Metal core solder ball interconnector fan-out wafer level package
A fan-out wafer level package is disclosed, which includes: a redistribution layer; a semiconductor chip electrically connected with the redistribution layer through a bump; a protective member protecting the semiconductor chip, wherein a part of the protective member is removed such that the upper surface of the semiconductor chip is exposed in order to dissipate heat and prevent warpage; and an interconnector disposed outside the semiconductor chip at substantially the same level and having a lower part electrically connected with the redistribution layer and an upper part not being covered with the protective member, wherein the interconnector includes a metal core solder ball, the metal core solder ball includes a metal core and a solder buffer between the metal core and the protective member, and the metal core is formed of a combination of copper (Cu), nickel (Ni), and silver (Ag).
1. A fan-out wafer-level package comprising:
a redistribution layer;
a semiconductor chip electrically connected to the redistribution layer through a bump;
a protective member configured to protect the semiconductor chip; and
an interconnector disposed outside the semiconductor chip at substantially the same level as the semiconductor chip, wherein a lower portion of the interconnector is electrically connected to the redistribution layer and a top surface of the interconnector, a top surface of the protective member, and a top surface of the semiconductor chip are positioned to form a substantially uniform planar surface,
wherein the interconnector comprises a metal-core solder ball,
the metal-core solder ball comprises a metal core and a solder buffer interposed between the metal core and the protective member,
an upper portion of the metal-core solder ball comprises a surface of the metal core not covered by the solder buffer, and
the metal core comprises a combination of copper (Cu), nickel (Ni), or silver (Ag).
2. The fan-out wafer-level package of claim 1 , wherein the interconnector has one of a globular shape or an egg shape.
3. The fan-out wafer-level package of claim 2 , wherein the solder buffer is formed of a material having a higher ductility than a metal material of the metal core and includes tin (Sn) solder.
4. The fan-out wafer-level package of claim 2 , wherein the solder buffer includes a multilayered structure of solder and nickel (Ni) (or nickel alloy) layers.
5. The fan-out wafer-level package of claim 1 , wherein the solder buffer includes a multilayered structure of a conductive layer which is disposed inside thereof and formed of solder or nickel and a nonconductive layer which is disposed outside the conductive layer and formed of a material having a higher ductility than the conductive layer.
6. The fan-out wafer-level package of claim 1 , wherein the bump is a stud bump having a pointed end portion.