IP Library Granted Patent US 9,703,056
Granted Patent B2
US 9,703,056 · App. 14/162,367 · Granted Jul 11, 2017

Copper tube interconnect

Inventors: Sriram Neelakantan (Austin, TX); Trent S. Uehling (New Braunfels, TX)
Assignee: NXP USA, INC.
G02B6/428G02B6/42G02B6/43H01L27/14629H01L27/14634H01L27/14636H01L27/14685H01L27/14687H01L27/14689G02B6/4202G02B6/4214
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Quick Facts
Patent No.
US 9,703,056
App. No.
14/162,367
Granted
Jul 11, 2017
Kind
B2
Abstract

A method and apparatus are provided for fabricating an electro-optical interconnect on an integrated circuit ( 101, 114 ) in which an optical circuit element ( 102 ) is formed by forming a cylinder-shaped conductive interconnect structure ( 120, 122, 126, 128 ) with one or more conductive layers formed around a central opening ( 129 ) which is located over an optically transparent layer ( 118 ) located over the optical circuit element ( 102 ).

Claims (25)

1. A method for fabricating an electro-optical interconnect comprising:

providing a first substrate in which an optical circuit element is formed;

forming an interconnect structure on the first substrate comprising one or more metallic conductor layers formed in one or more interlevel dielectric layers and an optically transparent layer located over the optical circuit element; and

forming a first conductive interconnect structure on the interconnect structure with one or more conductive layers formed around a central opening in the first conductive interconnect structure which is located over the optically transparent layer, where the first conductive interconnect structure is electrically connected to one or more circuits formed in the first substrate to provide an electrical signal path, and where the central opening in the first conductive interconnect structure and optically transparent layer are optically coupled to the optical circuit element formed in the first substrate to provide an optical signal path;

where forming the first conductive interconnect structure comprises:

forming an electrical contact pad layer on the interconnect structure having a central opening located over the optically transparent layer and the optical circuit element;

forming a mold structure having one or more mold openings which expose the electrical contact pad layer but otherwise covering the interconnect structure and the central opening of the electrical contact pad layer; and

filling the one or more mold openings with one or more conductive materials to form the first conductive interconnect structure in direct contact with the electrical contact pad layer.

2. The method of claim 1 , where the optical circuit element formed in the first substrate comprises photo-emitter circuit or photo-detector circuit.

3. The method of claim 1 , where the optical circuit element formed in the first substrate comprises photo-diode, photo-resistor, Vertical Cavity Surface Emitting Lasers (VCSEL), laser-diode, quantum dot, or self-electro-optic effect device (SEED).

4. The method of claim 1 , where forming the interconnect structure comprises forming metallic conductor layers in a plurality of interlevel dielectric layers to define the electrical signal path between the first conductive interconnect structure and the one or more circuits formed in the first substrate.

5. The method of claim 1 , where forming the interconnect structure comprises forming the optically transparent layer as a layer of tetraethyl orthosilicate (TEOS), silica glass, acrylic, unfilled epoxy, or other optically clear material located over the optical circuit element.

6. The method of claim 1 , where forming the electrical contact pad layer comprises depositing and patterning an aluminum-based layer.

7. The method of claim 6 , further comprising:

depositing a barrier layer comprising titanium over the aluminum-based layer; and,

depositing a seed layer comprising copper over the barrier layer.

8. The method of claim 1 , where forming the mold structure comprises patterning and developing a photoresist layer to define the one or more mold openings.

9. The method of claim 1 , where filling the one or more mold openings comprises:

electroplating copper to partially fill the one or more mold openings; and

electroplating solder to form a bonding layer on top of the copper formed in the one or more mold openings.

10. The method of claim 1 , further comprising:

providing a second substrate on which a second conductive interconnect structure is formed;

positioning the first and second substrates so that the first and second conductive interconnect structures are aligned for attachment;

bonding the first and second conductive interconnect structures together, where the first and second conductive interconnect structures are electrically connected to the electrical signal path, and where the first and second conductive interconnect structures each comprise a central opening which is optically coupled to the optical signal path.

11. The method of claim 10 , where the second substrate comprises an optical circuit element positioned to be in optical communication with the first and second conductive interconnect structures that are bonded together.

Assignments (26)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT APPLICATION NUMBERS 12222918, 14185362, 14147598, 14185868 & 14196276 PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0479. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0498 →
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBERS PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0438. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0136 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0438 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0479 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0763 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 032845/0497 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0522 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0442 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2014
From: NEELAKANTAN, SRIRAM; UEHLING, TRENT S.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 032031/0365 →
Continuity (1)
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