Electron beam apparatus for inspecting a pattern on a sample using multiple electron beams

1. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, and an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy; and

means for compensating the measured XY coordinates (x, y) on the basis of the calculated orthogonal error upon inspecting the sample,

wherein the calculation of the orthogonal error of the XY coordinates comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2); and

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 .

2. The electron beam apparatus of claim 1 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a micro-channel plate (MCP) for magnifying the secondary electrons, scibtillator coated on the lower surface of a fiber optical plate (FPO), for converting the magnified secondary electron beams to an optical signal, and a TDI detector for detecting the optical signal to provide an electrical signal.

3. The electron beam apparatus of claim 1 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a TDI detector for detecting secondary electrons emitted from the sample surface to provide an electrical signal.

4. The electron beam apparatus of claim 1 , wherein the apparatus is of a multi-axis multi-beam type comprising:

a plurality of primary electro-optical systems for irradiating multiple primary electron beams on a surface of the sample;

a plurality of secondary electro-optical systems associated with the primary electro-optical systems, respectively, for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beams; and

a plurality of detectors associated with the secondary electro-optical systems, respectively, for detecting the secondary electrons and generating electric signals corresponding to the detected electrons.

5. The electron beam apparatus of claim 4 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise electron guns comprising an anode substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the anode substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

6. The electron beam apparatus of claim 5 , wherein the respective primary electro-optical system have axes parallel to each other and perpendicular to the sample surface, and comprise objective lenses comprising a substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical system, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

7. The electron beam apparatus of claim 6 , wherein the primary electro-optical systems are adapted to rotate around an axis passing through the center of the sample, so that when the sample has a plurality of dies aligned on the sample surface, the same positions of the dies can be irradiated by the primary electron beams from the electron guns, respectively.

8. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of secondary electrons emitted from the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2);

calculating the orthogonal error of the XY coordinate as a difference between the obtained coefficients c 1 and b 2 ; and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , d 2 , e 1 and e 2 into the following Equations (3) and (4),

Δ x=d 1 x 2 +e 1 y 2   (3)

Δ y=d 2 x 2 +e 2 y 2   (4).

9. The electron beam apparatus of claim 8 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a micro-channel plate (MCP) for magnifying the secondary electrons, scibtillator coated on the lower surface of a fiber optical plate (FPO), for converting the magnified secondary electron beams to an optical signal, and a TDI detector for detecting the optical signal to provide an electrical signal.

10. The electron beam apparatus of claim 8 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a TDI detector for detecting secondary electrons emitted from the sample surface to provide an electrical signal.

11. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of a primary electron beam to be irradiated to the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2);

calculating the orthogonal error of the XY coordinate as a difference between the obtained coefficients c 1 and b 2 ; and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , d 2 , e 1 and e 2 into the following Equations (3) and (4),

Δ x=d 1 x 2 +e 1 y 2   (3)

Δ y=d 2 x 2 +e 2 y 2   (4).

12. The electron beam apparatus of claim 11 , wherein the apparatus is of a multi-axis multi-beam type comprising:

a plurality of primary electro-optical systems for irradiating multiple primary electron beams on the sample surface, each primary electro-optical system including the compensation means which comprises a deflector for deflecting the primary electron beam;

a plurality of secondary electro-optical systems associated with the primary electro-optical systems, respectively, for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beams; and

a plurality of detectors associated with the secondary electro-optical systems, respectively, for detecting the secondary electrons and generating electric signals corresponding to the detected electrons.

13. The electron beam apparatus of claim 12 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise electron guns comprising an anode substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the anode substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

14. The electron beam apparatus of claim 13 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise objective lenses comprising a substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

15. The electron beam apparatus of claim 14 , wherein the primary electro-optical systems are adapted to rotate around an axis passing through the center of the sample, so that when the sample has a plurality of dies aligned on the sample surface, the same positions of the dies can be irradiated by the primary electron beams from the electron guns, respectively.

16. A method of compensating an error regarding a stage position in an electron beam apparatus for inspecting a pattern on a sample using an electron beam, comprising:

calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample from a calculated ideal position XY coordinate of the reference point, and an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy; and

compensating the measured XY coordinates (x, y) on the basis of the calculated orthogonal error upon inspecting the sample,

wherein the calculation of the orthogonal error of the XY coordinates comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2); and

calculating the orthogonal error of the XY coordinate as a difference between the obtained coefficients c 1 and b 2 .

17. A method of compensating an error regarding a stage position in an electron beam apparatus for inspecting a pattern on a sample using an electron beam, comprising:

calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample from a calculated ideal position XY coordinate of the reference point;

calculating an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy;

calculating an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

compensating deflection by a beam deflector disposed in a secondary electro-optical system on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2);

calculating the orthogonal error of the XY coordinate as a difference between the obtained coefficients c 1 and b 2 ; and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , d 2 , e 1 and e 2 into the following Equations (3) and (4),

Δ x=d 1 x 2 +e 1 y 2   (3)

Δ y=d 2 x 2 +e 2 y 2   (4).

18. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, and an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy; and

means for compensating the measured XY coordinates (x, y) on the basis of the calculated orthogonal error upon inspecting the sample,

wherein the calculation of the orthogonal error of the XY coordinates comprises:

recursive processing for obtaining coefficients a 1 ˜c 1 and a 2 ˜c 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2); and

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 .

19. The electron beam apparatus of claim 18 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a micro-channel plate (MCP) for magnifying the secondary electrons, scibtillator coated on the lower surface of a fiber optical plate (FPO), for converting the magnified secondary electron beams to an optical signal, and a TDI detector for detecting the optical signal to provide an electrical signal.

20. The electron beam apparatus of claim 18 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a TDI detector for detecting secondary electrons emitted from the sample surface to provide an electrical signal.

21. The electron beam apparatus of claim 18 , wherein the apparatus is of a multi-axis multi-beam type comprising:

a plurality of primary electro-optical systems for irradiating multiple primary electron beams on a surface of the sample;

a plurality of secondary electro-optical systems associated with the primary electro-optical systems, respectively, for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beams; and

a plurality of detectors associated with the secondary electro-optical systems, respectively, for detecting the secondary electrons and generating electric signals corresponding to the detected electrons.

22. The electron beam apparatus of claim 21 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise electron guns comprising an anode substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the anode substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

23. The electron beam apparatus of claim 22 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise objective lenses comprising a substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

24. The electron beam apparatus of claim 23 , wherein the primary electro-optical systems are adapted to rotate around an axis passing through the center of the sample, so that when the sample has a plurality of dies aligned on the sample surface, the same positions of the dies can be irradiated by the primary electron beams from the electron guns, respectively.

25. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of secondary electrons emitted from the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy Equations (1) and (2) through recursive processing, on the basis of the coordinate error (Δx, Δy) after the orthogonal error has been corrected; and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients a 1 ˜e 1 and a 2 ˜e 2 .

26. The electron beam apparatus of claim 25 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a micro-channel plate (MCP) for magnifying the secondary electrons, scibtillator coated on the lower surface of a fiber optical plate (FPO), for converting the magnified secondary electron beams to an optical signal, and a TDI detector for detecting the optical signal to provide an electrical signal.

27. The electron beam apparatus of claim 25 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a TDI detector for detecting secondary electrons emitted from the sample surface to provide an electrical signal.

28. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of a primary electron beam to be irradiated to the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample;

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy Equations (1) and (2) through recursive processing, on the basis of the coordinate error (Δx, Δy) after the orthogonal error has been corrected; and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients a 1 ˜e 1 and a 2 ˜e 2 .

29. The electron beam apparatus of claim 28 , wherein the apparatus is of a multi-axis multi-beam type comprising:

a plurality of primary electro-optical systems for irradiating multiple primary electron beams on the sample surface, each primary electro-optical system including the compensation means which comprises a deflector for deflecting the primary electron beam;

a plurality of secondary electro-optical systems associated with the primary electro-optical systems, respectively, for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beams; and

a plurality of detectors associated with the secondary electro-optical systems, respectively, for detecting the secondary electrons and generating electric signals corresponding to the detected electrons.

30. The electron beam apparatus of claim 29 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise electron guns comprising an anode substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the anode substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

31. The electron beam apparatus of claim 30 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise objective lenses comprising a substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

32. The electron beam apparatus of claim 31 , wherein the primary electro-optical systems are adapted to rotate around an axis passing through the center of the sample, so that when the sample has a plurality of dies aligned on the sample surface, the same positions of the dies can be irradiated by the primary electron beams from the electron guns, respectively.

33. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of secondary electrons emitted from the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients d 1 , e 1 , d 2 and e 2 which satisfy the following Equations (3) and (4), through recursive processing,

Δ x=d 1 x 2 +e 1 y 2   (3)

Δ y=d 2 x 2 +e 2 y 2   (4); and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , e 1 , d 2 and e 2 into Equations (3) and (4).

34. The electron beam apparatus of claim 33 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a micro-channel plate (MCP) for magnifying the secondary electrons, scibtillator coated on the lower surface of a fiber optical plate (FPO), for converting the magnified secondary electron beams to an optical signal, and a TDI detector for detecting the optical signal to provide an electrical signal.

35. The electron beam apparatus of claim 33 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a TDI detector for detecting secondary electrons emitted from the sample surface to provide an electrical signal.

36. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of a primary electron beam to be irradiated to the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients d 1 , e 1 , d 2 and e 2 which satisfy the following Equations (3) and (4), through recursive processing,

Δ x=d 1 x 2 +e 1 y 2   (3)

Δ y=d 2 x 2 +e 2 y 2   (4); and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , e 1 , d 2 and e 2 into Equations (3) and (4).

37. The electron beam apparatus of claim 36 , wherein the apparatus is of a multi-axis multi-beam type comprising:

a plurality of primary electro-optical systems for irradiating multiple primary electron beams on the sample surface, each primary electro-optical system including the compensation means which comprises a deflector for deflecting the primary electron beam;

a plurality of secondary electro-optical systems associated with the primary electro-optical systems, respectively, for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beams; and

a plurality of detectors associated with the secondary electro-optical systems, respectively, for detecting the secondary electrons and generating electric signals corresponding to the detected electrons.

38. The electron beam apparatus of claim 37 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise electron guns comprising an anode substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the anode substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

39. The electron beam apparatus of claim 38 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise objective lenses comprising a substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

40. The electron beam apparatus of claim 39 , wherein the primary electro-optical systems are adapted to rotate around an axis passing through the center of the sample, so that when the sample has a plurality of dies aligned on the sample surface, the same positions of the dies can be irradiated by the primary electron beams from the electron guns, respectively.

41. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of secondary electrons emitted from the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients d 1 , e 1 , d 2 and e 2 which satisfy the following Equations (3) and (4), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (3)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (4); and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , e 1 , d 2 and e 2 into Equations (3) and (4).

42. The electron beam apparatus of claim 41 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a micro-channel plate (MCP) for magnifying the secondary electrons, scibtillator coated on the lower surface of a fiber optical plate (FPO), for converting the magnified secondary electron beams to an optical signal, and a TDI detector for detecting the optical signal to provide an electrical signal.

43. The electron beam apparatus of claim 41 , wherein the apparatus is of an image projection type and comprises a primary electro-optical system for irradiating a primary electron beam on the sample surface and a secondary electro-optical system for inducing the secondary electrons emitted from the sample surface by irradiation of the primary electron beam, and wherein the secondary electro-optical system has an axis substantially perpendicular to the sample surface and comprises a TDI detector for detecting secondary electrons emitted from the sample surface to provide an electrical signal.

44. An electron beam apparatus for inspecting a surface of a sample using an electron beam, comprising:

a processor for calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample surface from a calculated ideal position XY coordinate of the reference point, an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy, and an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

means for compensating deflection of a primary electron beam to be irradiated to the sample surface on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y) comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients d 1 , e 1 , d 2 and e 2 which satisfy the following Equations (3) and (4), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (3)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (4); and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , e 1 , d 2 and e 2 into Equations (3) and (4).

45. The electron beam apparatus of claim 44 , wherein the apparatus is of a multi-axis multi-beam type comprising:

a plurality of primary electro-optical systems for irradiating multiple primary electron beams on the sample surface, each primary electro-optical system including the compensation means which comprises a deflector for deflecting the primary electron beam;

a plurality of secondary electro-optical systems associated with the primary electro-optical systems, respectively, for inducing secondary electrons emitted from the sample surface by irradiation of the primary electron beams; and

a plurality of detectors associated with the secondary electro-optical systems, respectively, for detecting the secondary electrons and generating electric signals corresponding to the detected electrons.

46. The electron beam apparatus of claim 45 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise electron guns comprising an anode substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the anode substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

47. The electron beam apparatus of claim 46 , wherein the respective primary electro-optical systems have axes parallel to each other and perpendicular to the sample surface, and comprise objective lenses comprising a substrate in common having multiple through-holes located correspondingly to the axes of the respective primary electro-optical systems, and wherein inner surfaces of the through-holes and vicinities of the through-holes on the substrate are coated with a metal, to apply voltages to the metal-coated through-holes independently.

48. The electron beam apparatus of claim 47 , wherein the primary electro-optical systems are adapted to rotate around an axis passing through the center of the sample, so that when the sample has a plurality of dies aligned on the sample surface, the same positions of the dies can be irradiated by the primary electron beams from the electron guns, respectively.

49. A method of compensating an error regarding a stage position in an electron beam apparatus for inspecting a pattern on a sample using an electron beam, comprising:

calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample from a calculated ideal position XY coordinate of the reference point, and an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy; and

compensating the measured XY coordinates (x, y) on the basis of the calculated orthogonal error upon inspecting the sample,

wherein the calculation of the orthogonal error of the XY coordinates comprises:

recursive processing for obtaining coefficients a 1 ˜c 1 and a 2 ˜c 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2); and

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 .

50. A method of compensating an error regarding a stage position in an electron beam apparatus for inspecting a pattern on a sample using an electron beam, comprising:

calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample from a calculated ideal position XY coordinate of the reference point;

calculating an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy;

calculating an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

compensating deflection by a beam deflector disposed in a secondary electro-optical system on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinates (x, y)comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (1)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy Equations (1) and (2) through recursive processing, on the basis of the coordinate error (Δx, Δy) after the orthogonal error has been corrected; and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients a 1 ˜e 1 and a 2 ˜e 2 .

51. A method of compensating an error regarding a stage position in an electron beam apparatus for inspecting a pattern on a sample using an electron beam, comprising:

calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample from a calculated ideal position XY coordinate of the reference point;

calculating an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy;

calculating an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

compensating deflection by a beam deflector disposed in a secondary electro-optical system on the basis of the calculated mirror distortion error upon inspecting the sample;

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y)comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients d 1 , e 1 , d 2 and e 2 which satisfy the following Equations (3) and (4), through recursive processing,

Δ x=d 1 x 2 +e 1 y 2   (3)

Δ y=d 2 x 2 +e 2 y 2   (4); and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , e 1 , d 2 and e 2 into Equations (3) and (4).

52. A method of compensating an error regarding a stage position in an electron beam apparatus for inspecting a pattern on a sample using an electron beam, comprising:

calculating coordinate errors Δx and Δy of a measured XY coordinate (x, y) of each of arbitrary reference points on the sample from a calculated ideal position XY coordinate of the reference point;

calculating an orthogonal error of the XY coordinates based on the calculated coordinate errors Δx and Δy;

calculating an error due to mirror distortion of an interferometer of the electron beam apparatus on the basis of the calculated coordinate errors Δx and Δy; and

compensating deflection by a beam deflector disposed in a secondary electro-optical system on the basis of the calculated mirror distortion error upon inspecting the sample,

wherein the calculation of the coordinate errors Δx and Δy and the orthogonal error of the measured XY coordinate (x, y)coordinates comprises:

recursive processing for obtaining coefficients a 1 ˜e 1 and a 2 ˜e 2 which satisfy the following Equations (1) and (2), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y   (1)

Δ y=a 2 +b 2 x+c 2 y   (2);

calculating the orthogonal error of the XY coordinates as a difference between the obtained coefficients c 1 and b 2 ;

recursive processing for obtaining coefficients d 1 , e 1 , d 2 and e 2 which satisfy the following Equations (3) and (4), through recursive processing,

Δ x=a 1 +b 1 x+c 1 y+d 1 x 2 +e 1 y 2   (3)

Δ y=a 2 +b 2 x+c 2 y+d 2 x 2 +e 2 y 2   (4); and

calculating the coordinate error (Δx, Δy) as the mirror distortion error, by substituting an XY coordinate (x, y) provided from the interferometer upon driving the electron beam apparatus, into equations which are derived by substituting the obtained coefficients d 1 , e l , d 2 and e 2 into Equations (3) and (4).