IP Library Granted Patent US 10,770,232
Granted Patent B2
US 10,770,232 · App. 16/044,898 · Granted Sep 8, 2020

Multilayer electronic component and method of manufacturing the same

Inventors: Seung Hun Han (Suwon-si, KR); Sung Min Cho (Suwon-si, KR); Dong Joon Oh (Suwon-si, KR)
Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
H01G4/30H01G4/005H01G4/12H01G4/224H01G4/232H01G4/2325H01G4/1209
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Quick Facts
Patent No.
US 10,770,232
App. No.
16/044,898
Granted
Sep 8, 2020
Kind
B2
Abstract

A multilayer electronic component for enhancing damp proof reliability includes: a capacitor body including a plurality of dielectric layers, and first and second internal electrodes, alternately disposed across the dielectric layers to expose one end of the first and second electrodes through third and fourth surfaces of the capacitor body; first and second conductive layers disposed on the third and fourth surfaces of the capacitor body and connected to the first and second internal electrodes, respectively; first and second plating layers covering surfaces of the first and second conductive layers; and a plurality of coating layers configured in a multilayer structure on a surface of the capacitor body to expose the first and second plating layers and having an entire thickness of 10 nm to 200 nm.

Claims (21)

1. A multilayer electronic component comprising:

a capacitor body including first and second surfaces facing each other, third and fourth surfaces connected to the first and second surfaces and facing each other, and fifth and sixth surfaces connected to the first and second surfaces, connected to the third and fourth surfaces, and facing each other, and including a plurality of dielectric layers, and first and second internal electrodes, alternately disposed across the dielectric layers to expose one end of the first and second internal electrodes through the third and fourth surfaces;

a first conductive layer and a second conductive layer disposed on the third and fourth surfaces of the capacitor body and connected to the first and second internal electrodes, respectively;

a first plating layer and a second plating layer covering surfaces of the first and second conductive layers; and

a plurality of coating layers configured in a multilayer structure on a surface of the capacitor body to expose the first and second plating layers and having an entire thickness of 10 nm to 200 nm,

wherein the plurality of coating layers is arranged and configured such that at least a portion of the surface of the capacitor body is exposed to an outside of the capacitor body through at least one gap between adjacent portions of the plurality of coating layers.

2. The multilayer electronic component of claim 1 , wherein at least some of the plurality of coating layers are formed of different materials.

3. The multilayer electronic component of claim 2 , wherein the plurality of coating layers are configured with a double-layered structure, and an internal coating layer of the plurality of coating layers includes aluminum oxide (Al 2 O 3 ) and an external coating layer of the plurality of coating layers includes any one of silicon dioxide (SiO 2 ) or titanium dioxide (TiO 2 ).

4. The multilayer electronic component of claim 1 , wherein the plurality of coating layers are further disposed on a portion between the first conductive layer and the first plating layer and a portion between the second conductive layer and the second plating layer.

5. The multilayer electronic component of claim 1 , wherein the first and second plating layers include a nickel (Ni) plating layer disposed on the first and second conductive layers, and a tin (Sn) plating layer disposed on the nickel (Ni) plating layer.

6. A multilayer electronic component comprising:

a capacitor body including first and second surfaces facing each other, third and fourth surfaces connected to the first and second surfaces and facing each other, and fifth and sixth surfaces connected to the first and second surfaces, connected to the third and fourth surfaces, and facing each other, and including a plurality of dielectric layers, and first and second internal electrodes, alternately disposed across the dielectric layers to expose one end of the first and second internal electrodes through the third and fourth surfaces;

a first conductive layer and a second conductive layer disposed on the third and fourth surfaces of the capacitor body and connected to the first and second internal electrodes, respectively;

a first plating layer and a second plating layer covering surfaces of the first and second conductive layers; and

a plurality of coating layers configured in a multilayer structure on a surface of the capacitor body to expose the first and second plating layers,

wherein at least some of the plurality of coating layers are formed of different materials, and

wherein the plurality of coating layers is arranged and configured such that at least a portion of the surface of the capacitor body is exposed to an outside of the capacitor body through at least one gap between adjacent portions of the plurality of coating layers.

7. The multilayer electronic component of claim 6 , wherein the plurality of coating layers have an entire thickness of 10 nm to 200 nm.

8. The multilayer electronic component of claim 6 , wherein the plurality of coating layers are configured with a double-layered structure, and an internal coating layer of the plurality of coating layers includes aluminum oxide (Al 2 O 3 ) and an external coating layer of the plurality of coating layers includes any one of silicon dioxide (SiO 2 ) or titanium dioxide (TiO 2 ).

9. The multilayer electronic component of claim 6 , wherein the plurality of coating layers are further disposed on a portion between the first conductive layer and the first plating layer and a portion between the second conductive layer and the second plating layer.

10. The multilayer electronic component of claim 6 , wherein the first and second plating layers include a nickel (Ni) plating layer disposed on the first and second conductive layers, and a tin (Sn) plating layer disposed on the nickel (Ni) plating layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 9, 2018
From: HAN, SEUNG HUN; CHO, SUNG MIN; OH, DONG JOON
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 046593/0651 →
Priority Claims (2)
KR 10-2017-0128093 · Sep 29, 2017 · national
KR 10-2018-0001877 · Jan 5, 2018 · national
Continuity (1)
Related Publication 20190103224A1 · Apr 4, 2019
Cited By (2)
US 12,224,104 US 12,354,800