Electron beam diagnostic system using computed tomography and an annular sensor
View Patent ↗A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
1. An apparatus for analyzing an electron beam, wherein the electron beam has a central propagation axis, comprising:
an electron beam diagnostic sensor adapted to receive the electron beam;
a continuous or segmented circular sensor structure operatively connected to said electron beam diagnostic sensor, wherein said continuous or segmented circular sensor structure has a sensor structure central axis that is arranged coaxially with the electron beam central propagation axis and wherein said continuous or segmented circular sensor structure receives the electron beam;
a system for sweeping the electron beam from said sensor structure central axis and the electron beam central propagation axis to and along said continuous or segmented circular sensor structure wherein the electron beam is intercepted by said continuous or segmented circular sensor structure; and
a device for measuring the electron beam that is intercepted by said continuous or segmented circular sensor structure.
2. The apparatus for analyzing an electron beam of claim 1 wherein said continuous or segmented circular sensor structure includes a slit.
3. The apparatus for analyzing an electron beam of claim 1 wherein said continuous or segmented circular sensor structure includes a continuous slit.
4. The apparatus for analyzing an electron beam of claim 1 wherein said continuous or segmented circular sensor structure is a segmented circular sensor structure.
5. The apparatus for analyzing an electron beam of claim 1 wherein said continuous or segmented circular sensor structure includes a wire.
6. The apparatus for analyzing an electron beam of claim 1 wherein said continuous or segmented circular sensor structure is a continuous circular sensor structure.
7. An apparatus for analyzing an electron beam, wherein the electron beam has a central propagation axis, comprising:
an electron beam diagnostic sensor means for receiving the electron beam;
a continuous or segmented circular sensor means for receiving the electron beam operatively connected to said electron beam diagnostic sensor means, wherein said continuous or segmented circular sensor means has a sensor means central axis arranged coaxially with the electron beam central propagation axis, and wherein said continuous or segmented circular sensor means receives the electron beam;
means for sweeping the electron beam relative to said sensor means central axis and the electron beam central propagation axis to and along said continuous or segmented circular sensor means, wherein the electron beam is intercepted by said continuous or segmented circular sensor means, and
means for measuring the electron beam that is intercepted by said continuous or segmented circular sensor means.
8. The apparatus for analyzing an electron beam of claim 7 wherein said continuous or segmented circular sensor means includes a slit.
9. The apparatus for analyzing an electron beam of claim 7 wherein said continuous or segmented circular sensor means includes a continuous slit.
10. The apparatus for analyzing an electron beam of claim 7 wherein said continuous or segmented circular sensor means is a segmented circular sensor means.
11. The apparatus for analyzing an electron beam of claim 7 wherein said continuous or segmented circular sensor means includes a wire.
12. The apparatus for analyzing an electron beam of claim 7 wherein said continuous or segmented circular sensor means is a continuous circular sensor means.
13. A method of analyzing an electron beam, wherein the electron beam has a central propagation axis, comprising the steps of:
providing an electron beam diagnostic sensor adapted to receive the electron beam;
providing a continuous or segmented circular sensor structure operatively connected to said electron beam diagnostic sensor, wherein said continuous or segmented circular sensor structure has a sensor structure central axis that is arranged coaxially with the electron beam central propagation axis and wherein said continuous or segmented circular sensor structure receives the electron beam;
sweeping the electron beam radially outward from said central axis of said electron beam diagnostic sensor to said continuous or segmented circular sensor structure wherein the electron beam is intercepted by said continuous or segmented circular sensor structure;
sweeping the electron beam along said continuous or segmented circular sensor structure; and
measuring the electron beam.
14. The method of analyzing an electron beam of claim 13 wherein said continuous or segmented circular sensor structure that receives the electron beam renders a current versus position of the electron beam and wherein said step of measuring the electron beam generates a current versus time profile of the electron beam.
15. The method of analyzing an electron beam of claim 13 wherein said step of measuring the electron beam comprises using a fast acting data acquisition system to render a current versus position of the electron beam that is integrated along the length of the portion of the sensor that is intercepting the beam.