IP Library Granted Patent US 9,620,449
Granted Patent B2
US 9,620,449 · App. 14/878,216 · Granted Apr 11, 2017

Semiconductor device having a fuse element

Inventor: Takehiro Ueda (Kanagawa, JP)
Assignee: RENESAS ELECTRONICS CORPORATION
H01L23/5256H01L23/345H01L23/525H01L23/528H01L23/53228H01L2924/0002
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Quick Facts
Patent No.
US 9,620,449
App. No.
14/878,216
Granted
Apr 11, 2017
Kind
B2
Abstract

A portion-to-be-melted of a fuse is surrounded by plates, so that heat to be generated in a meltdown portion of the fuse under current supply can be confined or accumulated in the vicinity of the meltdown portion of the fuse. This makes it possible to facilitate meltdown of the fuse. The meltdown portion of the fuse in a folded form, rather than in a single here a fuse composed of a straight-line form, is more successful in readily concentrating the heat generated in the fuse under current supply into the meltdown portion, and in further facilitating the meltdown of the fuse.

Claims (41)

1. A semiconductor device, comprising:

a substrate;

an insulating layer formed over the substrate;

a first conductive plate formed in the insulating layer and formed at a first wiring layer;

a fuse element formed in the insulating layer and formed at a second wiring layer, the second wiring layer being one level above the first wiring layer; and

a second conductive plate formed in the insulating layer and formed at a third wiring layer, the third wiring layer being one level above the second wiring layer;

wherein the fuse element includes copper,

wherein the fuse element is brought into a blow state by a current supplied thereto,

wherein the fuse element has a first portion including a meltdown portion and a second portion that is wider than the first portion,

wherein the first portion is bent a plurality of times,

wherein the first conductive plate is formed below the fuse element in a planar view, and

wherein the second conductive plate is formed above the fuse element in the planar view.

2. A semiconductor device according to claim 1 ,

wherein the fuse element is electrically isolated from the first conductive plate.

3. A semiconductor device according to claim 1 ,

wherein the fuse element is electrically isolated from the second conductive plate.

4. A semiconductor device according to claim 1 ,

wherein the current to the fuse element is supplied from the second portion to the first portion.

5. A semiconductor device according to claim 1 ,

wherein the second portion is comprised of at least one of i) a current entrance terminal located at one end of the first portion and ii) a current exit terminal located at another end of the first portion, and

wherein the first portion that is bent a plurality of times is comprised of a plurality of serially connected bent units, each said bent unit being comprised of forward straight portion, a backward straight portion, and a normal connection portion which connects the forward straight portion and the backward straight portion, the backward straight portion running in a direction opposite to a direction of the forward straight portion.

6. A semiconductor device according to claim 5 ,

wherein the fuse element is electrically isolated from the first conductive plate.

7. A semiconductor device according to claim 5 ,

wherein the fuse element is electrically isolated from the second conductive plate.

8. A semiconductor device according to claim 5 ,

wherein the current to the fuse element is supplied from the second portion to the first portion.

9. A semiconductor device according to claim 5 ,

wherein the second portion is comprised of both of i) a current entrance terminal located at one end of the first portion and ii) a current exit terminal located at another end of the first portion, and

wherein the current with the fuse element runs from the current entrance terminal through the second portion to the current exit terminal.

10. A semiconductor device according to claim 9 ,

wherein the fuse element is electrically isolated from the second conductive plate.

11. A semiconductor device according to claim 1 ,

wherein the first portion that is bent a plurality of times is comprised of a plurality of serially connected bent units, each said bent unit being comprised of forward straight portion, a backward straight portion, and a normal connection portion which connects the forward straight portion and the backward straight portion, the backward straight portion running in a direction opposite to a direction of the forward straight portion.

12. A semiconductor device according to claim 11 ,

wherein the fuse element is electrically isolated from the first conductive plate.

13. A semiconductor device according to claim 11 ,

wherein the current to the fuse element is supplied from the second portion to the first portion.

14. A semiconductor device according to claim 11 ,

wherein the second portion is comprised of both of i) a current entrance terminal located at one end of the first portion and ii) a current exit terminal located at another end of the first portion, and

wherein the current with the fuse element runs from the current entrance terminal through the second portion to the current exit terminal.

Assignments (3)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2015
From: UEDA, TAKEHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 036756/0890 →
CHANGE OF NAME Recorded Oct 8, 2015
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 036757/0211 →
Priority Claims (1)
JP 2003-288829 · Aug 7, 2003 · national
Continuity (6)
Continuation 14086268 · Nov 21, 2013
Division 13721962 · Dec 20, 2012
Division 13180050 · Jul 11, 2011
Division 11798982 · May 18, 2007
Division 10900205 · Jul 28, 2004
Related Publication 20160035673A1 · Feb 4, 2016