IP Library Granted Patent US 9,486,989
Granted Patent B2
US 9,486,989 · App. 14/274,895 · Granted Nov 8, 2016

Bonding method, bonding apparatus, and bonding system

Inventor: Satoshi Ookawa (Kumamoto, JP)
Assignee: TOKYO ELECTRON LIMITED
B32B37/10H01L21/6719H01L21/67092H01L21/67126H01L21/67748H01L21/681H01L21/6831B32B38/18B32B2309/68B32B2315/08B32B2457/14G02F1/1303Y10T156/10
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Quick Facts
Patent No.
US 9,486,989
App. No.
14/274,895
Granted
Nov 8, 2016
Kind
B2
Abstract

A bonding method includes: holding a substrate to be processed by a first holding unit; holding a glass substrate by a second holding unit in a first holding state of seating the glass substrate thereon or in a second holding state of electrostatically attracting the glass substrate; depressurizing the interior of a chamber; and bringing the substrate to be processed and the glass substrate into contact with each other and pressing them. Holding a glass substrate includes: switching from the first holding state to the second holding state during at least one predetermined period of time selected from a plurality of predetermined periods of time, the plurality of predetermined periods of time including a pressure change timing in depressurizing the interior of a chamber and a pressing timing in bonding the substrate to be processed and the glass substrate.

Claims (29)

1. A bonding method, comprising:

holding a substrate to be processed by a first holding unit;

holding a glass substrate by a second holding unit in a first holding state of seating the glass substrate on the second holding unit or in a second holding state of electrostatically attracting the glass substrate toward the second holding unit;

depressurizing the interior of a chamber for accommodating the substrate to be processed held by the first holding unit and the glass substrate held by the second holding unit; and

bringing the substrate to be processed and the glass substrate into contact with each other and pressing the substrate to be processed and the glass substrate to bond the substrate to be processed and the glass substrate,

wherein depressurizing the interior of a chamber includes:

a first depressurizing process of depressurizing the interior of the chamber to a first pressure using a first intake device, and, after the first depressurizing;

a second depressurizing process of depressurizing the interior of the chamber to a second pressure lower than the first pressure using a second intake device, and

wherein holding a glass substrate includes:

switching from the first holding state to the second holding state during at least one predetermined period of time selected from a plurality of predetermined periods of time, the plurality of predetermined periods of time including both a pressure change timing at which the pressure within the chamber is changed in the first depressurizing process and a pressure change timing at which the pressure within the chamber is changed in the second depressurizing process, and a pressing timing at which the substrate to be processed and the glass substrate are pressed in bonding the substrate to be processed and the glass substrate.

2. The bonding method of claim 1 , wherein holding a glass substrate includes:

starting the second holding state before the pressure change timings and the pressing timing.

3. The bonding method of claim 1 , wherein depressurizing the interior of a chamber includes:

starting the depressurization of the interior of the chamber before the pressing timing and stopping the depressurization of the interior of the chamber at the pressing timing.

4. The bonding method of claim 1 , further comprising:

heating the substrate to be processed and the glass substrate.

5. A bonding method, comprising:

holding a substrate to be processed by a first holding unit;

holding a glass substrate by a second holding unit in a first holding state of seating the glass substrate on the second holding unit or in a second holding state of electrostatically attracting the glass substrate toward the second holding unit;

depressurizing the interior of a chamber for accommodating the substrate to be processed held by the first holding unit and the glass substrate held by the second holding unit; and

bringing the substrate to be processed and the glass substrate into contact with each other and pressing the substrate to be processed and the glass substrate to bond the substrate to be processed and the glass substrate,

wherein holding a glass substrate includes:

switching from the first holding state to the second holding state during at least one predetermined period of time selected from a plurality of predetermined periods of time, the plurality of predetermined periods of time including a pressure change timing at which a pressure within the chamber is changed in depressurizing the interior of a chamber, a pressing timing at which the substrate to be processed and the glass substrate are pressed in bonding the substrate to be processed and the glass substrate and a contact timing at which the substrate to be processed and the glass substrate are brought into contact with each other in bonding the substrate to be processed and the glass substrate.

6. The bonding method of claim 5 , wherein holding a glass substrate includes:

starting the second holding state before the pressure change timing, the pressing timing and the contact timing.

7. The bonding method of claim 5 , wherein depressurizing the interior of a chamber includes:

starting the depressurization of the interior of the chamber before the pressing timing and stopping the depressurization of the interior of the chamber at the pressing timing.

8. The bonding method of claim 5 , further comprising:

heating the substrate to be processed and the glass substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: OOKAWA, SATOSHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 032896/0544 →
Priority Claims (1)
JP 2013-103861 · May 16, 2013 · national
Continuity (1)
Related Publication 20140338813A1 · Nov 20, 2014