Charged particle beam device and charged particle beam device noise source determination method

1. A charged particle beam device including a unit that extracts information regarding a noise source, wherein

the unit that extracts information regarding a noise source includes:

a control signal monitoring unit that observes a control signal of a control unit which controls an electron optical system of the charged particle beam device and outputs the observed signal;

a first frequency conversion processing unit that executes frequency conversion processing on the signal output from the control signal monitoring unit;

a second frequency conversion processing unit that executes frequency conversion processing on an image signal output from a detector of the electron optical system of the charged particle beam device; and

a frequency analysis and comparison processing unit that receives an output signal of the first frequency conversion processing unit and an image signal of the second frequency conversion processing unit, and associate a peak frequency of a superimposed noise of the image signal with a noise source of the control unit which generates a noise having a peak frequency corresponding to the peak frequency of the superimposed noise within the image signal.

2. The charged particle beam device according to claim 1 , wherein

the control signal monitoring unit includes: an observation transmitting unit that observes the control signal of the control unit which controls the electron optical system of the charged particle beam device and transmits the observed signal; and an observation receiving unit that receives the observed signal by observing the control signal of the control unit output from the observation transmitting unit and outputs the signal to the first frequency conversion processing unit.

3. The charged particle beam device according to claim 2 , wherein

the control signal monitoring unit includes the observation transmitting unit and the observation receiving unit in each of the control unit that controls the electron optical system of the charged particle beam device.

4. The charged particle beam device according to claim 1 , further comprising:

an output unit that displays, on a screen, a result of associating the noise source of the control unit with the superimposed noise within the image signal by the frequency analysis and comparison processing unit, wherein

the output unit associates and displays the peak frequency of the superimposed noise of the image signal with information that determines the control unit that controls the electronic optical system on the screen.

5. The charged particle beam device according to claim 4 , wherein

the output unit displays, on the screen, information regarding a mode type of the noise having the peak frequency corresponding to the peak frequency of the superimposed noise within the image signal generated from the noise source of the control unit.

6. A charged particle beam device noise source determination method for extracting information regarding a noise source of a charged particle beam device, the method comprising:

observing a control signal of a control unit that controls an electron optical system of the charged particle beam device;

executing frequency conversion processing on the observed signal by a first frequency conversion processing unit;

executing frequency conversion processing on an image signal output from a detector of the electron optical system of the charged particle beam device by a second frequency conversion processing unit; and

receiving a result of the frequency conversion processing executed by the first frequency conversion processing unit and a result of the frequency conversion processing executed by the second frequency conversion processing unit, and associating a peak frequency of a superimposed noise of the image signal with a noise source of the control unit which generates a noise having a peak frequency corresponding to the peak frequency of the superimposed noise within the image signal by the frequency analysis and comparison processing unit.

7. The charged particle beam device noise source determination method according to claim 6 , wherein

the observation of the control signal of the control unit is executed by observing the control signal of the control unit that controls the electron optical system of the charged particle beam device and transmitting the observed signal by an observation transmitting unit, and receiving the observed signal by observing the control signal of the control unit transmitted from the observation transmitting unit and outputting the signal to the first frequency conversion processing unit by an observation receiving unit.

8. The charged particle beam device noise source determination method according to claim 7 , wherein

the observation of the control signal of the control unit is executed in each of the control unit that controls the electron optical system of the device.

9. The charged particle beam device noise source determination method according to claim 6 , further comprising:

displaying, on a screen, a result of associating the noise source of the control unit with the superimposed noise of the image signal by the frequency analysis and comparison processing unit, and associating and displaying a frequency characteristic of the superimposed noise of the image signal with information which determines the control unit that controls the electronic optical system on the screen.

10. The charged particle beam device noise source determination method according to claim 9 , wherein

information regarding a mode type of the noise having the peak frequency corresponding to the peak frequency of the superimposed noise within the image signal that is generated from the noise source of the control unit is displayed on the screen.