Wavelength dispersive X-ray fluorescence spectrometer
A wavelength dispersive X-ray fluorescence spectrometer includes a single one-dimensional detector ( 10 ) having detection elements ( 7 ) arranged linearly, and includes a detector position change mechanism ( 11 ) for setting a position of the one-dimensional detector ( 10 ) to either a parallel position at which an arrangement direction of the detection elements ( 7 ) is parallel to a spectral angle direction of a spectroscopic device ( 6 ) or an intersection position at which the arrangement direction intersects the spectral angle direction. At the parallel position, a receiving surface of the one-dimensional detector ( 10 ) is located at a focal point of focused secondary X-rays ( 42 ). At the intersection position, a receiving slit ( 9 ) is disposed at the focal point of the focused secondary X-rays ( 42 ), and the receiving surface is located at a traveling direction side of the focused secondary X-rays ( 42 ) farther from the spectroscopic device ( 6 ) than the receiving slit ( 9 ).
1. A wavelength dispersive X-ray fluorescence spectrometer of a focusing optical system, the wavelength dispersive X-ray fluorescence spectrometer comprising:
an X-ray source configured to irradiate a sample with primary X-rays;
a divergence slit configured to allow secondary X-rays generated from the sample to pass therethrough;
a spectroscopic device configured to monochromate and focus the secondary X-rays that have passed through the divergence slit; and
a single one-dimensional detector having a plurality of detection elements arranged linearly and having a receiving surface perpendicular to an optical axis of focused secondary X-rays obtained by the secondary X-rays being focused by the spectroscopic device, wherein
the wavelength dispersive X-ray fluorescence spectrometer comprises a detector position change mechanism for setting a position of the one-dimensional detector such that the position of the one-dimensional detector is freely changed to either a parallel position at which an arrangement direction of the detection elements coincides with a spectral angle direction of the spectroscopic device or an intersection position at which the arrangement direction of the detection elements intersects the spectral angle direction of the spectroscopic device,
in a state where the one-dimensional detector is set at the parallel position, the receiving surface of the one-dimensional detector is located at a focal point of the focused secondary X-rays, and
in a state where the one-dimensional detector is set at the intersection position, a receiving slit having an opening having a longitudinal direction orthogonal to the spectral angle direction of the spectroscopic device is disposed at the focal point of the focused secondary X-rays, and the receiving surface of the one-dimensional detector is located at a traveling direction side of the focused secondary X-rays farther from the spectroscopic device than the receiving slit.
2. The wavelength dispersive X-ray fluorescence spectrometer as claimed in claim 1 , further comprising:
a detection area setting unit configured to allow for setting a peak area that is an area of the detection elements corresponding to fluorescent X-rays to be measured, and a plurality of background areas that are areas of the detection elements corresponding to background of the fluorescent X-rays to be measured, in the arrangement direction of the detection elements; and
a quantification unit configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity obtained by integrating detected intensities by the detection elements in the peak area, a background intensity obtained by integrating detected intensities by the detection elements in each background area, and a background correction coefficient which is previously input, and to perform quantitative analysis, in a state where the one-dimensional detector is set at the parallel position.
3. The wavelength dispersive X-ray fluorescence spectrometer as claimed in claim 1 , further comprising a quantification unit configured to calculate an intensity of fluorescent X-rays to be measured, by integrating detected intensities by all the detection elements, and to perform quantitative analysis, in a state where the one-dimensional detector is set at the intersection position.
4. The wavelength dispersive X-ray fluorescence spectrometer as claimed in claim 1 , wherein the intersection position is either one of an orthogonal position at which the arrangement direction of the detection elements is orthogonal to the spectral angle direction of the spectroscopic device or a single oblique intersection position at which the arrangement direction of the detection elements obliquely intersects the spectral angle direction of the spectroscopic device at a predetermined angle.
5. The wavelength dispersive X-ray fluorescence spectrometer as claimed in claim 1 , wherein
the receiving surface of the one-dimensional detector is rectangular, and
the intersection position is a diagonal line position at which a diagonal line direction of the receiving surface of the one-dimensional detector is orthogonal to the spectral angle direction of the spectroscopic device.