IP Library › Granted Patent US 9,090,854
Granted Patent B2
US 9,090,854 · App. 13/281,014 · Granted Jul 28, 2015

Method and apparatus for processing wafer-shaped articles

Inventors: Stephan Hoffmann (Finkenstein, DE); Harald Kraus (Villach, AT); Gunter Mettin (Villach, AT)
Assignee: LAM RESEARCH AG
C11D7/06C11D7/3209C11D11/0047C23G1/14C23G3/00H01L21/02057H01L21/67051
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,090,854
App. No.
13/281,014
Granted
Jul 28, 2015
Kind
B2
Abstract

In a method and apparatus for treating a surface of an article, an improved rinse liquid prevents build-up of static charge while avoiding damages to certain types of exposed metal-containing surfaces. In one embodiment, a semiconductor wafer having structures including at least one of cobalt, nickel and platinum is rotated on a spin chuck, as a rinse liquid is dispensed onto a surface of the wafer. The rinse liquid is a dilute aqueous solution of a base of the formula in which R 1 , R 2 and R 3 are each independently selected from hydrogen and C 1-4 alkyl. The base has a boiling point less than 100° C., and the rinse liquid has a pH in the range of 8 to 10.

Claims (13)

1. A method for treating a surface of an article, comprising:

rotating an article on a spin chuck about a rotation axis, wherein the article comprises a surface generally perpendicular to said rotation axis that comprises structures including a material that comprises at least one metal selected from the group consisting of cobalt, nickel, copper and platinum;

dispensing a rinse liquid onto said surface, said rinse liquid consisting essentially of an aqueous solution of a base of the formula

in which R 1 , R 2 and R 3 are each independently selected from hydrogen and C 1-4 alkyl, said base having a boiling point less than 100° C., said rinse liquid having a pH in the range of 8 to 10.

2. The method according to claim 1 , wherein the article is a semiconductor wafer.

3. The method according to claim 1 , wherein said material is a silicide.

4. The method according to claim 1 , wherein said base is a gas at 25° C. and 101.325 kPa.

5. The method according to claim 4 , wherein said base is NH 3 .

6. The method according to claim 5 , wherein said NH 3 is present in said rinse liquid at a concentration from 10 −5 mol/L to 10 −4 mol/L.

7. The method according to claim 1 , wherein said material is a cobalt silicide layer formed on at least one terminal of transistors formed on said surface.

8. The method according to claim 1 , wherein said article is rotated at a speed of 10-2000 rpm.

9. The method according to claim 1 , wherein said surface faces away from said spin chuck.

10. The method according to claim 1 , further comprising continuing to rotate said article on said spin chuck after ceasing dispensing said rinse fluid.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2011
From: HOFFMANN, STEPHAN; KRAUS, HARALD; METTIN, GUNTER
To: LAM RESEARCH AG
Reel/Frame 027122/0710 →
Continuity (1)
Related Publication 20130098392A1 · Apr 25, 2013