container by the heater while keeping the rotating table immobilized, when the instruction receiving unit receives the instruction for measuring the temperature profile in the process container, and

controls to repeat a scanning operation, in which the radiation temperature measurement unit scans the surface of the rotating table in the radius direction to obtain the temperature of the plural temperature measurement areas in the radius direction while the rotating table is rotated in a circumferential direction of the rotating table with respect to the radiation temperature measurement unit, after a predetermined period has passed from starting the heating of the process container, for obtaining the temperature of the plural temperature measurement areas at the surface of the rotating table in the radius direction and the circumferential direction from the radiation temperature measurement unit;

a temperature map generating unit that

specifies the address of the temperature measurement area for which the operation control unit obtains the temperature based on the number of the temperature measurement areas obtained by the radiation temperature measurement unit for each of the scanning operations in the radius direction of the rotating table, and the rotating speed of the rotating table, and

stores the temperature in correspondence with the corresponding address in a storing unit; and

a temperature data display processing unit that displays the temperature profile of the surface of the rotating table based on the temperature and the address stored in the storing unit by the temperature map generating unit, as the temperature profile in the process container.

2. The temperature measurement apparatus according to claim 1 ,

wherein the radiation temperature measurement unit is configured to measure the temperature of the plural temperature measurement areas along a radius of the rotating table by scanning the surface of the rotating table in the radius direction at a predetermined position at the process container, and

the operation control unit repeats the scanning operation at least until the rotating table is rotated for one cycle with respect to the radiation temperature measurement unit, for obtaining the temperature of the plural temperature measurement areas at the surface of the rotating table in the radius direction and the circumferential direction from the radiation temperature measurement unit.

3. The temperature measurement apparatus according to claim 1 ,

wherein, when the instruction receiving unit receives a predetermined angle of the rotating table, the temperature data display processing unit displays the temperature profile of a line along the predetermined angle based on the temperature and the addresses stored in the storing unit.

4. The temperature measurement apparatus according to claim 1 ,

wherein the operation control unit controls the rotation speed of the rotating table based on the scanning speed of the radiation temperature measurement unit, such that the radiation temperature measurement unit scans the surface of the rotating table in the radius direction of the rotating table greater than or equal to 10 times while the rotating table is rotated for one cycle with respect to the radiation temperature measurement unit.

5. The temperature measurement apparatus according to claim 1 ,

wherein the radiation temperature measurement unit measures the surface of the rotating table by receiving an infrared ray radiated from the surface of the rotating table,

the process container is provided with a slit at a predetermined position along an inner side to an outer side of the rotating table and a transparent plate which is configured to cover the slit as well as be capable of transmitting the infrared ray, and

the radiation temperature measurement unit measures the temperature of the plural temperature measurement areas along the radius direction of the rotating table by scanning the surface of the rotating table in the radius direction via the transparent plate.

6. The temperature measurement apparatus according to claim 1 ,

wherein the radiation temperature measurement unit is configured to scan the surface of the rotating table along the radius direction of the rotating table from an inner side to an outer side.

7. A heat treatment apparatus, comprising:

the process container in which the rotating table for mounting the substrate is provided;

the heater that heats the process container; and

the temperature measurement apparatus according to claim 1 .

8. A method of estimating a temperature profile in a process container of a heat treatment apparatus including the process container, in which a rotating table for mounting a substrate is provided, and a heater for heating the process container, comprising:

starting heating of the process container by the heater while keeping the rotating table immobilized, based on an instruction for measuring the temperature profile in the process container;

after a predetermined period has passed from starting the heating of the process container, repeating a scanning operation, in which a radiation temperature measurement unit, which is configured to measure temperature of plural temperature measurement areas on a surface of the rotating table in a radius direction of the rotating table by scanning the surface of the rotating table in the radius direction, scans the surface of the rotating table in the radius direction to obtain the temperature of the plural temperature measurement areas in the radius direction while the rotating table is rotated in a circumferential direction of the rotating table with respect to the radiation temperature measurement unit;

specifying the address of the temperature measurement area for which the temperature is obtained based on the number of the temperature measurement areas obtained by the radiation temperature measurement unit for each of the scanning operations in the radius direction of the rotating table, and the rotating speed of the rotating table;

storing the temperature in correspondence with the corresponding address in a storing unit; and

displaying the temperature profile of the surface of the rotating table based on the temperature and the address stored in the storing unit, as the temperature profile in the process container.

9. The method of estimating a temperature profile according to claim 8 ,

wherein in the repeating the scanning operation, the scanning operation is repeated at least until the rotating table is rotated for one cycle with respect to the radiation temperature measurement unit, for obtaining the temperature of the plural temperature measurement areas at the surface of the rotating table in the radius direction and the circumferential direction from the radiation temperature measurement unit.

10. A non-transitory computer-readable recording medium having recorded thereon a program that causes a computer to execute the method of estimating a temperature profile according to claim 8 .