Display device with micro cover layer and manufacturing method for the same
There is provided a flexible display having a plurality of innovations configured to allow bending of a portion or portions to reduce apparent border size and/or utilize the side surface of an assembled flexible display.
1. An apparatus, comprising:
a flexible base layer bent along a bend line;
a conductive line on the flexible base layer arranged to extend across the bend line, the conductive line having a trace design with at least two sub-traces splitting and merging back at an angle away from a tangent vector of a curvature; and
one or more insulation layers on at least part of outer surface of the conductive line, said one or more insulation layers having the same trace design as the conductive line and having a greater width than a width of the conductive line, wherein the width of the conductive line and the angle in which the sub-traces oriented reduces a length of the insulation layer being aligned to the tangent vector of the curvature,
wherein the sub-trace of the insulation layer includes a plurality of micro stress points, each capable to focus bending stress thereto.
2. The apparatus of claim 1 , wherein an interval in which the conductive line trace splits and merges are not uniform throughout the conductive line.
3. The apparatus of claim 2 , wherein the bend line is located at a border of a central portion and a bend portion of the flexible base layer, and wherein the trace of the conductive line splits and merges at a lesser angle at the bend line than in the bend portion.
4. The apparatus of claim 1 , wherein the conductive line splits into two sub-traces and merges back, forming a chain of diamond trace design.
5. The apparatus of claim 3 , wherein the conductive line splits and merges in more than two sub-traces, thereby forming a grid of diamond trace design.
6. The apparatus of claim 4 , wherein the conductive line has an expanded width at angled corners of the trace design.
7. The apparatus of claim 5 , wherein the width of the conductive line at the angled corners is no greater than 5 um.
8. The apparatus of claim 6 , wherein the width of the conductive line between each joint of the trace design is in a range of about 4 um to 4.5 um.
9. The apparatus of claim 1 , wherein the plurality of micro-stress points are positioned along the sub-traces.
10. The apparatus of claim 6 , wherein the expanded width is in range from about 2.5 um to about 8 um.