IP Library › Granted Patent US 10,181,431
Granted Patent B2
US 10,181,431 · App. 15/088,666 · Granted Jan 15, 2019

Package substrate and method of manufacturing the same

Inventors: Dong-Uk Lee (Cheongju-si, KR); Young-Gon Kim (Ulsan, KR); Jin-Young Yoon (Cheongju-si, KR)
Assignee: Samsung Electro-Mechanics Co., Ltd.
H01L23/13H05K1/115H05K3/108H05K3/205H05K3/4007H05K1/0298H05K1/14H05K3/06H05K2201/0376H05K2201/09509
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Quick Facts
Patent No.
US 10,181,431
App. No.
15/088,666
Granted
Jan 15, 2019
Kind
B2
Abstract

Package substrate and a method of manufacturing the same is disclosed. The package substrate includes an insulating layer having first circuit patterns embedded in a first surface of the insulating layer, and a protruded circuit pattern formed above at least one of the embedded first circuit patterns, wherein a width of the protruded circuit pattern is greater than a width of each of the embedded first circuit patterns. Accordingly, a flip chip and a wire bonding chip may be installed at the same time owing to an embedded structure of circuit pattern and a protruded structure of circuit pattern realized together on a surface where an electronic component is to be installed. Moreover, a fine circuit pattern may be formed, and a surface treatment layer may be selectively formed at desired portions without forming an additional seed layer for electroplating, thereby possibly simplifying manufacturing processes and saving manufacturing costs.

Claims (16)

1. A package substrate, comprising:

an insulating layer having first circuit patterns embedded in a first surface of the insulating layer;

a protruded circuit pattern formed above at least one of the embedded first circuit patterns; and

a solder resist layer in a pattern that covers a portion of the first circuit patterns and a portion of the first surface of the insulating layer, and exposes a portion of the first circuit patterns and a portion of the first surface of the insulating layer,

wherein a width of the protruded circuit pattern is greater than a width of the at least one of the embedded first circuit patterns,

wherein a depth of the at least one of the embedded first circuit patterns is less than a depth of the insulating layer, and

wherein lateral surfaces of the protruded circuit pattern are separated from the solder resist layer.

2. The package substrate of claim 1 , further comprising a surface treatment layer formed above the protruded circuit pattern.

3. The package substrate of claim 2 , wherein a surface of the surface treatment layer comprises a first layer electroplated on a second layer.

4. The package substrate of claim 1 , wherein a surface of the each of the embedded first circuit patterns is formed on a same plane as the first surface of the insulating layer.

5. The package substrate of claim 1 , further comprising a second circuit patter formed on a second surface of the insulating layer.

6. The package substrate of claim 5 , further comprising a via to electrically connect the first circuit patterns with the second circuit pattern.

7. The package substrate of claim 6 , wherein the solder resist layer covers a portion of the first circuit patterns, a portion of the first surface of the insulating layer, a portion of the second circuit patter, and a portion of the second surface of the insulating layer.

8. The package substrate of claim 5 , wherein the second surface of the insulating layer is disposed parallel and opposite to the first surface of the insulating layer.

9. The package substrate of claim 1 , wherein a surface of the protruded circuit pattern is disposed parallel to and above the first surface.

10. The package substrate of claim 1 , wherein a width of the protruded circuit patter is greater than twice as large as a width of the at least one of the embedded first circuit patterns.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2016
From: LEE, DONG-UK; KIM, YOUNG-GON; YOON, JIN-YOUNG
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 038173/0498 →
Priority Claims (1)
KR 10-2015-0076481 · May 29, 2015 · national
Continuity (1)
Related Publication 20160353568A1 · Dec 1, 2016