Force measurement with real-time baseline determination
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.
1. An AFM having a probe that interacts with a sample, the AFM comprising:
a scanner to position at least one of the probe and the sample at a location of interest of the sample;
a Z-axis scanner to move at least one of the probe and the sample to lessen a separation therebetween and cause the two to interact;
a detector to measure a deflection of the probe;
a processor to discriminate a deflection artifact from a deflection due to probe-sample interaction from the measured deflection data by continuously identifying a baseline during the moving step to derive an artifact free deflection and compare it with a predefined trigger force;
wherein the Z-axis scanner retracts the probe from the sample if the artifact free deflection substantially corresponds to the trigger force; and
wherein the processor determines the force between the sample and the probe, wherein the force is less than 20 pN.
2. The AFM of claim 1 , wherein the force is used as a trigger to change a parameter associated with the moving step.
3. The AFM of claim 2 , wherein the parameter is at least one of a speed, a direction and a force gradient.
4. The AFM of claim 1 , wherein the processor compares a drive ramp to a fit line based on data corresponding to the deflection, and further extrapolates the baseline based on the comparison.
5. The AFM of claim 4 , wherein the fit line is determined by performing a least squares fit.
6. The AFM of claim 5 , wherein the processor provides a rolling baseline until a threshold trigger is met.
7. An atomic force microscope (AFM) that detects a force between a sample and a probe of the AFM, the AFM comprising:
an actuator that positions the at least one of the probe and the sample at a location of interest of the sample;
a Z actuator that moves at least one of the probe and the sample to lessen a separation therebetween and cause the two to interact;
a detector that measures a deflection of the probe in response to the probe-sample interaction; and
a processor that uses the measured deflection, in real time as the Z actuator moves at least one of the probe and the sample, to determine an instantaneous baseline.
8. An atomic force microscope (AFM) including a probe that interacts with a sample, the AFM comprising:
an actuator that positions at least one of the probe and the sample at a location of interest of the sample;
a Z actuator that moves at least one of the probe and the sample to lessen a separation therebetween and cause the two to interact;
a detector that measures an observable interaction between the probe and the sample based on the moving step;
a processor that determines an observable interaction artifact from the observable interaction and derives an artifact free observable interaction, and wherein the processor compares the artifact free observable interaction with a trigger; and
wherein the Z actuator retracts the probe from the sample if the artifact free observable interaction substantially corresponds to the trigger.
9. The AFM of claim 8 , wherein the observable interaction includes at least one of a group including: force, deflection, electric interaction, magnetic interaction, thermal interaction and electromagnetic interaction.
10. The AFM of claim 9 , wherein the observable interaction is an electric interaction, and the electric interaction is one of force, current and voltage.
11. The AFM of claim 9 , wherein the electromagnetic interaction is based on scattered near field optical signals.