Printed circuit board having hexagonally aligned bump pads for substrate of semiconductor package, and semiconductor package including the same
Provided are a printed circuit board (PCB) having hexagonally aligned bump pads as a substrate of a semiconductor package, and a semiconductor package including the same. The PCB includes: a PCB body; a bottom metal layer at a bottom of the PCB body; and a top metal layer at a top of the PCB body, and the top metal layer includes: vias vertically connected to the PCB body; bump pads hexagonally aligned in a horizontal direction around the vias; and connection patterns connecting the vias to two or more of the bump pads. Accordingly, the number of bump pads in a unit area of the PCB may be increased.
1. A printed circuit board (PCB) as a substrate of a semiconductor package, the PCB comprising:
a PCB body;
a bottom metal layer at a bottom of the PCB body; and
a top metal layer at a top of the PCB body,
wherein the top metal layer comprises:
vias which are vertically connected to the PCB body;
bump pads which are aligned hexagonally around the vias in a horizontal direction; and
connection patterns which connect the vias to two or more of the bump pads, the connection patterns being positioned between the vias and the two or more of the bump pads, respectively,
wherein the two or more of the bump pads connected to the vias through the connection patterns are electrically connected with each other.
2. The PCB of claim 1 , further comprising a solder resister layer which exposes only contact parts of the top metal layer and the bottom metal layer.
3. A printed circuit board (PCB) as a substrate of a semiconductor package, the PCB comprising:
a PCB body;
a bottom metal layer at a bottom of the PCB body; and
a top metal layer at a top of the PCB body,
wherein the top metal layer comprises:
a first bump pad group comprising vias which are vertically connected to the PCB body, bump pads which are aligned hexagonally around the vias in a horizontal direction, and connection patterns which connect the vias to two or more of the bump pads, the connection patterns being positioned between the vias and the two or more of the bump pads, respectively; and
a second bump pad group comprising vias and bump pads, wherein an alignment of the bump pads with respect to the vias of the second bump pad group is different from that of the first bump pad group,
wherein one or more semiconductor chips are mounted on the top metal layer of the PCB by using bumps, and
wherein the two or more of the bump pads connected to the vias through the connection patterns of the first bump pad group are electrically connected with each other.
4. The PCB of claim 3 , wherein:
the first bump pad group is aligned in a center region of the top metal layer; and
the second bump pad group is aligned in an edge region of the top metal layer.
5. The PCB of claim 3 , wherein a plurality of first bump pad groups and a plurality of second bump pad groups alternate with each other in the top metal layer, according to a terminal of a semiconductor device to which bump pads of each bump pad group are connected, and
wherein the bump pads in the first bump pad group do not overlap the vias of the first bump pad group and one or more of the bump pads in the second bump pad group overlap the vias of the second bump pad group.
6. The PCB of claim 3 , wherein the bump pads in the first bump pad group are connection terminals for power terminals of a semiconductor device.
7. The PCB of claim 3 , wherein the bump pads in the first bump pad group are connection terminals for ground terminals of a semiconductor device.
8. The PCB of claim 3 , wherein the bump pads in the first bump pad group do not overlap the vias of the first bump pad group.
9. The PCB of claim 3 , wherein one or more of the bump pads in the second bump pad group overlap the vias of the second bump pad group.
10. The PCB of claim 3 , further comprising a solder resister layer which exposes only contact parts of the top metal layer and the bottom metal layer.
11. A semiconductor package comprising:
a printed circuit board (PCB) as a substrate of the semiconductor package; and
one or more semiconductor chips which are mounted on a top metal layer of the PCB by using bumps,
wherein the top metal layer of the PCB comprises:
a first bump pad group comprising vias which are vertically connected to a PCB body of the PCB, bump pads which are aligned hexagonally around the vias in a horizontal direction, and connection patterns which connect the vias to two or more of the bump pads, the connection patterns being positioned between the vias and the two or more of the bump pads, respectively; and
a second bump pad group comprising vias and bump pads, wherein an alignment of the bump pads with respect to the vias of the second bump pad group is different from that of the first bump pad group,
wherein the two or more of the bump pads connected to the vias through the connection patterns of the first bump pad group are electrically connected with each other.
12. The semiconductor package of claim 11 , wherein:
the first bump pad group is aligned in a center region of the top metal layer; and
the second bump pad group is aligned in an edge region of the top metal layer.
13. The semiconductor package of claim 11 , wherein a plurality of first bump pad groups and a plurality of second bump pad groups alternate with each other in the top metal layer, according to a terminal of a semiconductor device to which bump pads of each bump pad group are connected,
wherein the bump pads in the first bump pad group do not overlap the vias of the first bump pad group and one or more of the bump pads in the second bump pad group overlap the vias of the second bump pad group.
14. The semiconductor package of claim 11 , wherein the bump pads in the first bump pad group are connection terminals for at least one of power terminals and ground terminals of the one or more semiconductor chips.
15. The semiconductor package of claim 11 , wherein one or more semiconductor packages are vertically connected to each other.
16. The semiconductor package of claim 11 , wherein the one or more semiconductor chips comprises a plurality of semiconductor chips vertically stacked above the top metal layer of the PCB.
17. The semiconductor package of claim 11 , wherein the bump pads in the second bump pad group are connection terminals for input/output (I/O) terminals other than power terminals and ground terminals of the one or more semiconductor chips.
18. A semiconductor package comprising:
a printed circuit board (PCB) as a substrate of the semiconductor package; and
one or more semiconductor chips which are mounted on a top metal layer of the PCB by using bumps,
wherein the top metal layer of the PCB comprises:
vias which are vertically connected to a PCB body of the PCB;
bump pads which are aligned hexagonally around the vias in a horizontal direction; and
connection patterns which connect the vias to two or more of the bump pads, the connection patterns being positioned between the vias and the two or more of the bump pads, respectively,
wherein the two or more of the bump pads connected to the vias through the connection patterns are electrically connected with each other.
19. The semiconductor package of claim 18 , wherein the PCB comprises a solder resister layer which exposes only contact parts of the top metal layer which contact the one or more semiconductor chips.
20. The semiconductor package of claim 18 , wherein the bump pads are connection terminals for at least one of power terminals and ground terminals of the one or more semiconductor chips.