IP Library › Granted Patent US 9,349,584
Granted Patent B2
US 9,349,584 · App. 14/396,116 · Granted May 24, 2016

Method for depositing a film and film deposition apparatus

Inventors: Kippei Sugita (Yamanashi, JP); Hiroyuki Hashimoto (Yamanashi, JP); Muneo Harada (Iwate, JP)
Assignee: TOKYO ELECTRON LIMITED
H01L21/02118C23C16/4408C23C16/52H01L21/022H01L21/02271H01L21/02337H01L21/02359H01L21/76831H01L21/76898B05D1/36B05D1/60B05D2490/50C23C16/455
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,349,584
App. No.
14/396,116
Granted
May 24, 2016
Kind
B2
Abstract

A method for depositing a film is provided. In the method, an object to be processed is accommodated in a process chamber, and an insulating film made of a polymer thin film is deposited on a surface of the object to be processed by supplying a first source gas composed of an acid anhydride and a second source gas composed of a diamine into the process chamber that is evacuated. Next, the insulating film is modified so as to have a barrier function by stopping the supply of the second source gas into the process chamber and continuously supplying the first source gas into the process chamber.

Claims (11)

1. A method for depositing a film, comprising steps of:

accommodating an object to be processed in a process chamber;

depositing an insulating film made of a polymer thin film on a surface of the object to be processed by supplying a first source gas composed of an acid anhydride and a second source gas composed of a diamine into the process chamber that is evacuated; and

modifying the insulating film so as to cause the insulating film to have a barrier function by stopping the supply of the second source gas into the process chamber and continuously supplying the first source gas into the process chamber.

2. The method as claimed in claim 1 , wherein a process temperature in the process chamber is in a range of 20 to 450 degrees C.

3. The method as claimed in claim 1 , wherein a process pressure in the process chamber is in a range of 0.1 to 1.0 Torr.

4. The method as claimed in claim 3 ,

wherein the acid anhydride includes at least one material selected from a group consisting of pyromellitic anhydride, oxydiphthalic anhydride, biphthalicanhydride, carbonyldiphthalic anhydride, diphthalic anhydride, sulfonyldiphthalic anhydride, cyclohexanetetracarboxylic dianhydride, cyclopentanetetracarboxylic dianhydride, and cyclobutanetetracarboxylic dianhydride, and

the diamine includes at least one material selected from a group consisting of oxydianiline, decanediamine, ethylenediamine, diaminoundecan, trimethylenediamine, diaminododecane, diaminobutane, hexafluoropropane, diaminopentane, thiodianiline, aminophenyl sulfide, diaminohexane, diaminophenylphenyl sulfone, heptanediamine, diaminobenzophenone, diaminooctane, diaminononane, diaminodicyclohexylmethane, and methylcyclohexanamine.

5. The method as claimed in claim 1 , further comprising a step of:

forming a barrier film on a surface of the modified insulating film.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2014
From: SUGITA, KIPPEI; HASHIMOTO, HIROYUKI; HARADA, MUNEO
To: TOKYO ELECTRON LIMITED
Reel/Frame 034005/0226 →
Priority Claims (3)
JP 2012-102609 · Apr 27, 2012 · national
JP 2013-020057 · Feb 5, 2013 · national
JP 2013-027972 · Feb 15, 2013 · national
Continuity (1)
Related Publication 20150087158A1 · Mar 26, 2015