IP Library › Granted Patent US 10,134,724
Granted Patent B2
US 10,134,724 · App. 15/796,309 · Granted Nov 20, 2018

Electro-static discharge protection devices having a low trigger voltage

Inventor: Hyun Duck Lee (Gyeonggi-do, KR)
Assignee: SK Hynix Inc.
H01L27/0262H01L29/7408H01L29/7436
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Quick Facts
Patent No.
US 10,134,724
App. No.
15/796,309
Granted
Nov 20, 2018
Kind
B2
Abstract

An electro-static discharge (ESD) protection device includes a first PN diode, a second PN diode and a silicon controlled rectifier (SCR). The first PN diode and the second PN diode are coupled in series between a pad and a ground voltage to provide a first discharge current path. The SCR is coupled between the pad and the ground voltage to provide a second discharge current path. The SCR has a PNPN structure.

Claims (33)

1. An electro-static discharge (ESD) protection device comprising:

an N-type well region and a P-type well region disposed in an upper portion of a P-type substrate to contact each other and to provide a PN junction therebetween;

a first P-type junction region disposed in an upper portion of the N-type well region and electrically connected to a pad;

a first N-type junction region disposed in an upper portion of the N-type well region spaced apart from the first P-type junction region;

a second P-type junction region disposed in an upper portion of the P-type well region;

a second N-type junction region disposed in an upper portion of the P-type well region spaced apart from the second P-type junction region and electrically connected to the ground voltage; and

a first external connection line electrically connecting the first N-type junction region to the second P-type junction region,

wherein the first external connection line is externally isolated from the pad and the ground voltage.

2. The ESD protection device of claim 1 , further comprising:

a third N-type junction region disposed in an upper portion of the N-type well region spaced apart from the first P-type junction region and the first N-type junction region;

a third P-type junction region disposed in an upper portion of the P-type well region spaced apart from the second P-type junction region and the second N-type junction region; and

a second external connection line electrically connecting the third N-type junction region to the third P-type junction region.

3. The ESD protection device of claim 1 , wherein the second P-type junction region is directly contacted with the first N-type junction region at the PN junction between the N-type well region and the P-type well region.

4. An electro-static discharge (ESD) protection device comprising:

an N-type well region and a P-type well region disposed in an upper portion of a P-type substrate to contact each other and to provide a PN junction therebetween;

a first P-type junction region disposed in an upper portion of the N-type well region and electrically connected to a pad;

a first N-type junction region disposed in an upper portion of the N-type well region spaced apart from the first P-type junction region and in direct contact with the P-type well region at the PN junction between the N-type well region and the P-type well region;

a second N-type junction region disposed in an upper portion of the N-type well region spaced apart from the first P-type junction region and the first N-type junction region;

a third N-type junction region disposed in an upper portion of the P-type well region and electrically connected to the ground voltage;

a second P-type junction region disposed in an upper portion of the P-type well region spaced apart from the third N-type junction region; and

an external connection line electrically connecting the second N-type junction region to the second P-type junction region,

wherein the external connection line is externally isolated from the pad and the ground voltage.

5. The ESD protection device of claim 4 , wherein the first N-type junction region is floated.

6. An electro-static discharge (ESD) protection device comprising:

an N-type well region and a P-type well region disposed in an upper portion of a P-type substrate to contact each other and to provide a PN junction therebetween;

a first P-type junction region disposed in an upper portion of the N-type well region and electrically connected to a pad;

a first N-type junction region disposed in an upper portion of the N-type well region spaced apart from the first P-type junction region;

a second N-type junction region disposed in an upper portion of the P-type well region and electrically connected to the ground voltage;

a second P-type junction region disposed in an upper portion of the P-type well region spaced apart from the second N-type junction region and in direct contact with the N-type well region at the PN junction between the N-type well region and the P-type well region

a third P-type junction region disposed in an upper portion of the P-type well region spaced apart from the second P-type junction region and the second N-type junction region; and

an external connection line electrically connecting the first N-type junction region to the third P-type junction region,

wherein the external connection line is externally isolated from the pad and the ground voltage.

7. The ESD protection device of claim 6 , wherein the third P-type junction region is floated.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2017
From: LEE, HYUN DUCK
To: SK HYNIX INC.
Reel/Frame 044310/0758 →
Priority Claims (1)
KR 10-2015-0183287 · Dec 21, 2015 · national
Continuity (2)
Division 15173244 · Jun 3, 2016
Related Publication 20180068996A1 · Mar 8, 2018
Cited By (1)
US 12,218,126