Folded metal-oxide-metal capacitor overlapped by on-chip inductor/transformer

1. An integrated circuit, comprising:

a capacitor in at least one back-end-of-line (BEOL) interconnect level, the capacitor having a plurality of folded capacitor fingers having multiple sides and forming an open loop, and a pair of adjacent, parallel manifolds on a same side of the multiple sides of the folded capacitor fingers, each of the pair of manifolds coupled to at least one of the plurality of folded capacitor fingers; and

an inductive trace having at least one turn in at least one different BEOL interconnect level, the inductive trace overlapping the pair of manifolds of the capacitor from a top view.

2. The integrated circuit of claim 1 , in which a first manifold of a first polarity at a first interconnect level is coupled to at least one folded capacitor finger of the first polarity at the first interconnect level on a first side facing a first direction but not on a second side facing an opposite direction, and a second manifold of a second, different polarity at the first interconnect level is coupled to at least one folded capacitor finger of the second polarity at the first interconnect level on a third side facing the first direction, but not on a fourth side facing the opposite direction.

3. The integrated circuit of claim 1 , in which at least one folded capacitor finger on a first interconnect level is coupled to at least one folded capacitor finger on a second interconnect level by at least one via.

4. The integrated circuit of claim 1 , in which the pair of manifolds are on a different layer than the inductive trace.

5. The integrated circuit of claim 1 , in which at least one of the pair of manifolds extends through multiple interconnect levels and in which at least one manifold portion in one interconnect level is coupled to another manifold portion in another interconnect level by at least one via.

6. The integrated circuit of claim 1 , in which at least a portion of the plurality of folded capacitor fingers are within a perimeter defined by the inductive trace.

7. A method of fabricating an integrated circuit, comprising:

fabricating a capacitor in at least one back-end-of-line (BEOL) interconnect level, the capacitor having a plurality of folded capacitor fingers having multiple sides and forming an open loop, and a pair of parallel, adjacent manifolds on a same side of the multiple sides of the folded capacitor fingers, each of the pair of manifolds coupled to at least one of the plurality of folded capacitor fingers; and

fabricating an inductive trace having at least one turn in at least one different BEOL interconnect level, the inductive trace overlapping the pair of manifolds of the capacitor from a top view.

8. The method of claim 7 , further comprising:

coupling a first manifold, of the pair of manifolds, having a first polarity to at least one folded capacitor finger of the first polarity at a same interconnect level, on a first side facing a first direction but not on a second side facing an opposite direction; and

coupling a second manifold, of the pair of manifolds, having a second, different polarity to at least one folded capacitor finger of the second polarity at the same interconnect level on a third side facing the first direction but not on a fourth side facing the opposite direction.

9. The method of claim 7 , further comprising coupling at least one folded capacitor finger on a first interconnect level to at least one folded capacitor finger on a second interconnect level by at least one via.

10. The method of claim 7 , in which fabricating the capacitor having the pair of manifolds comprises fabricating at least a first portion of the pair of manifolds on a first interconnect level and a second portion of the pair of manifolds on a second interconnect level and coupling the first portion and the second portion with at least one via.

11. An integrated circuit, comprising:

a capacitor in at least one back-end-of-line (BEOL) interconnect level, the capacitor having a plurality of folded capacitor fingers having multiple sides and forming an open loop, and a pair of parallel, adjacent manifolds on a same side of the multiple sides of the folded capacitor fingers, each of the pair of manifolds coupled to at least one of the plurality of folded capacitor fingers; and

means for storing electrical energy in a magnetic field within at least one different BEOL interconnect level, the electrical energy storing means overlapping the pair of manifolds of the capacitor from a top view.

12. The integrated circuit of claim 11 , in which a first manifold of a first polarity at a first interconnect level is coupled to at least one folded capacitor finger of the first polarity at the first interconnect level on a first side facing a first direction but not on a second side facing an opposite direction, and a second manifold of a second, different polarity at the first interconnect level is coupled to at least one folded capacitor finger of the second polarity at the first interconnect level on a third side facing the first direction, but not on a fourth side facing the opposite direction.

13. The integrated circuit of claim 11 , in which at least one folded capacitor finger on a first interconnect level is coupled to at least one folded capacitor finger on a second interconnect level by at least one via.

14. The integrated circuit of claim 11 , in which the pair of manifolds are on a different layer than the electrical energy storing means.

15. The integrated circuit of claim 11 , in which at least one of the pair of manifolds extends through multiple interconnect levels, and in which at least one manifold portion in one interconnect level is coupled to another manifold portion in another interconnect level by at least one via.

16. The integrated circuit of claim 11 , in which at least a portion of the plurality of folded capacitor fingers are within a perimeter defined by the electrical energy storing means.