IP Library › Granted Patent US 10,199,391
Granted Patent B2
US 10,199,391 · App. 15/688,646 · Granted Feb 5, 2019

Semiconductor device and method of manufacturing the same

Inventors: Taishi Ishikura (Kawasaki Kanagawa, JP); Atsunobu Isobayashi (Yokohama Kanagawa, JP); Masayuki Kitamura (Yokkaichi Mie, JP); Akihiro Kajita (Tsukuba Ibaraki, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01L27/11582H01L27/11551H01L27/11553H01L27/11556H01L27/11565H01L27/11568H01L27/11573H01L27/11575H01L27/11578H01L29/66833H01L29/7926
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Quick Facts
Patent No.
US 10,199,391
App. No.
15/688,646
Granted
Feb 5, 2019
Kind
B2
Abstract

A semiconductor device includes an under layer, a stacked body comprising a plurality of conductive layers and insulating layers alternately stacked one over the other in a stacking direction, above the insulating layer, a columnar portion extending into the stacked body in the stacking direction of the stacked body, and a graphene film between at least one of the conductive layers and adjacent insulating layers and between the at least one of the conductive layers and the columnar portion.

Claims (11)

1. A semiconductor device comprising:

an under layer;

a stacked body comprising a plurality of alternating conductive layers and insulating layers stacked one over the other in a stacking direction, above the under layer;

a columnar portion extending into the stacked body in the stacking direction of the stacked body; and

a graphene film between at least one of the conductive layers and adjacent insulating layers and between the at least one of the conductive layers and the columnar portion.

2. The semiconductor device according to claim 1 , wherein each of the conductive layers contains at least one metal selected from the group consisting of tungsten, molybdenum, nickel, cobalt, iron, ruthenium, and iridium.

3. The semiconductor device according to claim 1 , wherein each of the conductive layers contains fluorine.

4. The semiconductor device according to claim 1 , further comprising a metal oxide film provided between the graphene film and the insulating layer and between the graphene film and the columnar portion.

5. The semiconductor device of claim 1 , wherein the graphene film is one monolayer thick.

6. The semiconductor device of claim 1 , wherein the columnar portion extends through the stacked body.

7. The semiconductor device of claim 1 , wherein the graphene film is between each one of the conductive layers and adjacent insulating layers and between said each one of the conductive layers and the columnar portion.

Assignments (4)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2017
From: ISHIKURA, TAISHI; ISOBAYASHI, ATSUNOBU; KITAMURA, MASAYUKI; KAJITA, AKIHIRO
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043948/0018 →
Priority Claims (1)
JP 2017-046189 · Mar 10, 2017 · national
Continuity (1)
Related Publication 20180261624A1 · Sep 13, 2018
Cited By (2)
US 12,193,343 US 12,272,402