Method and apparatus for x-ray microscopy
This disclosure presents systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro- or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using an arrayed x-ray source or a set of Talbot interference fringes.
1. A method of examining an object with x-rays, comprising:
creating a periodic array of x-ray micro-beams propagating from a common x-ray source, with each x-ray micro-beam at the object having an axis along which the x-ray micro-beam propagates, and having a contrast between the x-ray intensity along the axis and the x-ray intensity at a distance equal to ½ of the period of said periodic array of x-ray micro-beams measured perpendicularly from said axis of greater than 10%;
positioning an x-ray pixel array detector system comprising a plurality of pixels so that each pixel detects x-rays corresponding to no more than one x-ray micro-beam;
illuminating a portion of said object with said periodic array of x-ray micro-beams; and
recording signals produced by said x-ray pixel array detector system.
2. The method of claim 1 , wherein the periodic array of x-ray micro-beams is created through Talbot interference phenomena that form a Talbot interference pattern; and said x-ray micro-beams correspond to an array of constructive interference portions of the Talbot interference pattern.
3. The method of claim 2 , additionally comprising:
positioning an absorbing masking component having periodic transmissive portions that transmit only a predetermined subset of the x-ray micro-beams; wherein the period of said transmissive portions in both lateral directions is equal to the period of the Talbot interference pattern multiplied by a positive integer N; and
aligning said absorbing masking component so that said transmissive portions are centered with every Nth x-ray micro-beam.
4. The method of claim 1 , additionally comprising positioning placing an absorbing masking component having transmissive portions to transmit only a predetermined subset of the x-ray micro-beams.
5. The method of claim 4 , wherein the lateral dimensions of said transmissive portions are less than ¾ of the period of the periodic array of the x-ray micro-beams.
6. The method of claim 1 , additionally comprising positioning the x-ray pixel array detector system so that two or more pixels detect x-rays corresponding to the same x-ray micro-beam.
7. The method of claim 1 , wherein the signals correspond to the transmission of said x-ray micro-beams through the object.
8. The method of claim 1 , wherein the signals correspond to an interaction phenomenon of said x-ray micro-beams with the object, said interaction phenomenon selected from the group consisting of: absorption, refraction, x-ray fluorescence, and small angle scattering.
9. The method of claim 1 , wherein the x-ray pixel array detector system comprises a first x-ray detector having periodic x-ray active areas positioned to detect x-rays and to produce signals corresponding to said x-rays, the periodic x-ray active areas separated by x-ray inactive areas that do not produce signals, with the period of said periodic x-ray active areas configured to detect only a predetermined subset of the x-ray micro-beams.
10. The method of claim 9 , wherein the x-ray inactive areas transmit x-rays, and the x-ray pixel array detector system additionally comprises a second x-ray detector positioned to detect the x-rays transmitted through the first x-ray detector.
11. The method of claim 1 , wherein the period of the periodic array of x-ray micro-beams at the object is less than 50 micrometers.
12. The method of claim 1 , wherein the length of each x-ray micro-beam along said axis at the object is greater than 1 millimeter.
13. The method of claim 1 , additionally comprising:
laterally displacing relative positions of the object and the periodic array of x-ray micro-beams in at least one direction perpendicular to the axis of one of the x-ray micro-beams by one or more times;
recording signals produced by said x-ray pixel array detector system after each lateral displacement has occurred; and
generating a two-dimensional image using said recorded signals.
14. The method of claim 13 , wherein laterally displacing the relative positions of the object and the periodic array of x-ray micro-beams is carried out by laterally displacing the object.
15. The method of claim 1 , additionally comprising:
changing a relative angular orientation of the object and the periodic array of x-ray micro-beams one or more times by an angle of 0.5 degrees or more;
recording signals produced by said x-ray pixel array detector system after each change of the relative angular orientation has occurred; and
generating a three-dimensional image using said recorded signals.
16. The method of claim 15 , wherein changing the relative angular orientation of the object and the periodic array of x-ray micro-beams is carried out by rotating the object.
17. The method of claim 1 , wherein said contrast is greater than 20%.
18. The method of claim 1 , wherein the common x-ray source comprises an array of x-ray generating microstructures.
19. An x-ray microscope system comprising:
a source of a periodic array of x-ray beams configured to impinge at least a portion of an object to be examined;
at least one x-ray pixel array detector comprising a plurality of pixels positioned to detect x-rays resulting from an interaction of said periodic array of x-ray beams with said object, the at least one x-ray pixel array detector producing at least one signal corresponding to said detected x-rays, and with said at least one x-ray pixel array detector aligned such that the x-rays detected by any single pixel of the plurality of pixels correspond to only one of the x-ray beams from among the periodic array of x-ray beams.
20. The x-ray microscope system of claim 19 , wherein the source further comprises at least one x-ray filter configured to limit the bandwidth of the x-rays.
21. The x-ray microscope system of claim 20 , wherein the at least one x-ray filter produces an x-ray spectrum having an average energy E 0 and an energy bandwidth within E 0 ±15%.
22. The x-ray microscope system of claim 19 , wherein the source comprises a grating structure to generate a Talbot interference pattern; and wherein the periodic array of x-ray beams corresponds to x-ray anti-nodes of the Talbot interference pattern and has a contrast between the Talbot anti-nodes and the neighboring Talbot nodes is greater than 10%.
23. The x-ray microscope system of claim 22 , wherein the object to be examined and the pixels of the x-ray pixel array detector are both positioned within a depth-of-focus of the Talbot interference pattern.
24. The x-ray microscope system of claim 22 , further comprising a mount configured to translate said object in two orthogonal directions.
25. The x-ray microscope system of claim 22 , wherein the grating structure to generate a Talbot interference pattern comprises one or more of: an absorption grating, a π/2 phase shifting grating, an phase shifting grating, a 1-D array of grating structures, a 2-D array of grating structures, a grid structure, and a checkerboard phase grating structure.
26. The x-ray microscope system of claim 22 , wherein the dimensions of the grating structure are selected such that the period of the period of the Talbot interference pattern is less than 50 micrometers.
27. The x-ray microscope system of claim 19 , additionally comprising a mask positioned to block a predetermined number of the x-ray beams.
28. The x-ray microscope system of claim 19 , wherein the x-ray pixel array detector is an energy resolving pixel array detector.
29. The x-ray microscope system of claim 19 , additionally comprising a data collection and analysis system to analyze said at least one signal.
30. The x-ray microscope system of claim 19 , wherein the source comprises:
a vacuum chamber;
an emitter for an electron beam; and
an electron target comprising: a substrate comprising a first material and, embedded in the substrate, at least a plurality of discrete structures comprising a second material configured to generate x-rays in response to electron bombardment.
31. The method of claim 1 , wherein recording signals produced by said x-ray pixel array detector system comprises:
using a first detector of the x-ray pixel array detector system to detect x-rays from the object;
transmitting x-rays from the object through the first detector; and
using a second detector to detect x-rays transmitted through the first detector.
32. The x-ray microscope system of claim 19 , wherein the at least one x-ray pixel array detector comprises:
a first x-ray pixel array detector comprising pixels and x-ray transmissive regions between the pixels; and
a second x-ray pixel array detector configured to detect x-rays transmitted through the x-ray transmissive regions of the first x-ray pixel array detector.