Substrate processing apparatus and processing method of substrate processing apparatus

1. A substrate processing apparatus which performs a processing of removing a film on a peripheral portion of a substrate, the substrate processing apparatus comprising:

a rotating/holding unit configured to hold and rotate the substrate;

a first processing liquid supply unit configured to supply a first processing liquid for removing the film onto the peripheral portion of the substrate while the substrate is being rotated in a first rotational direction by the rotating/holding unit;

a second processing liquid supply unit configured to supply a second processing liquid for removing the film onto the peripheral portion of the substrate while the substrate is being rotated in a second rotational direction opposite to the first rotational direction by the rotating/holding unit; and

an imaging unit configured to image the peripheral portion of the substrate,

wherein the imaging unit is provided at a position not overlapping with arrival regions of the first and second processing liquids when viewed from above and between the first processing liquid supply unit and the second processing liquid supply unit.

2. The substrate processing apparatus of claim 1 , further comprising:

a circular ring-shaped cover member configured to cover the peripheral portion of the substrate held by the rotating/holding unit from thereabove,

wherein the imaging unit is provided by notching a part of the cover member.

3. The substrate processing apparatus of claim 2 ,

wherein a height of a lower end of the imaging unit when provided to the cover member is equal to a height of a bottom surface of the cover member facing the substrate.

4. The substrate processing apparatus of claim 3 ,

wherein a glass window configured to block an entrance of an atmosphere into the imaging unit is provided at a lower end of an opening of the imaging unit through which the substrate is imaged.

5. The substrate processing apparatus of claim 2 ,

wherein the imaging unit includes an optical guide unit configured to guide an optical image of the substrate and an imaging functional unit configured to image the optical image, and

a contour of an entire cross sectional shape combining the notched cover member and the optical guide unit coincides with a contour of a cross sectional shape of the cover member.

6. The substrate processing apparatus of claim 2 ,

wherein an adjusting member configured to perform a focus adjustment is provided at a position on a top surface of the imaging unit and higher than the circular ring-shaped cover member.

7. A substrate processing apparatus which performs a processing of removing a film on a peripheral portion of a substrate, the substrate processing apparatus comprising:

a rotating/holding unit configured to hold and rotate the substrate;

a first processing liquid supply unit configured to supply a first processing liquid for removing the film onto the peripheral portion of the substrate while the substrate is being rotated in a first rotational direction by the rotating/holding unit;

an imaging unit provided at a position at a position not overlapping with an arrival region of the first processing liquid when viewed from above, and configured to image the peripheral portion of the substrate; and

a circular ring-shaped cover member configured to cover the peripheral portion of the substrate held by the rotating/holding unit from thereabove,

wherein the imaging unit is provided by notching a part of the cover member.

8. The substrate processing apparatus of claim 7 ,

wherein a height of a lower end of the imaging unit when provided to the cover member is equal to a height of a bottom surface of the cover member facing the substrate.

9. The substrate processing apparatus of claim 8 ,

wherein a glass window configured to block an entrance of an atmosphere into the imaging unit is provided at a lower end of an opening of the imaging unit through which the substrate is imaged.

10. The substrate processing apparatus of claim 7 ,

wherein the imaging unit includes an optical guide unit configured to guide an optical image of the substrate and an imaging functional unit configured to image the optical image, and

a contour of an entire cross sectional shape combining the notched cover member and the optical guide unit coincides with a contour of a cross sectional shape of the cover member.

11. The substrate processing apparatus of claim 7 ,

wherein an adjusting member configured to perform a focus adjustment is provided at a position on a top surface of the imaging unit and higher than the circular ring-shaped cover member.

12. A processing method of a substrate processing apparatus including a rotating/holding unit configured to hold and rotate a substrate, a first processing liquid supply unit configured to supply a first processing liquid for removing a film on a peripheral portion of the substrate, a second processing liquid supply unit configured to supply a second processing liquid for removing the film on the peripheral portion of the substrate and an imaging unit provided with an opening for imaging the peripheral portion of the substrate, the processing method comprising:

supplying a first processing liquid for removing the film onto the peripheral portion of the substrate from the first processing liquid supply unit while the substrate is being rotated in a first rotational direction by the rotating/holding unit;

supplying a second processing liquid for removing the film onto the peripheral portion of the substrate from the second processing liquid supply unit while the substrate is being rotated in a second rotational direction by the rotating/holding unit and

imaging the peripheral portion of the substrate by the imaging unit which is provided at a position not overlapping with arrival regions of the first and second processing liquids when viewed from above and between the first processing liquid supply unit and the second processing liquid supply unit, in the supplying of the first or second processing liquid.