Plasma processing apparatus and operation method thereof
A plasma apparatus of processing a wafer disposed in a processing chamber using plasma includes one window, another window, a light receiving unit, a light source, and an optical branching unit which is disposed between the light source and the other window, branches light emitted by the light source to an optical path toward the processing chamber and an optical path in other direction, and reflects light in the processing chamber from the other window, and a detection unit which detects the light having been emitted from the plasma and received by the light receiving unit using one branched light and other branched and reflected light. The apparatus processes the wafer according to a condition for the processing which is adjusted based on a result of the detection.
1. A plasma processing apparatus for processing a wafer disposed in a processing chamber disposed in a vacuum chamber using plasma generated in the processing chamber, the plasma processing apparatus comprising:
a first window disposed on a side wall on one side of the vacuum chamber surrounding the processing chamber and through which light emitted from the plasma passes;
a light source of external light disposed outside of the first window;
an optical absorbing unit disposed outside of the processing chamber opposite to the first window in which external light emitted from the light source passing through the processing chamber is received and absorbed;
an optical branching unit disposed between the light source and the first window, and having a plurality of optical ports including a first optical port for a first optical path of light, a second optical port for a second optical path of light, and a third optical port of a third optical path of light, the first optical path of light and the second optical path of light being branched from light emitted by the light source, the first optical path of light being directed in a first direction toward the processing chamber and the second optical path of light being directed in a second direction different from said first direction, and the third optical path of light being branched from light from the first window into a third direction different from each of said first and second directions; and
a detection unit configured to selectively transmit each of said first, second and third optical paths of light branching from the optical branching unit including the first optical path of light from the first optical port having passed through the processing chamber and been received by the optical absorbing unit, and the second optical path of light from the second optical port branched in the second direction and the third optical path of light from the third optical port branched in the third direction, and the detection unit being configured to detect the light emitted from the plasma and received by the optical absorbing unit by using the first, second and third optical paths of light branching from the optical branching unit,
the apparatus further comprising a controller configured to adjust a condition for said processing based on a detection result of the detection unit.
2. The plasma processing apparatus according to claim 1 , wherein the detection unit is further configured to detect a state of a surface of an inner wall in the processing chamber using a detected result of amounts of the first, second and third optical paths of light branching from the optical branching unit.
3. The plasma processing apparatus according to claim 2 ,
wherein the controller is configured to adjust the generating of the plasma using the detected state of the surface of the inner wall in the processing chamber, and data on the light having been emitted from the plasma and detected in the processing, and using a database representing a correlation between a condition of the plasma and dimensions after the wafer processing.
4. The plasma processing apparatus according to claim 1 , wherein the detection unit is further configured to detect a distribution of an intensity or density of the plasma generated in the processing chamber, or a state of a surface of an inner wall of the processing chamber on either of two sides of the processing chamber using a detection result of each amount of the first second and third optical paths of light branching from the optical branching unit, and amounts of light emitted from plasma generated using rare gas introduced into the processing chamber, and introduced into the branching unit through the first window, and the light having been introduced into the optical branching unit through a second window.
5. The plasma processing apparatus according to claim 4 ,
wherein the controller is configured to adjust the generating of the plasma using the detected state of the surface of the inner wall in the processing chamber, and data on the light having been emitted from the plasma and detected in the processing, and using a database representing a correlation between a condition of the plasma and dimensions after the wafer processing.
6. The plasma processing apparatus according to claim 1 , further comprising:
a second window disposed on the side wall of the vacuum chamber in a side opposite to the first window, through which external light from the light source passes, and
wherein the optical absorbing unit is disposed outside of the second window, and receives and absorbs external light emitted from the light source and passing through the processing chamber and the second window.
7. The plasma processing apparatus according to claim 6 , wherein the detection unit is further configured to detect a state of a surface of an inner wall in the processing chamber using a detected result of amounts of the first, second and third optical paths of light branching from the optical branching unit.
8. The plasma processing apparatus according to claim 7 ,
wherein the controller is configured to adjust the generating of the plasma using the detected state of the surface of the inner wall in the processing chamber, and data on the light having been emitted from the plasma and detected in the processing, and using a database representing a correlation between a condition of the plasma and dimensions after the wafer processing.
9. The plasma processing apparatus according to claim 6 ,
wherein the detection unit is further configured to detect a distribution of an intensity or density of the plasma generated in the processing chamber, or a state of a surface of an inner wall of the processing chamber on either of two sides of the processing chamber using a result of detecting amounts of the light from the optical branching unit, and amounts of light emitted from plasma generated using rare gas having been introduced into the processing chamber, and having been introduced into the branching unit through the first window, and the light having been introduced into the optical branching unit through the second window.
10. The plasma processing apparatus according to claim 9 ,
wherein the controller is configured to adjust the generating of the plasma using the detected state of the surface of the inner wall in the processing chamber, and data on the light having been emitted from the plasma and detected in the processing, and using a database representing a correlation between a condition of the plasma and dimensions after the wafer processing.