Semiconductor memory system including a plurality of semiconductor memory devices
A communication line is connected to first and second chips, and held at a first signal level. A monitor circuit changes a signal level of the communication line from the first signal to a second signal level while one of the first and second chips uses a current larger than a reference current. When the signal level of the communication line is the second signal level, the other of the first and second chips is controlled to a wait state that does not transfer to an operating state of using a current larger than the reference current.
1. A semiconductor memory system comprising:
a first semiconductor memory device;
a second semiconductor memory device;
a first voltage generation circuit configured to generate voltage for the first semiconductor memory device; and
a second voltage generation circuit configured to generate voltage for the second memory device;
wherein the first and second voltage generation circuits are driven simultaneously and co-supply a necessary voltage to one of the first and second semiconductor memory devices when the necessary voltage is beyond capability of each one of the first and second voltage generation circuits.
2. The system according to claim 1 , wherein the first and second voltage generation circuits have capability to generate voltage relatively lower than necessary peak voltage for each of the first and second semiconductor devices.
3. The system according to claim 1 , wherein the first voltage generation circuit is provided in the first semiconductor memory device and the second voltage generation circuit is provided in the second semiconductor memory device.
4. The system according to claim 1 , further comprising:
a first word line drive circuit provided in the first semiconductor memory device; and
a second word line drive circuit provided in the second semiconductor memory device,
wherein the necessary voltage is supplied to one of the first and second word line drive circuits from the first and second voltage generation circuits when the necessary voltage is beyond capability of each one of the first and second voltage generation circuits.
5. The system according to claim 1 , further comprising a controller electrically connected to the first and second voltage generation circuits,
wherein a program operation and a verify operation in the first and second semiconductor memory devices are controlled by the controller.
6. The system according to claim 1 , wherein each of the first and second semiconductor memory devices is a NAND flash memory.