Aspect ratio dependent etch (ARDE) lag reduction process by selective oxidation with inert gas sputtering
Embodiments of methods for etching a substrate include exposing the substrate to a first plasma formed from an inert gas; exposing the substrate to a second plasma formed from an oxygen-containing gas to form an oxide layer on a bottom and sides of a low aspect ratio feature and a high aspect ratio feature, wherein the oxide layer on the bottom of the low aspect ratio feature is thicker than on the bottom of the high aspect ratio feature; etching the oxide layer from the bottom of the low and high aspect ratio features with a third plasma to expose the bottom of the high aspect ratio feature while the bottom of the low aspect ratio feature remains covered; and exposing the substrate to a fourth plasma formed from a halogen-containing gas to etch the bottom of the low aspect ratio feature and the high aspect ratio feature.
1. A method of etching a substrate having a low aspect ratio feature and a high aspect ratio feature disposed in the substrate, comprising:
(a) exposing the substrate to a first plasma formed from an inert gas;
(b) subsequently exposing the substrate to a second plasma formed from a first process gas comprising an oxygen-containing gas to form an oxide layer on a bottom and sides of the low aspect ratio feature and on a bottom and sides of the high aspect ratio feature, wherein the oxide layer formed on the bottom of the low aspect ratio feature is thicker than the oxide layer formed on the bottom of the high aspect ratio feature;
(c) etching the oxide layer from the bottom of the low aspect ratio feature and from the bottom of the high aspect ratio feature with a third plasma formed from a second process gas to expose the bottom of the high aspect ratio feature while the bottom of the low aspect ratio feature remains covered by the oxide layer; and
(d) exposing the substrate to a fourth plasma formed from a third process gas comprising a halogen-containing gas to etch the bottom of the low aspect ratio feature and the bottom of the high aspect ratio feature.
2. The method of claim 1 , further comprising exposing the substrate to the fourth plasma to etch each of the low aspect ratio feature and the high aspect ratio feature to a substantially equivalent depth.
3. The method of claim 1 , further comprising repeating (a)-(d) until a desired depth of the low aspect ratio feature and high aspect ratio feature is reached.
4. The method of claim 1 , wherein an aspect ratio of a depth to width of the high aspect ratio feature is up to about 30:1.
5. The method of claim 1 , wherein the aspect ratio of the low aspect ratio feature is up to about 15:1.
6. The method of claim 1 , wherein the inert gas is one of argon, helium, or xenon.
7. The method of claim 1 , further comprising providing about 500 watts to about 2000 watts of RF energy to form the first plasma.
8. The method of claim 7 , further comprising providing an RF bias power of about 20 watts to about 300 watts to the substrate during (a).
9. The method of claim 8 , further comprising maintaining a pressure of less than about 100 mTorr during (a).
10. The method of claim 1 , wherein a temperature of the substrate during (b) is about 10 degrees Celsius to about 120 degrees Celsius.
11. The method of claim 1 , wherein a difference between the thickness of the oxide layer formed atop the bottom of the high aspect ratio feature and the thickness of the oxide layer formed atop the bottom of the low aspect ratio feature is less than about 10 nm.
12. The method of claim 1 , wherein the first process gas further comprises an inert gas.
13. The method of claim 1 , further comprising providing about 300 watts to about 2000 watts of RF energy to form the fourth plasma.
14. The method of claim 13 , further comprising providing an RF bias power of about 300 watts to about 1200 watts to the substrate during (d).
15. The method of claim 13 , further comprising maintaining a pressure of about 3 mTorr to about 100 mTorr during (d).
16. The method of claim 1 , wherein the first process gas comprises one or more of oxygen gas (O 2 ), ozone (O 3 ), or nitrous oxide (N 2 O).
17. The method of claim 1 , wherein the second process gas comprises a fluorine-containing gas.
18. The method of claim 17 , wherein the second process gas comprises one or more of tetrafluoromethane (CF 4 ), hexafluoroethane (C 2 F 6 ), fluoromethane (CH 3 F), and difluoromethane (CH 2 F 2 ).
19. The method of claim 1 , wherein the third process gas comprises a chlorine-containing gas.
20. The method of claim 19 , wherein the third process gas comprises one or more of chlorine (Cl 2 ), chlorine trifluoride (ClF 3 ), hydrogen bromide (HBr), and boron trichloride (BCl 3 ).