IP Library Granted Patent US 9,354,734
Granted Patent B2
US 9,354,734 · App. 14/196,958 · Granted May 31, 2016

Common-mode hover detection

Inventor: Bernard J. Hermes (Southampton, GB)
Assignee: Atmel Corporation
G06F3/041G06F2203/04108
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,354,734
App. No.
14/196,958
Granted
May 31, 2016
Kind
B2
Abstract

In one embodiment, a method includes substantially simultaneously applying a pre-determined voltage to a conductive layer and to one or more electrodes of a touch sensor. The conductive layer is spatially separated from the electrodes by at least a thickness of a substrate. The method also includes determining a difference between a measurement current of one or more of the electrodes and a reference value; and determining whether a proximity or touch input to the touch sensor has occurred based at least in part on the difference.

Claims (29)

1. A method comprising:

substantially simultaneously applying a pre-determined voltage to a conductive layer and to one or more electrodes of a touch sensor, the conductive layer disposed around at least two sides of a printed-circuit board (PCB), the one or more electrodes situated in a first plane, the conductive layer and the PCB situated in a second plane different than the first plane;

determining a difference between a measurement current of one or more of the electrodes and a reference value; and

determining whether a proximity or touch input to the touch sensor has occurred based at least in part on the difference.

2. The method of claim 1 , wherein the determination of the difference comprises integrating the measurement current of one or more of the electrodes.

3. The method of claim 1 , wherein the pre-determined voltage comprises a voltage having a square-wave waveform.

4. The method of claim 1 , further comprising amplifying the measurement current.

5. The method of claim 1 , wherein the application of the pre-determined voltage comprises applying the pre-determined voltage to an input of an integrator circuit.

6. The method of claim 1 , wherein the conductive layer is annular shaped and surrounds the PCB.

7. The method of claim 6 , wherein a device housing the PCB is held by a user.

8. A computer-readable non-transitory storage medium embodying instructions configured, when executed, to:

substantially simultaneously apply a pre-determined voltage to a conductive layer and to one or more electrodes of a touch sensor, the conductive layer disposed around at least two sides of a printed-circuit board (PCB), the one or more electrodes situated in a first plane, the conductive layer and the PCB situated in a second plane different than the first plane;

determine a difference between a measurement current of one or more of the electrodes and a reference value; and

determine whether a proximity or touch input to the touch sensor has occurred based at least in part on the difference.

9. The medium of claim 8 , wherein the instructions are further configured to integrate the measurement current of one or more of the electrodes.

10. The medium of claim 8 , wherein the pre-determined voltage comprises a voltage having a square-wave waveform.

11. The medium of claim 8 , wherein the instructions are further configured to amplify the measurement current.

12. The medium of claim 8 , wherein the instructions are further configured to apply the pre-determined voltage to an input of an integrator circuit.

13. The medium of claim 8 , wherein the conductive layer is annular shaped and surrounds the PCB.

14. The medium of claim 13 , wherein a device housing the PCB is held by a user.

15. A device comprising:

a measurement circuit;

a touch sensor; and

a computer-readable non-transitory storage medium coupled to the measurement circuit and embodying instructions configured, when executed, to:

substantially simultaneously apply a pre-determined voltage to a conductive layer and to one or more electrodes of the touch sensor, the conductive layer disposed around at least two sides of a printed-circuit board (PCB), the one or more electrodes situated in a first plane, the conductive layer and the PCB situated in a second plane different than the first plane;

determine a difference between a measurement current of one or more of the electrodes and a reference value; and

determine whether a proximity or touch input to the touch sensor has occurred based at least in part on the difference.

16. The device of claim 15 , wherein the pre-determined voltage comprises a voltage having a square-wave waveform.

17. The device of claim 15 , wherein the instructions are further configured to apply the pre-determined voltage to an input of an integrator circuit.

Assignments (13)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2019
From: MICROCHIP TECHNOLOGY INC.; ATMEL CORPORATION; MICROCHIP TECHNOLOGY GERMANY GMBH
To: NEODRÓN LIMITED
Reel/Frame 048259/0840 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0884 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0937 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038375/0490 →
PATENT SECURITY AGREEMENT Recorded May 15, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 032908/0485 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2014
From: ATMEL TECHNOLOGIES U.K. LIMITED
To: ATMEL CORPORATION
Reel/Frame 032779/0445 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2014
From: HERMES, BERNARD J.
To: ATMEL TECHNOLOGIES U.K. LIMITED
Reel/Frame 032349/0173 →
Continuity (1)
Related Publication 20150253881A1 · Sep 10, 2015