Method of lower profile MEMS package with stress isolations
MEMS packages, modules, and methods of fabrication are described. In an embodiment, a MEMS package includes a MEMS die and an IC die mounted on a front side of a surface mount substrate, and a molding compound encapsulating the IC die and the MEMS die on the front side of the surface mount substrate. In an embodiment, a landing pad arrangement on a back side of the surface mount substrate forms and anchor plane area for bonding the surface mount substrate to a module substrate that is not directly beneath the MEMS die.
1. A package comprising:
a surface mount substrate;
an integrated circuit (IC) die mounted on a front side of the surface mount substrate;
a micro-electrical-mechanical systems (MEMS) die mounted on the front side of the surface mount substrate laterally adjacent to the IC die;
a molding compound that encapsulates the IC die and the MEMS die on the front side of the surface mount substrate; and
a landing pad arrangement including all landing pads on a back side of the surface mount substrate, wherein the landing pad arrangement surrounds a periphery of the IC die on the front side of the surface mount substrate and does not surround a periphery of the MEMS die on the front side of the surface mount substrate.
2. The package of claim 1 , further comprising a trench in a top surface of the molding compound between the IC die and the MEMS die.
3. The package of claim 2 , wherein a width of the trench is greater than a width of the MEMS die in a same direction.
4. The package of claim 3 , wherein the trench is formed entirely across a width of the molding compound.
5. The package of claim 2 , wherein a bottom surface of the trench is below a top surface of the MEMS die.
6. The package of claim 1 , further comprising a plurality of conductive pumps, with each landing pad having a corresponding conductive bump.
7. The package of claim 1 , wherein the molding compound that encapsulates the IC die and the MEMS die does not cover a top surface of the MEMS die.
8. The package of claim 1 , further comprising a metal trace on the back side of the surface mount substrate directly beneath the MEMS die, and a solder mask directly on the metal trace directly beneath the MEMS die.
9. The package of claim 1 , wherein the molding compound is formed directly on the surface mount substrate.
10. The package of claim 1 , further comprising an opening in the surface mount substrate between the IC die and the MEMS die.
11. The package of claim 10 , wherein the opening has a width that is greater than a width of the MEMS die in a same direction.
12. The package of claim 1 , further comprising a plurality of openings in the surface mount substrate between the IC die and the MEMS die.
13. The package of claim 1 , further comprising a bumper on the back side of the surface mount substrate, the bumper formed of an elastomeric material.
14. The package of claim 1 , wherein the MEMS die is attached to the surface mount substrate with a die attach film.
15. The package of claim 14 , wherein the MEMS die is wire bonded to the surface mount substrate.
16. The package of claim 1 , further comprising:
a trench in a top surface of the molding compound between the IC die and the MEMS die; and
an opening in the surface mount substrate between the IC die and the MEMS die.
17. The package of claim 1 , further comprising a trench in a top surface of the molding compound between the IC die and the MEMS die, wherein the MEMS die is attached to the surface mount substrate with a die attach film.
18. The package of claim 17 , wherein the trench is slot shaped.
19. The package of claim 17 , further comprising a bumper on the back side of the surface mount substrate, the bumper formed of an elastomeric material.
20. The package of claim 19 , further comprising an opening in the surface mount substrate between the IC die and the MEMS die.