IP Library Granted Patent US 9,595,488
Granted Patent B2
US 9,595,488 · App. 15/010,988 · Granted Mar 14, 2017

Semiconductor device

Inventor: Yoshihiro Tanaka (Fukui, JP)
Assignee: J-Devices Corporation
H01L23/49513H01L23/49582H01L23/49861H01L24/29H01L24/83H01L25/50H01L24/32H01L24/48H01L2224/26175H01L2224/291H01L2224/29011H01L2224/29014H01L2224/29015H01L2224/2919H01L2224/29078H01L2224/32245H01L2224/48091H01L2224/48105H01L2224/48227H01L2224/48247H01L2224/73265H01L2224/83048H01L2224/83192H01L2224/83385H01L2224/83439H01L2224/83815H01L2224/92247H01L2924/00015H01L2924/181
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Quick Facts
Patent No.
US 9,595,488
App. No.
15/010,988
Granted
Mar 14, 2017
Kind
B2
Abstract

A semiconductor device according to one embodiment of the present invention includes a semiconductor element, an island having a surface on which the semiconductor element is fixed using a first metal, and a first pattern formed by a second metal, the first pattern being arranged on one part of the surface, wherein the second metal has a greater wetting characteristic than the surface when the first metal is melted.

Claims (15)

1. A semiconductor device comprising:

a semiconductor element;

an island having a surface on which the semiconductor element is fixed using a first metal; and

a first pattern formed by a second metal, the first pattern being arranged on one part of the surface,

wherein the second metal has a greater wetting characteristic than the surface when the first metal is melted.

2. The semiconductor device according to claim 1 , wherein the first metal is a solder, and the second metal is a silver.

3. The semiconductor device according to claim 1 , wherein the first pattern is formed by plating the second metal.

4. The semiconductor device according to claim 1 , wherein the first pattern has a radial shape in which a plurality of rectangular patterns or linear patterns is intersected while differing directions.

5. The semiconductor device according to claim 4 , wherein the first pattern is a pattern in which a position where the plurality of rectangular patterns or linear patterns intersects is offset from a center of the island.

6. The semiconductor device according to claim 4 , wherein the first pattern has the plurality of rectangular patterns or the linear patterns intersected at a plurality of positions while differing directions.

7. The semiconductor device according to claim 1 , wherein the first pattern includes a plurality of patterns of different shapes.

8. The semiconductor device according to claim 7 , wherein the first pattern includes an L-shaped pattern and a square or rectangular pattern.

9. The semiconductor device according to claim 1 , wherein the first pattern includes a plurality of circular patterns.

10. The semiconductor device according to claim 9 , wherein the first pattern is a pattern in which a length of a liner segment joining a center of a certain circular pattern and that of another circular pattern which is arranged adjacent to the certain circular pattern and a length of another liner segment joining the center of the certain circular pattern and that of still another circular pattern which is arranged adjacent to the certain circular pattern are the same, and so that extension lines of the two liner segments are intersect other than the 90 degrees.

11. The semiconductor device according to claim 1 , further comprising a second pattern made from the second metal that surrounds the first pattern.

Assignments (2)
CHANGE OF NAME Recorded Jul 17, 2020
From: J-DEVICES CORPORATION
To: AMKOR TECHNOLOGY JAPAN, INC.
Reel/Frame 053242/0422 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2016
From: TANAKA, YOSHIHIRO
To: J-DEVICES CORPORATION
Reel/Frame 037624/0054 →
Priority Claims (1)
JP 2015-016500 · Jan 30, 2015 · national
Continuity (1)
Related Publication 20160225701A1 · Aug 4, 2016