IP Library › Granted Patent US 9,786,539
Granted Patent B2
US 9,786,539 · App. 14/332,643 · Granted Oct 10, 2017

Wafer chuck

Inventors: Yeh-Chieh Wang (Hsinchu, TW); Jiun-Rong Pai (Jhubei, TW); Hsu-Shui Liu (Pingjhen, TW); Cheng-Lung Lee (Hsinchu, TW); Kuang-Chung Liou (Taichung, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
H01L21/6833
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Quick Facts
Patent No.
US 9,786,539
App. No.
14/332,643
Granted
Oct 10, 2017
Kind
B2
Abstract

A wafer chuck is provided. The wafer chuck includes a main body and a dielectric layer disposed over the main body. The wafer chuck also includes an electrode embedded in the dielectric layer and configured to generate an electrostatic field for retaining a wafer. The wafer chuck further includes a thermal conductive layer embedded in the main body or the dielectric layer. The thermal conductive layer has a lateral thermal conductivity greater than a vertical thermal conductivity.

Claims (48)

1. A wafer chuck, comprising:

a main body;

a dielectric layer disposed over the main body;

an electrode, embedded in the dielectric layer, configured to generate an electrostatic field for retaining a wafer; and

a thermal conductive layer embedded in the main body or the dielectric layer and located away from an interface of the main body and the dielectric layer,

wherein the thermal conductive layer has a lateral thermal conductivity and a vertical thermal conductivity, and the lateral thermal conductivity is greater than the vertical thermal conductivity.

2. The wafer chuck as claimed in claim 1 , wherein the thermal conductive layer comprises graphene.

3. The wafer chuck as claimed in claim 1 , wherein the lateral thermal conductivity is in a range from about 100 times to 200 times greater than the vertical thermal conductivity.

4. The wafer chuck as claimed in claim 1 , wherein the dielectric layer has an upper surface, the thermal conductive layer is between the upper surface and the electrode when the thermal conductive layer is embedded in the dielectric body.

5. The wafer chuck as claimed in claim 1 , wherein the thermal conductive layer is between the electrode and the main body when the thermal conductive layer is embedded in the dielectric body.

6. The wafer chuck as claimed in claim 1 , wherein when the thermal conductive layer is embedded in the dielectric layer, the thermal conductive layer comprises:

a thermal conductive material embedded in the dielectric layer; and

a boundary material configured to bond the thermal conductive material and the dielectric layer,

wherein the thermal conductive material comprises graphene, and the boundary material comprises metal.

7. The wafer chuck as claimed in claim 1 , wherein when the thermal conductive layer is embedded in the main body, the thermal conductive layer comprises:

a thermal conductive material embedded in the main body; and

a boundary material configured to bond the thermal conductive material and the main body,

wherein the thermal conductive material comprises graphene, and the boundary material comprises metal.

8. The wafer chuck as claimed in claim 1 , further comprising a heater, embedded in the main body, configured to heat the main body, wherein the thermal conductive layer is between the dielectric layer and the heater when the thermal conductive layer is embedded in the main body.

9. The wafer chuck as claimed in claim 1 , wherein the main body comprises a liquid channel, and the thermal conductive layer is between the dielectric layer and the liquid channel when the thermal conductive layer is embedded in the main body.

10. A wafer chuck, comprising:

a main body;

a dielectric layer disposed over the main body; and

a thermal conductive layer embedded in the dielectric layer and located away from an interface of the main body and the dielectric layer;

wherein the thermal conductive layer is configured to generate an electrostatic field for retaining a wafer,

wherein the thermal conductive layer has a lateral thermal conductivity and a vertical thermal conductivity, and the lateral thermal conductivity is greater than the vertical thermal conductivity.

11. The wafer chuck as claimed in claim 10 , wherein the thermal conductive layer comprises graphene.

12. The wafer chuck as claimed in claim 10 , wherein the lateral thermal conductivity is in a range from about 100 times to 200 times greater than the vertical thermal conductivity.

13. The wafer chuck as claimed in claim 10 , wherein the thermal conductive layer comprises:

a thermal conductive material embedded in the dielectric layer; and

a boundary material configured to bond the thermal conductive material and the dielectric layer,

wherein the thermal conductive material comprises graphene, and the boundary material comprises metal.

14. The wafer chuck as claimed in claim 10 , further comprising a heater, embedded in the main body, configured to heat the main body.

15. The wafer chuck as claimed in claim 10 , wherein the main body comprises a liquid channel, for a liquid flowing therethrough, and the liquid is configured to adjust a temperature of the main body.

16. A wafer chuck, comprising:

a main body comprising a liquid channel;

a dielectric layer disposed over the main body;

an electrode, embedded in the dielectric layer, configured to generate an electrostatic field for retaining a wafer; and

a thermal conductive layer between the main body and the dielectric layer and located away from the liquid channel,

wherein the thermal conductive layer has a lateral thermal conductivity and a vertical thermal conductivity, and the lateral thermal conductivity is greater than the vertical thermal conductivity.

17. The wafer chuck as claimed in claim 16 , wherein the thermal conductive layer comprises graphene, and the lateral thermal conductivity is in a range from about 100 times to 200 times greater than the vertical thermal conductivity.

18. The wafer chuck as claimed in claim 16 , wherein the thermal conductive layer comprises:

a thermal conductive material between the main body and the dielectric layer;

an upper boundary material configured to bond the thermal conductive material and the dielectric layer; and

a lower boundary material configured to bond the thermal conductive material and the main body,

wherein the thermal conductive material comprises graphene, and the upper and lower boundary materials comprise metal.

19. The wafer chuck as claimed in claim 16 , further comprising a heater, embedded in the main body, configured to heat the main body.

20. The wafer chuck as claimed in claim 16 , wherein the liquid channel facilitates for a liquid flowing therethrough, and the liquid is configured to adjust a temperature of the main body.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2014
From: WANG, YEH-CHIEH; PAI, JIUN-RONG; LIU, HSU-SHUI; LEE, CHENG-LUNG; LIOU, KUANG-CHUNG
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
Reel/Frame 033322/0567 →
Continuity (1)
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