IP Library › Granted Patent US 12,487,195
Granted Patent B2
US 12,487,195 · App. 18/407,503 · Granted Dec 2, 2025

Detector stand and X-ray diffraction apparatus

Inventors: Yuji Shiramata (Tokyo, JP); Atsushi Kuji (Tokyo, JP)
Assignee: RIGAKU CORPORATION
G01N23/20008G01N23/207G01N2223/056G01N2223/1016G01N2223/321G01N2223/501
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Quick Facts
Patent No.
US 12,487,195
App. No.
18/407,503
Granted
Dec 2, 2025
Kind
B2
Abstract

A detector stand for an X-ray detector is provided. A first arrangement portion arranges the X-ray detector in first orientation. A second arrangement portion arranges the X-ray detector in second orientation. The X-ray detector can be fixed to a mounting portion. In the detector stand, the X-ray detector is selectively mountable on the first arrangement portion or the second arrangement portion through the mounting portion. An arrangement angle of the X-ray detector fixed to the mounting portion is different between the first orientation and the second orientation.

Claims (29)

1 . A detector stand for an X-ray detector, comprising:

a first arrangement portion configured to arrange the X-ray detector in first orientation;

a second arrangement portion configured to arrange the X-ray detector in second orientation; and

a mounting portion to which the X-ray detector can be fixed, wherein

in the detector stand, the X-ray detector is selectively mountable on the first arrangement portion or the second arrangement portion through the mounting portion, and

an arrangement angle of the X-ray detector fixed to the mounting portion is different between the first orientation and the second orientation.

2 . The detector stand according to claim 1 , wherein

the first orientation is landscape orientation in which a width direction of the X-ray detector extends in a lateral direction, and

the second orientation is portrait orientation in which the width direction of the X-ray detector extends in a longitudinal direction.

3 . The detector stand according to claim 2 , further comprising an adjustment portion configured to perform positional adjustment of three axes of the X-ray detector in the first orientation and positional arrangement of three axes of the X-ray detector in the second orientation.

4 . The detector stand according to claim 2 , further comprising:

a first adjustment portion including a first Y-axis adjustment mechanism configured to adjust a position of the X-ray detector in a Y direction orthogonal to an X direction that is a detection direction of the X-ray detector in the first orientation, and a first Z-axis adjustment mechanism configured to adjust a position of the X-ray detector in a Z direction orthogonal to the X direction and the Y direction in the first orientation; and

a second adjustment portion including a second Y-axis adjustment mechanism configured to adjust a position of the X-ray detector in the Y direction in the second orientation, and a second Z-axis adjustment mechanism configured to adjust a position of the X-ray detector in the Z direction in the second orientation.

5 . The detector stand according to claim 4 , further comprising an X-axis rotation adjustment mechanism configured to adjust an angle around an axis extending in the X direction of the X-ray detector, wherein

the arrangement angle of the X-ray detector fixed to the mounting portion in the first orientation is orthogonal to the arrangement angle of the X-ray detector fixed to the mounting portion in the second orientation.

6 . The detector stand according to claim 4 , wherein

the first adjustment portion includes a first X-axis rotation adjustment mechanism configured to adjust an angle around an axis extending in the X direction of the X-ray detector in the first orientation, and

the second adjustment portion includes a second X-axis rotation adjustment mechanism configured to adjust an angle around the axis extending in the X-direction of the X-ray detector in the second orientation.

7 . The detector stand according to claim 5 , wherein the first adjustment portion is provided on the mounting portion.

8 . The detector stand according to claim 7 , further comprising a coupling portion configured to be coupled to a goniometer to enable adjustment of a distance between the X-ray detector and a detection object.

9 . The detector stand according to claim 8 , wherein the coupling portion is provided below the first adjustment portion.

10 . The detector stand according to claim 1 , wherein each of the first arrangement portion and the second arrangement portion includes:

a regulation portion configured to regulate relative positions of the mounting portion and the corresponding arrangement portion; and

a holding portion configured to hold a position of the mounting portion in a state where the relative positions are regulated by the regulation portion.

11 . The detector stand according to claim 10 , wherein the holding portion includes an abutting portion configured to abut on the mounting portion, a moving mechanism configured to retractably move the abutting portion to the mounting portion, and a handle configured to operate the moving mechanism.

12 . An X-ray diffractometers, comprising:

an X-ray detector; and

the detector stand according to claim 1 .

13 . The X-ray diffractometers according to claim 12 , wherein an aspect ratio of a detection range of the X-ray detector is 2 or more.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2024
From: SHIRAMATA, YUJI; KUJI, ATSUSHI
To: RIGAKU CORPORATION
Reel/Frame 066064/0698 →
Priority Claims (1)
JP 2023-012826 · Jan 31, 2023 · national
Continuity (1)
Related Publication 20240255446A1 · Aug 1, 2024
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