Magnetometer with a waveguide

1. A diamond comprising:

a first portion comprising a plurality of nitrogen vacancy (NV) centers dispersed throughout the first portion; and

a second portion adjacent to the first portion, wherein the second portion does not contain NV centers, and wherein the second portion is configured to facilitate transmission of light generated by the NV centers of the first portion away from the first portion.

2. The diamond of claim 1 , wherein all sides of the diamond are polished.

3. The diamond of claim 1 , wherein the second portion is configured to facilitate transmission of the light from the first portion through a side of the second portion that is opposite the first portion.

4. The diamond of claim 1 , wherein the first portion of the diamond comprises a first side along a first plane, wherein the second portion of the diamond comprises a second side along a second plane, and wherein the first plane is orthogonal to the second plane.

5. The diamond of claim 4 , wherein light that travels through the first side excites at least a portion of the NV centers, and wherein more light emitted from the NV centers travels through the second side than any other side of the diamond.

6. The diamond of claim 1 , wherein the second portion comprises a first side and a second side, wherein the first side and the second side are on opposite sides of the second portion, wherein the first portion is adjacent to the second portion along the first side, wherein an outside surface of the diamond is covered by a plurality of flat surfaces, wherein one of the plurality of the flat surfaces is the second side of the second portion, and wherein more light emitted from the NV centers travels through the second side than through any other one of the plurality of flat surfaces.

7. A magneto-optical defect center material comprising:

a first portion comprising a plurality of defect centers dispersed throughout the first portion; and

a second portion adjacent to the first portion, wherein the second portion does not contain defect centers, and wherein the second portion is configured to facilitate transmission of light generated by the defect centers of the first portion away from the first portion.

8. The magneto-optical defect center material of claim 7 , wherein all sides of the magneto-optical defect center material are polished.

9. The magneto-optical defect center material of claim 7 , wherein the second portion is configured to facilitate transmission of the light from the first portion through a side of the second portion that is opposite the first portion.

10. The magneto-optical defect center material of claim 7 , wherein the first portion of the magneto-optical defect center material comprises a first side along a first plane, wherein the second portion of the magneto-optical defect center material comprises a second side along a second plane, and wherein the first plane is orthogonal to the second plane.

11. The magneto-optical defect center material of claim 10 , wherein light that travels through the first side excites at least a portion of the defect centers, and wherein more light emitted from the defect centers travels through the second side than any other side of the magneto-optical defect center material.

12. The magneto-optical defect center material of claim 7 , wherein the second portion comprises a first side and a second side, wherein the first side and the second side are on opposite sides of the second portion, wherein the first portion is adjacent to the second portion along the first side, wherein an outside surface of the magneto-optical defect center material is covered by a plurality of flat surfaces, wherein one of the plurality of the flat surfaces is the second side of the second portion, and wherein more light emitted from the defect centers travels through the second side than through any other one of the plurality of flat surfaces.

13. A magnetometer comprising:

a magneto-optical defect center material comprising a first portion and a second portion, wherein the first portion comprises a plurality of defect centers, wherein the second portion does not comprise defect centers, and wherein the second portion is configured to facilitate transmission of light generated at the defect centers of the first portion away from the first portion;

a light source configured to transmit light into the first portion of the magneto-optical defect center material;

a photo detector configured to detect light transmitted through at least one side of the second portion of the magneto-optical defect center material; and

a processor operatively coupled to the photo detector, wherein the processor is configured to determine a strength of a magnetic field based at least in part on the light detected by the photo detector.

14. The magnetometer of claim 13 , wherein all sides of the magneto-optical defect center material are polished.

15. The magnetometer of claim 13 , wherein the second portion of the magneto-optical defect center material is configured to facilitate transmission of the light from the first portion through a side of the second portion that is opposite the first portion.

16. The magnetometer of claim 13 , wherein the first portion of the magneto-optical defect center material comprises a first side along a first plane, wherein the second portion of the magneto-optical defect center material comprises a second side along a second plane, and wherein the first plane is orthogonal to the second plane.

17. The magnetometer of claim 16 , wherein light that travels through the first side excites at least a portion of the defect centers, and wherein more light emitted from the defect centers travels through the second side than any other side of the magneto-optical defect center material.

18. The magnetometer of claim 13 , wherein the second portion comprises a first side and a second side, wherein the first side and the second side are on opposite sides of the second portion, wherein the first portion is adjacent to the second portion along the first side, wherein an outside surface of the magneto-optical defect center material is covered by a plurality of flat surfaces, wherein one of the plurality of the flat surfaces is the second side of the second portion, and wherein more light emitted from the defect centers travels through the second side than through any other one of the plurality of flat surfaces.

19. The magnetometer of claim 13 , wherein the photo detector has a sensing surface within a plane that is parallel to a direction that the light source is configured to transmit light.

20. A magneto-optical defect center material comprising:

means for absorbing first light with a first frequency and transmitting second light with a second frequency; and

means for directing the second light that is adjacent to the means for absorbing the first light and transmitting the second light, wherein the means for directing the second light does not absorb the first light, and wherein the means for directing the second light is configured to facilitate transmission of the second light away from the means for absorbing the first light and transmitting the second light.

21. The magneto-optical defect center material of claim 20 , wherein all sides of the magneto-optical defect center material are polished.

22. The magneto-optical defect center material of claim 20 , wherein the means for directing the second light is configured to facilitate transmission of the light from the means for absorbing the first light and transmitting the second light through a side of the means for directing the second light that is opposite the means for absorbing the first light and transmitting the second light.

23. The magneto-optical defect center material of claim 20 , wherein the means for absorbing the first light and transmitting the second light comprises a first side along a first plane, wherein the means for directing the second light of the magneto-optical defect center material comprises a second side along a second plane, and wherein the first plane is orthogonal to the second plane.

24. The magneto-optical defect center material of claim 20 , wherein the means for directing the second light comprises a first side and a second side, wherein the first side and the second side are on opposite sides of the means for directing the second light, wherein the means for absorbing the first light and transmitting the second light is adjacent to the means for directing the second light along the first side, wherein an outside surface of the magneto-optical defect center material is covered by a plurality of flat surfaces, wherein one of the plurality of the flat surfaces is the second side of the means for directing the second light, and wherein more of the second light travels through the second side than through any other one of the plurality of flat surfaces.

25. A method comprising:

receiving, at a plurality of defect centers of a first portion of a magneto-optical defect center material, first light with a first frequency, wherein the plurality of defect centers are dispersed throughout the first portion;

transmitting, from the plurality of defect centers, second light with a second frequency; and

facilitating, via a second portion of the magneto-optical defect center material, the second light away from the first portion, wherein the second portion is adjacent to the first portion, wherein the second portion does not contain defect centers.

26. The method of claim 25 , further comprising reflecting the second light off of polished sides of the first portion, through the first portion, and into the second portion.

27. The method of claim 26 , further comprising transmitting the second light through a side of the second portion that is at an opposite side of the second portion from the first portion.

28. The method of claim 25 , further comprising:

transmitting the first light through a first side of the first portion along a first plane; and

transmitting the second light through a second side of the second portion along a second plane, wherein the first plane is orthogonal to the second plane.

29. The method of claim 28 , wherein more of the second light travels through the second side than any other side of the magneto-optical defect center material.