Systems, methods, and apparatuses for stacked memory
Embodiments of the invention are generally directed to systems, methods, and apparatuses for hybrid memory. In one embodiment, a hybrid memory may include a package substrate. The hybrid memory may also include a hybrid memory buffer chip attached to the first side of the package substrate. High speed input/output (HSIO) logic supporting a HSIO interface with a processor. The hybrid memory also includes packet processing logic to support a packet processing protocol on the HSIO interface. Additionally, the hybrid memory also has one or more memory tiles that are vertically stacked on the hybrid memory buffer.
1. An apparatus, comprising:
a system in package comprising a stack of memory chips and a buffer die, the stack of memory chips stacked on the buffer die, the buffer die having an electronic connection interface on its topside to communicate with the stack of memory chips, each one of the memory chips being composed of multiple tiles of memory space across the memory chip's surface area, the stack of memory chips comprising a plurality of memory tile columns, each memory tile column composed of a set of vertically aligned tiles of the memory chips, each memory tile column composed of only one tile per memory chip, wherein each memory tile column has it own unique data channel, the system in package further comprising logic circuitry to adaptively change respective refresh rates applied to different memory chips such that the different ones of the memory chips are able to receive different refresh rates, and where, a unique refresh signal is generated for all tiles of a same memory chip.
2. The apparatus of claim 1 wherein the stack of memory chips and buffer die are communicatively coupled by way of through silicon vias.
3. The apparatus of claim 2 wherein the system in package further comprises redundancy control circuitry to shutdown a portion of the memory space of the stack of memory chips.
4. The apparatus of claim 1 wherein the buffer die further comprises built-in-self-test (BIST) logic circuitry to test the system in package.
5. The apparatus of claim 1 wherein the system in package is within a computer.
6. The apparatus of claim 5 wherein the stack of memory chips and buffer die are communicatively coupled by way of through silicon vias.
7. The apparatus of claim 6 wherein the system in package further comprises redundancy control circuitry to shutdown a portion of the memory space of the stack of memory chips.
8. The apparatus of claim 5 wherein the buffer die further comprises built-in-self-test (BIST) logic circuitry to test the system in package.