Particle characterisation

1. A method of characterizing particles in a sample, comprising:

illuminating the sample in a sample cell with a light beam, so as to produce scattered light by the interaction of the light beam with the sample;

obtaining a time series of measurements of the scattered light from a single detector;

determining, from the time series of measurements from the single detector, which measurements were taken at times when a large particle was contributing to the scattered light, wherein determining which measurements were taken at times when a large particle was contributing to the scattered light comprises: dividing the time series up into a plurality of shorter sub-runs, performing a correlation on each sub-run, and then determining which of the sub-runs comprise measurements with a scattering contribution from a large particle;

determining a particle size distribution from the time series of measurements, including correcting for light scattered -by the large particle, comprising excluding, or analyzing separately, sub-runs taken at times when the large particle was contributing to the scattered light.

2. The method of claim 1 , wherein determining a particle size distribution from the time series of measurements, including correcting for light scattered by the large particle further comprises: analyzing separately each sub-run that has not been excluded as including a contribution of scattered light from a larger particle, and then using an average of the sub-run analyses to determine the particle size distribution.

3. The method of claim 1 , wherein determining a particle size distribution comprises performing a dynamic light scattering correlation operation on the time series of measurements.

4. The method of claim 1 , wherein determining which measurements were taken at times when a large particle was contributing to the scattered light comprises detecting and/or removing a low frequency variation of less than 10 Hz in the time series of measurements, the low frequency variation corresponding with a large particle.

5. The method of claim 1 , wherein determining which of the sub-runs comprise measurements with a scattering contribution from a large particle comprises evaluating a parameter for each sub-run, and comparing the parameter with a threshold value.

6. The method of claim 5 , wherein the parameter is selected from: intensity, polydispersity index, and Z average.

7. The method of claim 5 , wherein the threshold value is derived from a distribution of the parameter values calculated from each sub-run.

8. The method of claim 7 , wherein the threshold value is derived from an average value of the parameter and a standard deviation of the parameter.

9. The method of claim 1 , wherein determining which of the sub-runs comprise measurements with a scattering contribution from a large particle comprises:

determining a particle size distribution for each sub-run by dynamic light scattering;

wherein the processing of the time series of measurements so as to correct for light scattered by the large particle comprises correcting for light scattered by the large particle only in the sub-runs in which a large particle was identified by the correlation.

10. The method of claim 1 , wherein each sub-run has a duration of: 5 seconds or less; 2 seconds or less; or 1 second or less; 0.5 seconds or less; or 0.1 seconds or less.

11. The method of claim 1 , wherein the large particle has a diameter greater than 100 nm.

12. The method of claim 1 , wherein a criteria for identifying a scattering contribution from a large particle is based on a parameter determined from the time series of measurements of scattered light.

13. The method of claim 1 , wherein a criteria for identifying a scattering contribution from a large particle is based on a parameter input by a user.

14. An apparatus for characterizing particles comprising: a light source, a sample cell, a detector and a processor; wherein

the light source is operable to illuminate a sample within the sample cell with a light beam so as to produce scattered light by interactions of the light beam with the sample;

the detector is configured to detect the scattered light and produce a time series of measurements;

the processor is configured to:

receive the time series of measurements, and

determine, from the time series of measurements from a single detector, which measurements were taken at times when a large particle was contributing to the scattered light, wherein determining which measurements were taken at times when a large particle was contributing to the scattered light comprises : dividing the time series up into a plurality of shorter sub-runs, performing a correlation on each sub-run, and then determining which of the sub-runs comprise measurements with a scattering contribution from a large particle;

determine a particle size distribution by performing a dynamic light scattering correlation operation on the time series of measurements, including correcting for light scattered by the large particle, comprising:

excluding, or analyzing separately, sub-runs taken at times when the large particle was contributing to the scattered light, and

analyzing separately each sub-run that has not been excluded as including a contribution of scattered light from a larger particle, and then using an average of the sub-run analyses to determine the particle size distribution.

15. The apparatus of claim 14 , wherein the detector comprises a photon counting detector.

16. The apparatus of claim 14 , wherein the detector is configured to detect backscattered light.

17. The apparatus of claim 14 , further comprising an optical fibre that provides an optical path between the detector and a scattering volume that is illuminated by the light source.

18. The apparatus of claim 14 , comprising a plurality of detectors configured to detect the scattered light.