IP Library Granted Patent US 9,312,850
Granted Patent B2
US 9,312,850 · App. 14/463,668 · Granted Apr 12, 2016

Testable power-on-reset circuit

Inventors: Sanjay Kumar Wadhwa (Noida, IN); Avinash Chandra Tripathi (Noida, IN)
Assignee: FREESCALE SEMICONDUCTOR, INC.
H03K17/223H03K19/018521H03K3/0375H03K17/22
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Quick Facts
Patent No.
US 9,312,850
App. No.
14/463,668
Granted
Apr 12, 2016
Kind
B2
Abstract

An integrated circuit with a testable power-on-reset (POR) circuit includes a voltage divider, an inverter, a level-shifter, a buffer and a flip-flop. The voltage divider receives a first supply voltage and generates a second supply voltage. The POR circuit receives the second supply voltage and generates a POR voltage signal when the second supply voltage exceeds a POR de-assertion threshold. The level-shifter receives the POR voltage signal and an inverted POR voltage signal from the inverter circuit and generates a level-shifted POR voltage signal at a voltage level of the first supply voltage. The buffer receives the level-shifted POR voltage signal and outputs a delayed level-shifted POR voltage signal. The flip-flop receives the first supply voltage as data input, the delayed level-shifted POR voltage signal as clock input, the level-shifted POR voltage signal as reset input, and outputs a voltage-monitor signal at the voltage level of the first supply voltage.

Claims (69)

1. An integrated circuit, comprising:

a voltage divider for receiving a first supply voltage and outputting a second supply voltage;

a power-on-reset (POR) circuit connected to the voltage divider for receiving the second supply voltage and generating a POR voltage signal when the second supply voltage exceeds a POR de-assertion threshold;

an inverter connected to the POR circuit for receiving the POR voltage signal and generating an inverted POR voltage signal;

a level-shifter connected to the POR circuit and the inverter for receiving the POR voltage signal and the inverted POR voltage signal, respectively, and generating a level-shifted POR voltage signal;

a buffer connected to the level-shifter for receiving the level-shifted POR voltage signal and providing a delayed level-shifted POR voltage signal; and

a flip-flop having a data input terminal for receiving the first supply voltage, a clock input terminal connected to the buffer for receiving the delayed level-shifted POR voltage signal, a reset input terminal connected to the level-shifter for receiving the level-shifted POR voltage signal, and an output terminal for outputting a voltage-monitor signal.

2. The integrated circuit of claim 1 , further comprising a processor connected to the output terminal of the flip-flop for receiving the voltage-monitor signal and determining a voltage level of the first supply voltage when the second supply voltage equals the POR de-assertion threshold, and wherein the processor further determines the POR de-assertion threshold based on the voltage level of the first supply voltage.

3. The integrated circuit of claim 2 , wherein the level-shifted POR voltage signal is generated at the voltage level of the first supply voltage.

4. The integrated circuit of claim 1 , wherein the voltage divider includes a resistor-ladder circuit having a voltage tap, wherein the second supply voltage is output at the voltage tap.

5. The integrated circuit of claim 4 , wherein the inverter comprises:

a first transistor having a source terminal connected to the voltage tap of the resistor-ladder circuit for receiving the second supply voltage and a gate terminal connected to the POR circuit for receiving the POR voltage signal; and

a second transistor having a source terminal connected to ground, a gate terminal connected to the POR circuit for receiving the POR voltage signal, and a drain terminal connected to a drain terminal of the first transistor for outputting the inverted POR voltage signal.

6. The integrated circuit of claim 1 , wherein the level-shifter comprises:

a first transistor having a source terminal connected to ground and a gate terminal connected to the POR circuit for receiving the POR voltage signal;

a second transistor having a source terminal connected to ground and a gate terminal connected to the inverter for receiving the inverted POR voltage signal;

a third transistor having a source terminal connected to the first supply voltage, a gate terminal connected to a drain terminal of the second transistor, and a drain terminal connected to a drain terminal of the first transistor; and

a fourth transistor having a source terminal connected to the first supply voltage, a gate terminal connected to the drain terminal of the third transistor, and a drain terminal connected to the drain terminal of the second transistor for outputting the level-shifted POR voltage signal.

7. The integrated circuit of claim 1 , wherein the buffer comprises:

a first inverter connected to the level-shifter for receiving the level-shifted POR voltage signal and generating an inverted level-shifted POR voltage signal; and

a second inverter connected to the first inverter for receiving the inverted level-shifted POR voltage signal and generating the delayed level-shifted POR voltage signal.

8. The integrated circuit of claim 7 , wherein the first inverter comprises:

a first transistor having a source terminal connected to the first supply voltage and a gate terminal connected to the level-shifter for receiving the level-shifted POR voltage signal; and

a second transistor having a source terminal connected to ground, a gate terminal connected to the level-shifter for receiving the level-shifted POR voltage signal and a drain terminal connected to a drain terminal of the first transistor for outputting the inverted level-shifted POR voltage signal.

9. The integrated circuit of claim 8 , wherein the second inverter comprises:

a third transistor having a source terminal connected to the first supply voltage and a gate terminal connected to the drain terminal of the first transistor for receiving the inverted level-shifted POR voltage signal; and

a fourth transistor having a source terminal connected to ground, a gate terminal connected to the drain terminal of the first transistor for receiving the inverted level-shifted POR voltage signal, and a drain terminal connected to a drain terminal of the third transistor for outputting the delayed level-shifted POR voltage signal.

10. An integrated circuit, comprising:

a voltage divider for receiving a first supply voltage and outputting a second supply voltage;

a power-on-reset (POR) circuit connected to the voltage divider for receiving the second supply voltage and generating a POR voltage signal when the second supply voltage exceeds a POR de-assertion threshold;

a first transistor having a source terminal connected to the voltage divider for receiving the second supply voltage and a gate terminal connected to the POR circuit for receiving the POR voltage signal;

a second transistor having a source terminal connected to ground, a gate terminal connected to the POR circuit for receiving the POR voltage signal, and a drain terminal connected to a drain terminal of the first transistor for generating an inverted POR voltage signal;

a third transistor having a source terminal connected to ground and a gate terminal connected to the POR circuit for receiving the POR voltage signal;

a fourth transistor having a source terminal connected to ground and a gate terminal connected to the drain terminal of the second transistor for receiving the inverted POR voltage signal;

a fifth transistor having a source terminal connected to the first supply voltage, a gate terminal connected to a drain terminal of the fourth transistor, and a drain terminal connected to a drain terminal of the third transistor;

a sixth transistor having a source terminal connected to the first supply voltage, a gate terminal connected to the drain terminal of the third transistor, and a drain terminal connected to the drain terminal of the fourth transistor for generating a level-shifted POR voltage signal;

a buffer connected to the drain terminal of the sixth transistor for receiving the level-shifted POR voltage signal and providing a delayed level-shifted POR voltage signal; and

a flip-flop having a data input terminal connected to the first supply voltage, a clock input terminal connected to the buffer for receiving the delayed level-shifted POR voltage signal, a reset input terminal connected to the drain terminal of the sixth transistor for receiving the level-shifted POR voltage signal, and an output terminal for outputting a voltage-monitor signal.

11. The integrated circuit of claim 10 , further comprising a processor connected to the output terminal of the flip-flop for receiving the voltage-monitor signal and determining a voltage level of the first supply voltage when the second supply voltage equals the POR de-assertion threshold, and wherein the processor further determines the POR de-assertion threshold based on the voltage level of the first supply voltage.

12. The integrated circuit of claim 11 , wherein the level-shifted POR voltage signal is generated at the voltage level of the first supply voltage.

13. The integrated circuit of claim 10 , wherein the voltage divider includes a resistor-ladder circuit having a voltage tap, wherein the second supply voltage is outputted at the voltage tap.

14. The integrated circuit of claim 10 , wherein the buffer comprises:

a first inverter connected to the drain terminal of the sixth transistor for receiving the level-shifted POR voltage signal and generating an inverted level-shifted POR voltage signal; and

a second inverter connected to the first inverter for receiving the inverted level-shifted POR voltage signal and generating the delayed level-shifted POR voltage signal.

15. The integrated circuit of claim 14 , wherein the first inverter comprises:

a seventh transistor having a source terminal connected to the first supply voltage and a gate terminal connected to the drain terminal of the sixth transistor for receiving the level-shifted POR voltage signal; and

an eighth transistor having a source terminal connected to ground, a gate terminal connected to the drain terminal of the sixth transistor for receiving the level-shifted POR voltage signal, and a drain terminal connected to a drain terminal of the seventh transistor for outputting the inverted level-shifted POR voltage signal.

16. The integrated circuit of claim 15 , wherein the second inverter comprises:

a ninth transistor having a source terminal connected to the first supply voltage and a gate terminal connected to the drain terminal of the seventh transistor for receiving the inverted level-shifted POR voltage signal; and

a tenth transistor having a source terminal connected to ground, a gate terminal connected to the drain terminal of the seventh transistor for receiving the inverted level-shifted POR voltage signal, and a drain terminal connected to a drain terminal of the ninth transistor for outputting the delayed level-shifted POR voltage signal.

17. The integrated circuit of claim 16 , wherein the first, fifth, sixth, seventh and ninth transistors are p-channel metal oxide semiconductor (PMOS) transistors, and wherein the second, third, fourth, eighth and tenth transistors are n-channel metal oxide semiconductor (NMOS) transistors.

18. An integrated circuit, comprising:

a voltage divider for receiving a first supply voltage and outputting a second supply voltage;

a power-on-reset (POR) circuit connected to the voltage divider for receiving the second supply voltage and generating a POR voltage signal when the second supply voltage exceeds a POR de-assertion threshold;

an inverter connected to the POR circuit for receiving the POR voltage signal and generating an inverted POR voltage signal;

a level-shifter connected to the POR circuit and the inverter for receiving the POR voltage signal and the inverted POR voltage signal, respectively, and generating a level-shifted POR voltage signal;

a buffer connected to the level-shifter for receiving the level-shifted POR voltage signal and providing a delayed level-shifted POR voltage signal;

a flip-flop having a data input terminal for receiving the first supply voltage, a clock input terminal connected to the buffer for receiving the delayed level-shifted POR voltage signal, a reset input terminal connected to the level-shifter for receiving the level-shifted POR voltage signal, and an output terminal for outputting a voltage-monitor signal; and

a processor, connected to the output terminal of the flip-flop for receiving the voltage-monitor signal, determining a voltage level of the first supply voltage when the second supply voltage equals the POR de-assertion threshold, and determining the POR de-assertion threshold based on the voltage level of the first supply voltage.

19. The integrated circuit of claim 18 , wherein the level-shifter comprises:

a first transistor having a source terminal connected to ground and a gate terminal connected to the POR circuit for receiving the POR voltage signal;

a second transistor having a source terminal connected to ground and a gate terminal connected to the inverter for receiving the inverted POR voltage signal;

a third transistor having a source terminal connected to the first supply voltage, a gate terminal connected to a drain terminal of the second transistor, and a drain terminal connected to a drain terminal of the first transistor; and

a fourth transistor having a source terminal connected to the first supply voltage, a gate terminal connected to the drain terminal of the third transistor, and a drain terminal connected to the drain terminal of the second transistor for outputting the level-shifted POR voltage signal.

20. The integrated circuit of claim 18 , wherein the buffer comprises:

a first transistor having a source terminal connected to the first supply voltage and a gate terminal connected to the level-shifter for receiving the level-shifted POR voltage signal;

a second transistor having a source terminal connected to ground, a gate terminal connected to the level-shifter for receiving the level-shifted POR voltage signal and a drain terminal connected to a drain terminal of the first transistor for outputting the inverted level-shifted POR voltage signal;

a third transistor having a source terminal connected to the first supply voltage and a gate terminal connected to the drain terminal of the first transistor for receiving the inverted level-shifted POR voltage signal; and

a fourth transistor having a source terminal connected to ground, a gate terminal connected to the drain terminal of the first transistor for receiving the inverted level-shifted POR voltage signal, and a drain terminal connected to a drain terminal of the third transistor for outputting the delayed level-shifted POR voltage signal.

Assignments (14)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0502 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0460 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0921 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034160/0370 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034160/0351 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034153/0027 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 20, 2014
From: WADHWA, SANJAY KUMAR; TRIPATHI, AVINASH CHANDRA
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 033568/0269 →
Continuity (1)
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