IP Library › Granted Patent US 10,965,475
Granted Patent B2
US 10,965,475 · App. 16/171,747 · Granted Mar 30, 2021

Physical unclonable function (PUF) security key generation

Inventors: Saman M. I. Adham (Hsinchu, TW); Shih-Lien Linus Lu (Hsinchu, TW); Peter Noel (Hsinchu, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
H04L9/3278G06F21/72G06F21/73H04L9/0838H04L9/0866H04L2209/12H04L2209/34
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Quick Facts
Patent No.
US 10,965,475
App. No.
16/171,747
Granted
Mar 30, 2021
Kind
B2
Abstract

Systems and methods of generating a security key for an integrated circuit device include generating a plurality of key bits with a physically unclonable function (PUF) generator. Unstable bits of the plurality of key bits are identified, and a security key is generated based on the plurality of key bits, wherein the security key excludes the identified unstable bits.

Claims (39)

1. A method of generating a security key for an integrated circuit device, comprising:

providing a physically unclonable function (PUF) generator that includes a plurality of memory cells;

generating a plurality of key bits, wherein each of the key bits is generated based on comparing access speeds of two of the plurality of memory cells to each other;

identifying at least one unstable bit of the plurality of key bits; and

generating a security key based on the plurality of key bits, wherein the security key excludes the at least one unstable bit.

2. The method of claim 1 , further comprising saving addresses of the unstable bits in a memory, wherein the memory does not store stable bits of the plurality of key bits.

3. The method of claim 1 , wherein the memory is located on the integrated circuit device.

4. The method of claim 1 , wherein the memory is located external to the integrated circuit device.

5. The method of claim 1 , wherein the generating the plurality of key bits includes writing a predetermined data bit to each of the memory cells, and comparing read speeds of the two of the plurality of memory cells to each other.

6. The method of claim 1 , further comprising receiving a challenge address, and wherein the security key is generated further in response to the received challenge address.

7. The method of claim 6 , wherein the security key further includes an error correction code.

8. The method of claim 1 , wherein identifying the at least one unstable bit comprises:

generating a first occurrence of the security key under a first test condition;

generating a second occurrence of the security key under the first test condition; and

comparing the key bits of the first and second occurrences of the security key.

9. The method of claim 8 , further comprising:

generating a third occurrence of the security key under a second test condition;

generating a fourth occurrence of the security key under the second test condition; and

comparing the key bits of the third and fourth occurrences of the security key.

10. The method of claim 1 , further comprising:

generating a plurality of security keys that includes the security key;

determining a plurality of challenge addresses corresponding to the plurality of security keys; and

storing the plurality of security keys and associated challenge addresses in a database.

11. An integrated circuit device, comprising:

a PUF generator configured to output a plurality of key bits;

a memory storing unstable bits of the plurality of key bits, wherein the memory does not store stable bits of the plurality of key bits;

a controller configured to generate a security key in response to receiving a challenge, wherein generating the security key includes accessing the memory and excluding the unstable bits from the security key.

12. The integrated circuit device of claim 11 , wherein the memory is external to the integrated circuit device.

13. The integrated circuit device of claim 11 , wherein the PUF generator includes a plurality of memory cells.

14. The integrated circuit device of claim 13 , wherein the memory cells are SRAM memory cells, and wherein the PUF generator is configured to compare access speeds of two of the plurality of memory cells to each other.

15. The integrated circuit device of claim 11 , wherein the security key further includes an error correction code.

16. The integrated circuit device of claim 15 , wherein the challenge includes a security key address and an error correction code bit.

17. The integrated circuit device of claim 10 , wherein the memory comprises a nonvolatile memory.

18. A system for generating an integrated circuit device security key, comprising:

a first memory storing a first occurrence of a first key bit;

a PUF generator configured to output a plurality of key bits, including a second occurrence of the first key bit; and

a processor configured to compare the first and second occurrences of the first key bit to identify an unstable key bit and store the identified unstable key bit in a second memory, wherein the second memory does not store stable key bits.

19. The system of claim 18 , wherein the second memory is external to the integrated circuit device.

20. The system of claim 18 , wherein the PUF generator is configured to compare an access speed of a first memory cell to an access speed of a second memory cell to generate each of the plurality of key bits.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2018
From: ADHAM, SAMAN M.I.; LU, SHIH-LIEN LINUS; NOEL, PETER
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 047619/0109 →
Continuity (2)
Provisional Application 62591957 · Nov 29, 2017
Related Publication 20190165956A1 · May 30, 2019
Cited By (1)
US 12,244,741