Failure diagnosis method and system of temperature sensor of switch device

1. A failure diagnosis method of a temperature sensor of a switch device, comprising:

setting, by a controller, a sampling period using a temperature detected by the temperature sensor of the switch device and a temperature of cooling water for cooling the switch device; and

comparing, by the controller, a temperature sensing value detected by the temperature sensor and a temperature reference value stored in a memory of the controller in the sampling period and determining whether a failure occurs in the temperature sensor,

wherein the controller is configured to determine the failure occurs in the temperature sensor when a difference between the temperature sensing value and the temperature reference value after a reference time elapses in the sampling period is equal to or greater than an error range.

2. The method according to claim 1 , wherein the setting of the sampling period includes:

setting, by the controller, as the sampling period, a time period in which the temperature detected by the temperature sensor is increased while the temperature of the cooling water remains constant as time elapses.

3. The method according to claim 1 , wherein:

the switch device is configured to adjust current required to drive a motor; and

the setting of the sampling period includes setting, as the sampling period, a time period in which the temperature detected by the temperature sensor is increased while the temperature of the cooling water remains constant as time elapses during operation of the switch device to switch the motor to a driving state from a stop state.

4. The method according to claim 3 , wherein:

the controller is configured to operate the switch device to output a greater amount of current than required current when the motor is switched to the driving state from the stop state; and

the sampling period is started from a time point at which the switch device outputs the required current.

5. The method according to claim 1 , wherein the determination of whether the failure occurs includes:

comparing, by the controller, the temperature sensing value and the temperature reference value at a preset reference time interval in the sampling period; and

determining, by the controller, whether the failure occurs in the temperature sensor.

6. The method according to claim 5 , wherein the temperature reference value is determined based on an amount of heat absorbed into the switch device and an amount of heat transferred to the cooling water.

7. The method according to claim 5 , wherein the temperature reference value is determined according to the following equation:

T 1 ( t )=( T 1 (0)− T 2 (0)− c*m*R th )*exp(− t /( c*m*R th ))+ T 2 (0)+ c*m*R th

wherein T 1 (t): temperature reference value after time t elapses in sampling period, T 1 (0): initial temperature sensing value in sampling period, T 2 (0): initial temperature of cooling water in sampling period, c: specific heat of switch device, m: mass of switch device, and R th : synthesized thermal resistance.

8. The method according to claim 5 , wherein the controller is configured to determine the temperature sensor to be normal when the difference between the temperature sensing value and the temperature reference value after the reference time elapses in the sampling period is less than a preset error range and determine that failure occurs in the temperature sensor when the difference between the temperature sensing value and the temperature reference value after the reference time elapses is equal to or greater than the error range.

9. The method according to claim 8 , further comprising:

storing, by the controller, in the memory, a time when failure occurs in the temperature sensor in the sampling period; and

analyzing, by the controller, a cause of the failure of the temperature sensor as contact inferiority when the time stored in the memory is aperiodically distributed in the sampling period.

10. The method according to claim 8 , further comprising:

storing, in the memory, the temperature sensing value when failure occurs in the temperature sensor in the sampling period; and

analyzing, by the controller, a cause of the failure of the temperature sensor as short circuit when temperature sensing values stored in the memory are the same.

11. A failure diagnosis system of a temperature sensor of a switch device, comprising:

the temperature sensor configured to detect a temperature of the switch device;

a cooling flow channel and cooling water that cool the switch device;

a memory configured to store a temperature reference value; and

a controller configured to set a sampling period using the temperature detected by the temperature sensor and the temperature of the cooling water, compare the temperature reference value and the temperature sensing value detected by the temperature sensor in the sampling period to determine whether a failure occurs in the temperature sensor,

wherein the controller is configured to determine the failure occurs in the temperature sensor when a difference between the temperature sensing value and the temperature reference value after a reference time elapses in the sampling period is equal to or greater than an error range.

12. The system according to claim 11 , wherein the controller is configured to set a time period in which the temperature detected by the temperature sensor is increased while the temperature of the cooling water remains constant, as the sampling period.

13. The system according to claim 11 , wherein the temperature reference value is determined according to the following equation:

T 1 ( t )=( T 1 (0)− T 2 (0)− c*m*R th )*exp(− t /( c*m*R t h ))+ T 2 (0)+ c*m*R th

wherein T 1 (t): temperature reference value after time t elapses in sampling period, T 1 (0): initial temperature sensing value in sampling period, T 2 (0): initial temperature of cooling water in sampling period, c: specific heat of switch device, m: mass of switch device, and R th : synthesized thermal resistance.