IP Library › Granted Patent US 10,323,996
Granted Patent B2
US 10,323,996 · App. 15/669,972 · Granted Jun 18, 2019

Pressure sensor and manufacturing method thereof

Inventors: Yu-Hsuan Ho (Taichung, TW); Ming-Chih Tsai (Taichung, TW); Ming-Hung Hsieh (Taichung, TW)
Assignee: Winbond Electronics Corp.
G01L9/10C01B13/00H01L27/1024H01L29/0669H01L29/0673H01L29/786
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Quick Facts
Patent No.
US 10,323,996
App. No.
15/669,972
Granted
Jun 18, 2019
Kind
B2
Abstract

A pressure sensor and a manufacturing method thereof are provided. The pressure sensor includes a thin-film transistor (TFT) array and a pressure-sensitive layer covering the TFT array. The pressure-sensitive layer includes a plurality of insulating layers and one of one-directional materials arranged on the same plane and two-directional materials. The insulating layers and the one- or two-directional materials are alternately stacked so as to effectively enhance pressure resolution.

Claims (21)

1. A pressure sensor, comprising:

a thin-film transistor array; and

a pressure-sensitive layer covering the thin-film transistor array, wherein the pres sure-sensitive layer comprises a plurality of one-directional materials arranged on the same plane and a plurality of insulating layers, and wherein the one-directional materials and the insulating layers are alternately stacked.

2. The pressure sensor of claim 1 , wherein the pressure-sensitive layer is inductive resistive.

3. The pressure sensor of claim 1 , wherein a diameter of the one-directional material is 5 nm to 100 nm.

4. The pressure sensor of claim 1 , wherein an aspect ratio of the one-directional material is greater than 100.

5. The pressure sensor of claim 1 , wherein the one-directional material comprises a metal nanowire, a carbon nanotube, or a metal oxide semiconductor.

6. The pressure sensor of claim 5 , wherein a metal of the metal nanowire comprises gold, silver, or copper.

7. The pressure sensor of claim 5 , wherein a metal oxide of the metal oxide semiconductor comprises zinc oxide, titanium oxide, tungsten oxide, molybdenum oxide, vanadium oxide, copper oxide, nickel oxide, cobalt oxide, iron oxide, or tin oxide.

8. A pressure sensor, comprising:

a thin-film transistor array; and

a pressure-sensitive layer covering the thin-film transistor array, wherein the pressure-sensitive layer comprises a plurality of two-directional materials and a plurality of insulating layers, and wherein the two-directional materials and the insulating layers are alternately stacked.

9. The pressure sensor of claim 8 , wherein the two-directional material comprises graphene oxide or molybdenum disulfide.

10. The pressure sensor of claim 8 , wherein the pressure-sensitive layer is inductive resistive.

11. A manufacturing method of a pressure sensor, comprising:

forming a thin-film transistor array; and

forming a pressure-sensitive layer on the thin-film transistor array by 3D printing, wherein the pressure-sensitive layer comprises a plurality of insulating layers and a plurality of one-directional materials arranged on the same plane that are alternately stacked, or the pressure-sensitive layer comprises the plurality of insulating layers and a plurality of two-directional materials that are alternately stacked.

12. The manufacturing method of the pressure sensor of claim 11 , wherein a diameter of the one-directional material is 5 nm to 100 nm.

13. The manufacturing method of the pressure sensor of claim 11 , wherein an aspect ratio of the one-directional material is greater than 100.

14. The manufacturing method of the pressure sensor of claim 11 , wherein the one-directional material comprises a metal nanowire, a carbon nanotube, or a metal oxide semiconductor, and the two-directional material comprises graphene oxide or molybdenum disulfide.

15. The manufacturing method of the pressure sensor of claim 14 , wherein a metal of the metal nanowire comprises gold, silver, or copper, and a metal oxide of the metal oxide semiconductor comprises zinc oxide, titanium oxide, tungsten oxide, molybdenum oxide, vanadium oxide, copper oxide, nickel oxide, cobalt oxide, iron oxide, or tin oxide.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 7, 2017
From: HO, YU-HSUAN; TSAI, MING-CHIH; HSIEH, MING-HUNG
To: WINBOND ELECTRONICS CORP.
Reel/Frame 043210/0576 →
Priority Claims (1)
CN 2017 1 0058129 · Jan 23, 2017 · national
Continuity (1)
Related Publication 20180209864A1 · Jul 26, 2018