Image sensor, electronic device, control device, control method, and program
The present technology relates to an image sensor capable of achieving both higher S/N and higher frame rate, an electronic device, a control device, a control method, and a program. An AD converter has a comparator in which differential pairs are provided at an input stage. The differential pairs have a plurality of transistors as first transistors and second transistors paired to configure the differential pairs. The AD converter compares a level-changing reference signal with an electric signal output by a shooting unit for performing photoelectric conversion and outputting the electric signal, thereby performing AD conversion on the electric signal. The comparator is controlled such that a transistor to be operated is selected as active transistor from among the transistors depending on the amount of light incident in the shooting unit and the active transistor operates. The present technology is applicable to an image sensor for shooting an image, and the like, for example.
1. An imaging device comprising:
a first pixel configured to receive incident light and output a first pixel signal;
a signal line coupled to the first pixel;
a reference signal generator configured to generate a reference signal; and
a comparator coupled to the signal line and the reference signal generator, wherein the comparator comprises a first circuit comprising:
a first transistor, a gate of the first transistor coupled to the signal line via first switch circuitry;
a second transistor, a gate of the second transistor coupled to the signal line via the first switch circuitry;
a third transistor, a gate of the third transistor coupled to the reference signal generator via second switch circuitry; and
a fourth transistor, a gate of the fourth transistor coupled to the reference signal generator via the second switch circuitry and wherein a first thickness of a gate oxide film of the first transistor is different from a second thickness of a gate oxide film of the second transistor.
2. The imaging device according to claim 1 , wherein the first switch circuitry comprises a first switch circuit configured to couple the signal line to the first transistor.
3. The imaging device according to claim 2 , wherein the first switch circuitry comprises a second switch circuit configured to couple the signal line to the second transistor.
4. The imaging device according to claim 1 , wherein the second switch circuitry comprises a first switch circuit configured to couple the reference signal generator to the third transistor.
5. The imaging device according to claim 4 , wherein the second switch circuitry comprises a second switch circuit configured to couple the reference signal generator to the fourth transistor.
6. The imaging device according to claim 1 , wherein the first switch circuitry is configured to switch based on an amount of incident light.
7. The imaging device according to claim 1 , wherein the second switch circuitry is configured to switch based on an amount of incident light.
8. The imaging device according to claim 1 , wherein a third thickness of a gate oxide film of the third transistor is different from a fourth thickness of a gate oxide film of the fourth transistor.
9. The imaging device according to claim 8 , wherein the first circuit further comprises a fifth transistor, a gate of the fifth transistor coupled to the signal line via the first switch circuitry.
10. The imaging device according to claim 9 , wherein the first switch circuitry comprises a first switch circuit configured to couple the signal line to the first transistor, a second switch circuit configured to couple the signal line to the second transistor, and a third switch circuit configured to couple the signal line to the fifth transistor.
11. The imaging device according to claim 10 , wherein a fifth thickness of a gate oxide film of the fifth transistor is different from the first thickness of the gate oxide film of the first transistor and the second thickness of the gate oxide film of the second transistor.
12. The imaging device according to claim 11 , wherein the first circuit further comprises a sixth transistor, a gate of the sixth transistor coupled to the reference signal generator via the second switch circuitry.
13. The imaging device according to claim 12 , wherein the second switch circuitry comprises a fourth switch circuit configured to couple the reference signal generator to the third transistor, a fifth switch circuit configured to couple the reference signal generator to the fourth transistor, and a sixth switch circuit configured to couple the reference signal generator to the sixth transistor.
14. The imaging device according to claim 13 , wherein a sixth thickness of a gate oxide film of the sixth transistor is different from the third thickness of the gate oxide film of the third transistor and the fourth thickness of the gate oxide film of the fourth transistor.
15. The imaging device according to claim 1 , wherein the first circuit further comprises a seventh transistor, wherein a gate of the seventh transistor is coupled to the signal line via the first switch circuitry, and wherein a seventh thickness of a gate oxide film of the seventh transistor is the same as the first thickness of the gate oxide film of the first transistor or the second thickness of the gate oxide film of the second transistor.
16. The imaging device according to claim 8 , wherein the first circuit further comprises an eighth transistor, wherein a gate of the eighth transistor is coupled to the reference signal generator via the second switch circuitry, and wherein an eighth thickness of a gate oxide film of the eighth transistor is the same as the third thickness of the gate oxide film of the third transistor or the fourth thickness of the gate oxide film of the fourth transistor.
17. The imaging device according to claim 1 , wherein the comparator further comprises a second circuit configured to receive a comparison result signal from the first circuit and to output an amplified comparison result signal.
18. The imaging device according to claim 17 , wherein the second circuit comprises a first transistor, a gate of the first transistor coupled to the first circuit.
19. The imaging device according to claim 18 , wherein the second circuit further comprises a second transistor, wherein a gate of the second transistor is connected to a capacitor, a source of the second transistor is grounded, and a drain of the second transistor is connected to the first transistor.
20. The imaging device according to claim 1 , further comprising a control unit configured to select at least one transistor coupled to the signal line and at least one transistor coupled to the reference signal generator as active transistors based on an amount of incident light received by the first pixel.
21. The imaging device according to claim 20 , wherein a number of transistors selected as active transistors by the control unit decreases as the amount of incident light received by the first pixel increases.
22. The imaging device according to claim 1 , further comprising a plurality of pixels comprising the first pixel, wherein each pixel of the plurality of pixels is configured to receive incident light and output a pixel signal.
23. The imaging device according to claim 22 , wherein each pixel of the plurality of pixels is coupled to the signal line.
24. An electronic device, comprising the imaging device according to claim 1 .
25. The electronic device according to claim 24 , further comprising an optical system configured to focus light on the first pixel.
26. An imaging device comprising:
a first pixel configured to receive incident light and output a first pixel signal;
a signal line coupled to the first pixel;
a reference signal generator configured to generate a reference signal; and
a comparator coupled to the signal line and the reference signal generator, wherein the comparator comprises a first circuit comprising:
a first transistor, a gate of the first transistor coupled to the signal line via first switch circuitry;
a second transistor, a gate of the second transistor coupled to the signal line via the first switch circuitry;
a third transistor, a gate of the third transistor coupled to the reference signal generator via second switch circuitry;
a fourth transistor, a gate of the fourth transistor coupled to the reference signal generator via the second switch circuitry; and
a fifth transistor, a gate of the fifth transistor coupled to the signal line via the first switch circuitry.
27. The imaging device according to claim 26 , wherein the first switch circuitry comprises a first switch circuit configured to couple the signal line to the first transistor.
28. The imaging device according to claim 27 , wherein the first switch circuitry comprises a second switch circuit configured to couple the signal line to the second transistor.
29. The imaging device according to claim 26 , wherein the second switch circuitry comprises a first switch circuit configured to couple the reference signal generator to the third transistor.
30. The imaging device according to claim 29 , wherein the second switch circuitry comprises a second switch circuit configured to couple the reference signal generator to the fourth transistor.
31. The imaging device according to claim 26 , wherein the first switch circuitry is configured to switch based on an amount of incident light.
32. The imaging device according to claim 26 , wherein the second switch circuitry is configured to switch based on an amount of incident light.
33. The imaging device according to claim 26 , wherein a first thickness of a gate oxide film of the first transistor is different from a second thickness of a gate oxide film of the second transistor.
34. The imaging device according to claim 33 , wherein a third thickness of a gate oxide film of the third transistor is different from a fourth thickness of a gate oxide film of the fourth transistor.
35. The imaging device according to claim 26 , wherein the first switch circuitry comprises a first switch circuit configured to couple the signal line to the first transistor, a second switch circuit configured to couple the signal line to the second transistor, and a third switch circuit configured to couple the signal line to the fifth transistor.
36. The imaging device according to claim 35 , wherein a fifth thickness of a gate oxide film of the fifth transistor is different from the first thickness of the gate oxide film of the first transistor and the second thickness of the gate oxide film of the second transistor.
37. The imaging device according to claim 36 , wherein the first circuit further comprises a sixth transistor, a gate of the sixth transistor coupled to the reference signal generator via the second switch circuitry.
38. The imaging device according to claim 37 , wherein the second switch circuitry comprises a fourth switch circuit configured to couple the reference signal generator to the third transistor, a fifth switch circuit configured to couple the reference signal generator to the fourth transistor, and a sixth switch circuit configured to couple the reference signal generator to the sixth transistor.
39. The imaging device according to claim 38 , wherein a sixth thickness of a gate oxide film of the sixth transistor is different from the third thickness of the gate oxide film of the third transistor and the fourth thickness of the gate oxide film of the fourth transistor.
40. The imaging device according to claim 33 , wherein the first circuit further comprises a seventh transistor, wherein a gate of the seventh transistor is coupled to the signal line via the first switch circuitry, and wherein a seventh thickness of a gate oxide film of the seventh transistor is the same as the first thickness of the gate oxide film of the first transistor or the second thickness of the gate oxide film of the second transistor.
41. The imaging device according to claim 34 , wherein the first circuit further comprises an eighth transistor, wherein a gate of the eighth transistor is coupled to the reference signal generator via the second switch circuitry, and wherein an eighth thickness of a gate oxide film of the eighth transistor is the same as the third thickness of the gate oxide film of the third transistor or the fourth thickness of the gate oxide film of the fourth transistor.
42. The imaging device according to claim 26 , wherein the comparator further comprises a second circuit configured to receive a comparison result signal from the first circuit and to output an amplified comparison result signal.
43. The imaging device according to claim 42 , wherein the second circuit comprises a first transistor, a gate of the first transistor coupled to the first circuit.
44. The imaging device according to claim 43 , wherein the second circuit further comprises a second transistor, wherein a gate of the second transistor is connected to a capacitor, a source of the second transistor is grounded, and a drain of the second transistor is connected to the first transistor.
45. The imaging device according to claim 26 , further comprising a control unit configured to select at least one transistor coupled to the signal line and at least one transistor coupled to the reference signal generator as active transistors based on an amount of incident light received by the first pixel.
46. The imaging device according to claim 45 , wherein a number of transistors selected as active transistors by the control unit decreases as the amount of incident light received by the first pixel increases.
47. The imaging device according to claim 26 , further comprising a plurality of pixels comprising the first pixel, wherein each pixel of the plurality of pixels is configured to receive incident light and output a pixel signal.
48. The imaging device according to claim 47 , wherein each pixel of the plurality of pixels is coupled to the signal line.
49. An electronic device, comprising the imaging device according to claim 26 .
50. The electronic device according to claim 49 , further comprising an optical system configured to focus light on the first pixel.