IP Library Granted Patent US 9,142,399
Granted Patent B2
US 9,142,399 · App. 13/758,226 · Granted Sep 22, 2015

Substrate cleaning method

Inventor: Tomoatsu Ishibashi (Tokyo, JP)
Assignee: EBARA CORPORATION
H01L21/02074H01L21/02063H01L21/6715H01L21/67046H01L21/67051H01L21/68728
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Quick Facts
Patent No.
US 9,142,399
App. No.
13/758,226
Granted
Sep 22, 2015
Kind
B2
Abstract

A substrate cleaning method can prevent corrosion of copper interconnects even when the cleaning method, which uses two-fluid jet cleaning, is used for cleaning of a surface of a substrate after polishing. The substrate cleaning method includes: carrying out primary cleaning of a surface of a substrate by scrub cleaning using a neutral or alkaline liquid chemical as a cleaning liquid; carrying out finish cleaning of the surface of the substrate by two-fluid jet cleaning which cleans the surface of the substrate in a non-contact manner by jetting carbonated water, comprising pure water or ultrapure water containing dissolved CO 2 gas, from a two-fluid nozzle toward the surface of the substrate; and subsequently carrying out final finish cleaning of the surface of the substrate by scrub cleaning using a neutral or alkaline liquid chemical as a cleaning liquid, and then drying the surface of the substrate.

Claims (7)

1. A substrate cleaning method comprising:

carrying out primary cleaning of a surface of a substrate by scrub cleaning using a neutral or alkaline liquid chemical as a cleaning liquid, wherein the surface of the substrate has been polished by chemical mechanical polishing after forming copper interconnects in the surface of the substrate, and wherein a surface of the copper interconnects is exposed on the surface of the substrate after polishing;

carrying out finish cleaning of the surface of the substrate by two-fluid jet cleaning, which cleans the surface of the substrate in a non-contact manner, by jetting carbonated water, comprising pure water or ultrapure water containing dissolved CO 2 gas, from a two-fluid nozzle toward the surface of the substrate; and

subsequently carrying out final finish cleaning of the surface of the substrate by scrub cleaning using a neutral or alkaline liquid chemical as a cleaning liquid, and then drying the surface of the substrate.

2. The substrate cleaning method according to claim 1 , wherein the primary cleaning is roll scrub cleaning performed by rubbing a roll cleaning member against the surface of the substrate, and the final finish cleaning is pencil scrub cleaning performed by rubbing a pencil-type cleaning member against the surface of the substrate.

3. The substrate cleaning method according to claim 1 , wherein the surface of the substrate is hydrophobic.

4. The substrate cleaning method according to claim 1 , wherein an insulating film in the surface of the substrate has a low dielectric constant.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2013
From: ISHIBASHI, TOMOATSU
To: EBARA CORPORATION
Reel/Frame 029748/0651 →
Priority Claims (1)
JP 2012-37395 · Feb 23, 2012 · national
Continuity (1)
Related Publication 20130220368A1 · Aug 29, 2013